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Daphna R Yaniv

from Scottsdale, AZ
Age ~73
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Also known as:
Daphna Gershon Yaniv, Rachel Daphna Yaniv, Rachel D Yaniv, Daphna R Gershon, Yaniv Rachel Daphna, Danna Yaniv, Yaniv Dr, Yaniv Dophna
Phone and address:
8426 Belgian Trl, Scottsdale, AZ 85258
(480) 443-1512
Related to:
Tom YanivVincent A Sferruzza, 49Isaac YanivTom Yaniv, 46Gershon Yaniv, 74Daphna Ryanivfamilythe GershonMrinal Gurbaxani, 74Danna Yaniv, 41Mrinal P Gurbaxani, 44Anat R Yaniv, 45
Connected to:
Ariel Yaniv, 55Uri Yaniv, 70Dana Yaniz, 61Diane B Yanizeski, 68Ekow E Yankah, 50John M Yankanich, 61Venu Yankarla, 50David R Yankaskas, 70Lora Yankauskas, 39Sharon Yankaway, 51

Daphna Yaniv Phones & Addresses

  • 8426 Belgian Trl, Scottsdale, AZ 85258 (480) 443-1512
  • Paradise Valley, AZ
  • 2119 Addison St, Berkeley, CA 94704 (510) 204-9139 (510) 841-5209
  • 2147 Stuart St, Berkeley, CA 94705
  • 123 Las Colinas Dr, Georgetown, TX 78628 (602) 524-2230
  • Tucson, AZ
  • 123 Las Colinas Dr, Georgetown, TX 78628 (480) 443-1512

Work

Position: Healthcare Support Occupations

Education

Degree: High school graduate or higher

Resumes

Resumes

Daphna Yaniv Photo 1

Intellectual Property Consultant

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Location:
123 Las Colinas Dr, Georgetown, TX 78628
Industry:
Law Practice
Work:
Eitan Mehulal & Sadot Law Firm 2009 - 2012
Attorney In the Intellectual Property Department
Yaniv 2007 - 2008
Attorney
Dr Shlomo Cohen & Co 2006 - 2007
Intern In the Litigation Department
Ip Consulting 2006 - 2007
Intellectual Property Consultant
Education:
University of Melbourne 2013 - 2014
Masters, Master of Laws, Law Interdisciplinary Center (Idc) Herzliya, Israel 2002 - 2006
Bachelors, Bachelor of Law, Business Administration, Law, Finance Tel Aviv University 2000 - 2001
Tel Aviv University 1996 - 2000
Bachelors, Bachelor of Science, Biology
Languages:
English
Hebrew
Daphna Yaniv Photo 2

President

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Location:
123 Las Colinas Dr, Georgetown, TX 78628
Industry:
Biotechnology
Work:
RDY consulting
President
Education:
Technion-Machon Technologi Le' Israel
PhD, ElectroChemistry/Instrumental Chem

Business Records

Name / Title
Company / Classification
Phones & Addresses
Daphna Yaniv
Manager
Agilent Technologies Inc
Electronic Computers
4666 S Ash Ave, Tempe, AZ 85282
(480) 756-5900, (480) 756-5950, (480) 753-4311

Publications

Us Patents

Atomic Force Microscope Employing Beam-Tracking

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US Patent:
57637679, Jun 9, 1998
Filed:
Sep 23, 1996
Appl. No.:
8/717767
Inventors:
Pan S. Jung - Gilbert AZ
Daphna R. Yaniv - Scottsdale AZ
Assignee:
Molecular Imaging Corp. - Tempe AZ
International Classification:
G01B 522
US Classification:
73105
Abstract:
A scanning probe microscope such as an atomic force microscope for measuring a feature of a sample surface with a sharp probe over an area of interest by means of a collimated light beam reflected from a reflective surface responsive to movement of the sharp probe relative to the sample surface, the movement detected by a position sensitive photodetector, includes a scanner having one end fixed and another end free and attached to the sharp probe for moving the sharp probe. Also fixed to the free end of the scanner is a mount for a beam tracking lens which is interposed into the collimated light beam to cause a focus spot of the light beam to track translational movement of the reflective surface caused by the scanner. In this way, a wide range of scanning ranges up to about 100. times. 100 square micrometers is accommodated as is scanner head and scanner mode switching without the need to disturb the sample.

Atomic Force Microscope Employing Beam Tracking

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US Patent:
55875238, Dec 24, 1996
Filed:
Feb 15, 1995
Appl. No.:
8/427353
Inventors:
Pan S. Jung - Gilbert AZ
Daphna R. Yaniv - Scottsdale AZ
Assignee:
Molecular Imaging Corporation
International Classification:
G01B 528
US Classification:
73105
Abstract:
A scanning probe microscope such as an atomic force microscope for measuring a feature of a sample surface with a sharp probe over an area of interest by means of a collimated light beam reflected from a reflective surface responsive to movement of the sharp probe relative to the sample surface, the movement detected by a position sensitive photodetector, includes a scanner having one end fixed and another end free and attached to the sharp probe for moving the sharp probe. Also fixed to the free end of the scanner is a mount for a beam tracking lens which is interposed into the collimated light beam to cause a focus spot of the light beam to track translational movement of the reflective surface caused by the scanner. In this way, a wide range of scanning ranges up to about 100. times. 100 square micrometers is accommodated as is scanner head and scanner mode switching without the need to disturb the sample.

Scanning Force Microscope With Beam Tracking Lens

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US Patent:
54409209, Aug 15, 1995
Filed:
Feb 3, 1994
Appl. No.:
8/190948
Inventors:
Pan S. Jung - Gilbert AZ
Daphna R. Yaniv - Scottsdale AZ
Assignee:
Molecular Imaging Systems - Tempe AZ
International Classification:
G01B 528
G01N 2100
US Classification:
73105
Abstract:
An atomic force, scanning probe microscope (AFM or SPM) having a stationary-sample stage and a scanning cantilever using an optical lever method with an S-shape PZT is described. The cantilever tip is translated to measure surface profiles while a simple lens attached to the cantilever holder guides a focused beam from a fixed collimated diode laser. This enables the change of scanners or scanning techniques in air or solution without disturbing the sample. The imaging capability is demonstrated up to 100. times. 100 square micrometers.
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Daphna R Yaniv from Scottsdale, AZ, age ~73 Get Report