US Patent:
20170111242, Apr 20, 2017
Inventors:
- Seattle WA, US
Prashant L. Sarma - Bellevue WA, US
Monty Vanderbilt - Seattle WA, US
David R. Azari - Seattle WA, US
Caitlyn R. Schmidt - Seattle WA, US
International Classification:
H04L 12/26
H04L 29/08
Abstract:
Disclosed are various embodiments for processing and storing mass data, where the data may include metrics generated based on performance of an event in a monitored system. Metrics describing a state of a monitored system may be received, accessed, and aggregated to generate a data model that describes performance of the monitored system. The metrics utilized in generating the data model may be disregarded after the data model has been generated. An output describing the state of the monitored system may be generated based on the data model, and the output may be communicated over a network, for example, to a requesting service.