Zhen R Zhang

7510842, Mar 31, 2009

Mar 10, 2006

11/373833

Valdimir Podust - Fremont CA, US
Zhen Zhang - Dayton MD, US
Eric T. Fung - Los Altos CA, US
Robert Bast - Houston TX, US
Daniel W. Chan - Clarksville MD, US
Jin Song - Baltimore MD, US

Vermilllion, Inc. - Fremont CA
The John Hopkins University - Baltimore MD
Board of Regents, The University of Texas System - Austin TX

G01N 33/53

435 71, 435 723

The present invention provides protein-based biomarkers and biomarker combinations that are useful in qualifying ovarian cancer status as well as endometrical cancer status in a patient. In particular, it has been found that hepcidin is a biomarker for both ovarian cancer and endometrial cancer and that a panel of biomarkers, including hepcidin, transthyretin and optionally other markers are useful to classify a subject sample as ovarian cancer or non-ovarian cancer. The biomarkers can be detected by SELDI mass spectrometry.

8174131, May 8, 2012

May 27, 2009

12/472884

Zhen Zhang - Santa Clara CA, US
Frank Kuechenmeister - Dresden DE, US
Jaime Bravo - Santiago, CL
Michael Su - Round Rock TX, US
Ranjit Gannamani - San Jose CA, US
Kevin Lim - Sunnyvale CA, US

GLOBALFOUNDRIES Inc. - Grand Cayman

H01L 23/495
H01L 29/40
H01L 23/29
H01L 21/00

257790, 257669, 257778, 438108

Methods are provided for packaging a semiconductor die having a first surface. In accordance with an exemplary embodiment, a method comprises the steps of forming a trench in the first surface of the die, electrically and physically coupling the die to a packaging substrate, forming a sealant layer on the first surface of the die, forming an engagement structure within the trench, and infusing underfill between the sealant layer and the engagement structure and the packaging substrate.

8404589, Mar 26, 2013

Apr 6, 2010

12/754912

Andrew J. Kellock - Sunnyvale CA, US
Christian Lavoie - Pleasantville NY, US
Ahmet Ozcan - Pleasantville NY, US
Stephen Rossnagel - Pleasantville NY, US
Bin Yang - Ossining NY, US
Zhen Zhang - Ossining NY, US
Yu Zhu - West Harrison NY, US
Stefan Zollner - Hopewell Junction NY, US

International Business Machines Corporation - Armonk NY
Globalfoundries Inc.

H01L 21/44

438686, 438651, 438682, 438664, 438655, 257E21165

A method for forming a silicide contact includes depositing a metal layer on silicon such that the metal layer intermixes with the silicon to form an intermixed region on the silicon; removing an unintermixed portion of the metal layer from the intermixed region; and annealing the intermixed region to form a silicide contact on the silicon. A semiconductor device comprising a silicide contact located over a silicon layer of the semiconductor device, the silicide contact comprising nickel (Ni) and silicon (Si) and having Ni amount equivalent to a thickness of about 21 angstroms or less.

20100068724, Mar 18, 2010

Mar 9, 2009

12/381218

Eric T. Fung - Los Altos CA, US
Robert Bast - Houston TX, US
Daniel W. Chan - Clarksville MD, US
Jin Song - Baltimore MD, US
Valdimir Podust - Fremont CA, US
Zhen Zhang - Dayton MD, US

Vermilllion, Inc. - Fremont CA
The Johns Hopkins University - Baltimore MD
Board of Regents, The University of Texas System - Austin TX

G01N 33/53
G01N 33/543

435 71, 436518

The present invention provides protein-based biomarkers and biomarker combinations that are useful in qualifying ovarian cancer status as well as endometrical cancer status in a patient. In particular, it has been found that hepcidin is a biomarker for both ovarian cancer and endometrial cancer and that a panel of biomarkers, including hepcidin, transthyretin and optionally other markers are useful to classify a subject sample as ovarian cancer or non-ovarian cancer. The biomarkers can be detected by SELDI mass spectrometry.

20210318715, Oct 14, 2021

Feb 18, 2021

17/178556

- Cupertino CA, US
Kuan H. Lu - Santa Clara CA, US
Paul S. Drzaic - Morgan Hill CA, US
Yung-Yu Hsu - San Jose CA, US
Yong Sun - Sunnyvale CA, US
Zhen Zhang - Sunnyvale CA, US
Bulong Wu - San Jose CA, US
Marc J. DeVincentis - Palo Alto CA, US
Paolo Sacchetto - Cupertino CA, US
Han-Chieh Chang - Sunnyvale CA, US
Anshi Liang - San Jose CA, US

G06F 1/16

An electronic device display may have pixels formed from crystalline semiconductor light-emitting diode dies, organic light-emitting diodes, or other pixel structures. The pixels may be formed in a display panel having a single substrate or an array of display panel tiles. The display panel has inwardly facing display panel contacts that mate with corresponding outwardly facing interconnect substrate contacts on an interconnect substrate. The interconnect substrate may have areas with compound curvature that are overlapped by the display panel. To enhance flexibility of the interconnect substrate, the interconnect substrate may have flexibility enhancement openings and/or may be formed from a material with a low elastic modulus such as silicone or other elastomeric material.

20210287586, Sep 16, 2021

Mar 13, 2020

16/818945

- Cupertino CA, US
Zhen Zhang - San Jose CA, US

G09G 3/20
G09G 3/34

An electronic device may have a camera that captures images of objects that are illuminated by ambient light. Some ambient light sources may not render the colors of objects faithfully. To detect low quality ambient lighting conditions and to correct for these conditions, control circuitry in the electronic device gathers ambient light measurements from a color ambient light sensor. The measurements are used to produce an ambient light spectral power distribution. The ambient light spectral power distribution can be applied to a series of test color samples to produce responses. Responses can also be produced by applying a reference illuminant to the test color samples. These responses can then be processed to generate a color rendering index or other color rendering metric for the ambient light and can be used to create a color correction matrix to correct the color of the captured images.

20190090280, Mar 21, 2019

Dec 31, 2015

15/777348

- San Diego CA, US
Jiming GUO - Beijing, CN
Chintan Shirish SHAH - Chula Vista CA, US
Haiqin LIU - San Diego CA, US
Zhen ZHANG - San Diego CA, US
Yunsong MU - La Jolla CA, US
Ammar KITABI - San Diego CA, US
Praveen Kumar APPANI - San Diego CA, US
Pavan KAIVARAM - Hyderabad, IN
Jayesh BATHIJA - San Diego CA, US
Krishna Rao MANDADAPU - San Diego CA, US
Premshankar UMASANKAR - San Diego CA, US
Vigneshwar SEKARBABU - San Diego CA, US
Peng WU - San Diego CA, US
Tom CHIN - San Diego CA, US

H04W 74/08
H04W 72/12
H04W 76/16

Apparatuses and methods are described herein for a wireless communication device to request uplink grants associated with the first subscription using at least one Radio Frequency (RF) resource, including tuning away from the first subscription to the second subscription for a tune-away time interval, determining whether the tune-away time interval exceeds a threshold, transmitting at least one scheduling request associated with the first subscription for a throttled count in response to the tune-away time interval exceeding the threshold, wherein the throttled count is less than a default count, determining whether an uplink grant has been received in response to any of the at least one scheduling request transmitted within the throttled count, and initiating an uplink data Random Access Channel (RACH) process in response to not receiving the uplink grant.

20180174505, Jun 21, 2018

Feb 13, 2018

15/895248

- Cupertino CA, US
Izhar Z Ahmed - Cupertino CA, US
Zhen Zhang - San Jose CA, US
Tsung-Ting Tsai - Cupertino CA, US
Ki Yeol Byun - Santa Clara CA, US
Yu Cheng Chen - San Jose CA, US
Sungki Lee - Sunnyvale CA, US
Mohammad Hajirostam - San Jose CA, US
Sinan Alousi - Campbell CA, US

G09G 3/32
G01L 1/22
G11C 19/28
H01L 27/32
H01L 51/00

An electronic device may have a flexible display such as an organic light-emitting diode display. A strain sensing resistor may be formed on a bent tail portion of the flexible display to gather strain measurements. Resistance measurement circuitry in a display driver integrated circuit may make resistance measurements on the strain sensing resistor and a temperature compensation resistor to measure strain. A crack detection line may be formed from an elongated pair of traces that are coupled at their ends to form a loop. The crack detection line may run along a peripheral edge of the flexible display. Crack detection circuitry may monitor the resistance of the crack detection line to detect cracks. The crack detection circuitry may include switches that adjust the length of the crack detection line and thereby allow resistances to be measured for different segments of the line.