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Gurjeet S Bains

from Yuba City, CA
Age ~52
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Also known as:
Gurjeet G Bains
Related to:
Kulwant K Bains, 73Charanjit S Bains, 74Ajit S Dhillon, 97Gavninder Dhillon, 39Kathleen Bruno, 64
Connected to:
Ajay S Bains, 29Amanda K Bains, 33Amandeep K Bains, 48Angie R Bains, 63Anup S Bains, 62Ashok Bains, 59Balijeet S Bains, 52Baljit K Bains, 47Balwant K Bains, 73Gurdeep S Bains, 45

Gurjeet Bains Phones & Addresses

  • Yuba City, CA
  • Arboga, CA
  • Sacramento, CA
  • 1689 Tres Picos Dr, Yuba City, CA 95993 (530) 713-8104

Resumes

Resumes

Gurjeet Bains Photo 1

Air Resources Engineer

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Location:
Yuba City, CA
Industry:
Electrical/Electronic Manufacturing
Work:
California Air Resources Board
Air Resources Engineer
Expresspoint Technology Services Aug 1998 - Oct 2007
Corporate Engineering Manager
Education:
University of California, Davis 1992 - 1995
Skills:
Leadership
Engineering
Project Management
Gurjeet Bains Photo 2

Gurjeet Bains

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Gurjeet Bains Photo 3

Baker

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Work:
Fresh Choice
Baker
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Gurjeet Bains

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Publications

Us Patents

Method For Reducing Defects In A Semiconductor Lithographic Process

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US Patent:
59854979, Nov 16, 1999
Filed:
Feb 3, 1998
Appl. No.:
9/017678
Inventors:
Khoi A. Phan - San Jose CA
Gurjeet S. Bains - Yuba City CA
David A. Steele - Sunnyvale CA
Jonathan A. Orth - Essex Junction VT
Ramkumar Subramanian - San Jose CA
Assignee:
Advanced Micro Devices, Inc. - Sunnyvale CA
International Classification:
G03F 900
US Classification:
430 30
Abstract:
An arrangement for optimizing a lithographic process forms a pattern on a silicon wafer using a photocluster cell system to simulate an actual processing condition for a semiconductor product. The resist pattern is then inspected using a wafer inspection system. An in-line low voltage scanning electron microscope (SEM) system reviews and classifies defect types, enabling generation of an alternative processing specification. The alternative processing specification can then be tested by forming patterns on different wafers, and then performing split-series testing to analyze the patterns on the different wafers for comparison with the existing lithographic process and qualification for production.
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Gurjeet S Bains from Yuba City, CA, age ~52 Get Report