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Todd Pichler Phones & Addresses

  • Oconomowoc, WI
  • Sioux Falls, SD
  • 15911 El Dorado Dr, New Berlin, WI 53151 (262) 786-6085
  • Muskego, WI
  • Cudahy, WI

Work

Position: Precision Production Occupations

Education

Degree: Bachelor's degree or higher

Resumes

Resumes

Todd Pichler Photo 1

Software Engineer

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Location:
2614 Brick Church Pike, Nashville, TN 37207
Industry:
Industrial Automation
Work:
International Product Technology Jan 2004 - Sep 2005
Software Engineering Manager

Rockwell Automation Jan 2004 - Sep 2005
Software Engineer

Thomson Financial Jan 1999 - Jan 2004
Software Engineer

Robotic Vision Systems Jan 1997 - Jan 1999
Software Engineer

Systemation Engineered Products Jan 1991 - 1997
Software Engineer
Education:
University of Wisconsin - Milwaukee 1989 - 1997
Bachelor of Engineering, Bachelors, Electrical Engineering
Milwaukee Area Technical College 1988 - 1990
South Dakota School of Mines and Technology 1987 - 1988
Heritage Christian School 1985 - 1987
Parkway Christian Academy 1982 - 1985
Skills:
Software Development
Software Engineering
Software Design
Automation
Motion Control
Control Logic
Process Automation
Hmis
Process Control
Interests:
Fly Fishing
Windsurfing
Rc 4Wd Short Course Racing
Technology Solutions For Churches
Rc Planes
Certifications:
Mcps: Microsoft Certified Professional
License 2892868
Todd Pichler Photo 2

Todd Pichler

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Publications

Us Patents

Position Sensing System And Method For An Inspection Handling System

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US Patent:
6481187, Nov 19, 2002
Filed:
Apr 7, 2000
Appl. No.:
09/462555
Inventors:
Merlin E. Behnke - Grafton WI
Steven J. Alexander - Milwaukee WI
Donald P. McGee - Oconomowoc WI
Todd K. Pichler - New Berlin WI
John Novak - Hartford WI
Assignee:
Robotic Vision Systems, Inc. - Canton MA
International Classification:
B65B 728
US Classification:
53471, 53473, 53 51, 53250, 53281
Abstract:
A carrier tape drive used in conjunction with a pick and place module. The drive advances carrier tape to a desired position in two steps. The first step includes substantially stopping a carrier tape compartment short of a loading position, and the second step includes moving the compartment into the loading position.

Position Sensing System For Inspection Handling System

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US Patent:
6735927, May 18, 2004
Filed:
Oct 1, 2002
Appl. No.:
10/262245
Inventors:
Merlin E. Behnke - Grafton WI
Steven J. Alexander - Milwaukee WI
Donald P. McGee - Oconomowoc WI
Todd K. Pichler - New Berlin WI
John Novak - Hartford WI
Assignee:
International Product Technology, Inc. - New Berlin WI
International Classification:
B65B 504
US Classification:
53473, 53 64, 53250
Abstract:
A drive for a carrier tape used in conjunction with a pick and place module of a machine for inspecting and handling advances the carrier tape to its desired position in two steps. Using the number of sprocket holes between compartments in the tape (n holes), the first step is n-1 sprocket holes. The second step takes the carrier tape the remaining distance to complete the advance to the distance equal to n sprocket holes. The tape is driven by friction rollers not by the use of the sprocket holes. The presence of a device in a compartment and its proper positioning in the compartment is also inspected.

Inspection Handler Apparatus And Method

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US Patent:
RE38880, Nov 22, 2005
Filed:
Jul 15, 1998
Appl. No.:
10/122372
Inventors:
Merlin E. Behnke - Grafton WI, US
Michael L. Schneider - Wauwatosa WI, US
Donald P. McGee - Oconomowoc WI, US
Robert G. Bertz - Wauwatosa WI, US
William Fusco, Jr. - Pewaukee WI, US
Todd K. Pichler - Muskego WI, US
Jon P. Ubert - New Berlin WI, US
Steven J. Bilodeau - Setauket NY, US
Frank L. Jacovino - Plainview NY, US
Assignee:
Robotic Vision Systems, Inc. - Canton MA
International Classification:
B07C005/02
US Classification:
209540, 209541, 209556, 4147886, 4147887
Abstract:
An apparatus for processing electronic circuit devices includes an infeed station, a first inspection station, an inverter station, a second inspection station, a sorting station, and an outfeed station. A linear transport mechanism having side edges transports a first work piece containing a plurality of electronic circuit devices through the stations along a linear path. The inverter station holds an empty second work piece above the transport mechanism in an inverted orientation. The inverter station also includes an elevator for lifting the first work piece vertically into an abutting relationship with the second work piece, and an inverting mechanism for inverting the first and second work pieces while maintaining them in the abutting relationship to position the electronic devices in the second work piece in the inverted orientation. The inverter station executes the work piece inverting action while maintaining the work pieces above the linear transport mechanism and between the side edges of the linear transport mechanism. Thus, the electronic circuit devices are inspected at the first inspection station in a first orientation in the first work piece, and are inspected at the second inspection station in an inverted orientation in the second work piece.

High Speed Linear Pick-And-Place

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US Patent:
20080000756, Jan 3, 2008
Filed:
Jun 28, 2007
Appl. No.:
11/823745
Inventors:
Merlin E. Behnke - Mequon WI, US
Rob G. Bertz - Wauwatosa WI, US
Duane B. Jahnke - Hartford WI, US
Todd K. Pichler - New Berlin WI, US
Ken J. Pikus - New Berlin WI, US
Mike J. Reilly - Mukwonago WI, US
Dave J. Rollmann - New Berlin WI, US
Mark R. Shires - Glendale WI, US
International Classification:
B65G 47/91
US Classification:
1984684, 294 65, 4147521
Abstract:
A high-speed linear pick-and-place for increasing the speed of transfer of semiconductor electronic devices with accommodation for automated inspection or test. The invention includes two or more linear pick-and-place assemblies, each having two or more independently positionable pick-and-place nozzles. These assemblies are aligned such that the 4 or more nozzles can all pick and place to common shared locations. The 4 or more nozzles are operated so that they can pass by each other on their return stroke, except that nozzles sharing a rail cannot pass each other.

High Speed Tray Transfer System

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US Patent:
20080003084, Jan 3, 2008
Filed:
Jun 28, 2007
Appl. No.:
11/823746
Inventors:
Merlin E. Behnke - Meguon WI, US
Rob G. Bertz - Wauwatosa WI, US
Duane B. Jahnke - Hartford WI, US
Ken J. Pikus - New Berlin WI, US
Dave J. Rollmann - New Berlin WI, US
Mark R. Shires - Glendale WI, US
Todd K. Pichler - New Berlin WI, US
Mike J. Reilly - Mukwonago WI, US
International Classification:
B65G 1/00
US Classification:
41433118
Abstract:
A high-speed tray transfer system for trays of semiconductor devices for increasing the rate at which trays are delivered to, and advanced through, a pick and place that moves orthogonal to the tray movement, so as to increase the overall throughput speed of a semiconductor handling machine. The invention utilizes two or more platens that carry trays. The platens can pass over, under or otherwise around each other so that while one platen is under and servicing the pick and place, another platen is cycling around and preparing another tray of electronic devices for the pick and place.

Live Tape Position Sensor

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US Patent:
20080004746, Jan 3, 2008
Filed:
Jun 28, 2007
Appl. No.:
11/823753
Inventors:
Duane B. Jahnke - Harford WI, US
Todd K. Pichler - New Berlin WI, US
Mike J. Reilly - Mukwonago WI, US
Dave J. Rollmann - New Berlin WI, US
International Classification:
G06F 7/00
US Classification:
700229, 356614, 206710, 206717
Abstract:
A real-time tape position sensor to accurately determine the location of several consecutive carrier tape pockets in order to pick or place electronic semiconductor devices into or out of a tape pocket. The invention generates an on-going map of the pocket locations by coupling data from a photosensor inspecting between the tape pockets with data from an encoder that records the position of the carrier tape as it moves.

Overhead Traveling Camera Inspection System

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US Patent:
20080013823, Jan 17, 2008
Filed:
Jun 28, 2007
Appl. No.:
11/823740
Inventors:
Merlin E. Behnke - Mequon WI, US
Rob G. Bertz - Wauwatosa WI, US
Duane B. Jahnke - Hartford WI, US
Ken J. Pikus - New Berlin WI, US
Dave J. Rollmann - New Berlin WI, US
Mark R. Shires - Glendale WI, US
Mike J. Reilly - Mukwonago WI, US
Todd K. Pichler - New Berlin WI, US
International Classification:
G06K 9/00
US Classification:
382145
Abstract:
An overhead traveling camera inspection system for inspecting the condition of electronic semiconductor devices after being handled by a pick and place mechanism, and for automatically determining and calibrating the precise location of modules serviced by the pick and place mechanism for more accurate picking and placing of semiconductor devices.

Inspection Handler Apparatus And Method

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US Patent:
62934082, Sep 25, 2001
Filed:
Sep 27, 1999
Appl. No.:
9/142338
Inventors:
Merlin E. Behnke - Grafton WI
Michael L. Schneider - Wauwatosa WI
Donald P. McGee - Oconomowoc WI
Robert G. Bertz - Wauwatosa WI
William Fusco - Pewaukee WI
Todd K. Pichler - New Berlin WI
Jon P. Ubert - New Berlin WI
Steven J. Bilodeau - St. James NY
Frank L. Jacovino - Plainview NY
Assignee:
Robotic Vision Systems, Inc. (RVSI) - Canton MA
International Classification:
B07C 502
US Classification:
209540
Abstract:
An apparatus for processing electronic circuit devices includes an infeed station, a first inspection station, an inverter station, a second inspection station, a sorting station, and an outfeed station. A linear transport mechanism having side edges transports a first work piece containing a plurality of electronic circuit devices through the stations along a linear path. The inverter station holds an empty second work piece above the transport mechanism in an inverted orientation. The inverter station also includes an elevator for lifting the first work piece vertically into an abutting relationship with the second work piece, and an inverting mechanism for inverting the first and second work pieces while maintaining them in the abutting relationship to position the electronic devices in the second work piece in the inverted orientation. The inverter station executes the work piece inverting action while maintaining the work pieces above the linear transport mechanism and between the side edges of the linear transport mechanism. Thus, the electronic circuit devices are inspected at the first inspection station in a first orientation in the first work piece, and are inspected at the second inspection station in an inverted orientation in the second work piece.
Todd K Pichler from Oconomowoc, WI, age ~55 Get Report