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Jon S Gethner

from New York, NY
Age ~78
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Also known as:
Jon Dr Gethner, Jon S Gether, Jon S Mona
Related to:
Mona M Gethner, 88John A Munoz, 82Susan C Munoz, 64
Connected to:
Sandra G Gethner, 66Emma L Getic, 42Sue E Getka, 69Marcus Getkin, 49Megan E Getkin, 40Dorothy A Getler, 92Michael J Getler, 97George M Getlik, 61Meryl Getline, 71Alexander Getman, 72

Jon Gethner Phones & Addresses

  • New York, NY
  • Hoboken, NJ
  • Scotch Plains, NJ
  • 345 8Th Ave APT 11J, New York, NY 10001 (212) 924-7782

Work

Position: Precision Production Occupations

Education

Degree: High school graduate or higher

Emails

j***[email protected]

Resumes

Resumes

Jon Gethner Photo 1

Sole Owner

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Location:
New York, NY
Industry:
Industrial Automation
Work:
Thefoggytrader
Sole Owner
Personal
Stock Trader
Adaptive Analyzer Technologies
Research and Engineering
Adaptive Analyzer Technologies
President and Principal Scientist
Exxon Research & Engineering 1978 - 1991
Research Scientist
Education:
Columbia University In the City of New York 1970 - 1976
Doctorates, Doctor of Philosophy, Physics University of Chicago 1964 - 1968
Doctorates, Bachelors, Doctor of Philosophy, Bachelor of Science, Chemistry
Skills:
Spectroscopy
Stock Market
Stock Trading
Options Strategies
Statistical Data Analysis
Data Analysis
Automation
Chemistry
Ftir
Instrumentation
R&D
Protein Chemistry
Engineering
Matlab
Calibration
Validation
Uv/Vis
Materials Science
Analytical Chemistry
Characterization
Design of Experiments
Ir
Process Simulation
Interests:
Process Analysis
Stock Day Trading
Chemical Physics
Jon Gethner Photo 2

Business Manager

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Location:
New York, NY
Industry:
Mining & Metals
Work:
Minerals
Business Manager
Education:
Columbia University In the City of New York 1989 - 1993
Skills:
Data Analysis
Adaptive Analyzer
President and Principal Scientist
Personal Development
Market Research Project Management

Business Records

Name / Title
Company / Classification
Phones & Addresses
Jon S Gethner
ADAPTIVE ANALYZER TECHNOLOGIES, INC
45 John St SUITE 908, New York, NY 10038

Publications

Us Patents

Method Of Estimating Property And/Or Composition Data Of A Test Sample

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US Patent:
54466814, Aug 29, 1995
Filed:
Sep 2, 1994
Appl. No.:
8/300016
Inventors:
Jon S. Gethner - Scotch Plains NJ
Terry R. Todd - Budd Lake NJ
James M. Brown - Flemington NJ
Assignee:
Exxon Research and Engineering Company - Florham Park NJ
International Classification:
G06F 1520
US Classification:
364554
Abstract:
A method of operating a spectrometer to determine property and/or composition data of a sample comprises an on-line spectral measurement of the sample using a computer controlled spectrometer, statistical analysis of the sample data based upon a statistical model using sample calibration data, and automatically identifying a sample if necessary based upon statistical and expert system (rule-based) criteria. Sample collection based upon statistical criteria consists of performing a statistical or rule-based check against the model to identify measurement data which are indicative of chemical species not in the samples already stored in the model. Samples identified either by a statistical criteria or using an expert system (rule-based decisions) are used preferably to isolate the liquid sample using a computer controlled automatic sampling system. The samples can be saved for subsequent laboratory analysis in removable sample containers. The results of the laboratory analysis together with the on-line spectroscopic measurements are preferably used to update the model being used for the analysis.
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Jon S Gethner from New York, NY, age ~78 Get Report