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Yitzhak Te Vanek

from Los Gatos, CA
Age ~73

Yitzhak Vanek Phones & Addresses

  • 248 More Ave, Los Gatos, CA 95032
  • 408 Grandview St, Santa Cruz, CA 95060
  • 41 Grandview St, Santa Cruz, CA 95060
  • Hallandale, FL
  • Hallandale Beach, FL
  • 408 Woodrow Ave, Santa Cruz, CA 95060

Work

Company: Persys engineering Jan 2000 Position: Chief executive officer

Education

Degree: Bachelors, Bachelor of Science School / High School: Ben - Gurion University of the Negev 1973 to 1977 Specialities: Engineering

Industries

Semiconductors

Resumes

Resumes

Yitzhak Vanek Photo 1

Chief Executive Officer

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Location:
San Francisco, CA
Industry:
Semiconductors
Work:
Persys Engineering
Chief Executive Officer
Education:
Ben - Gurion University of the Negev 1973 - 1977
Bachelors, Bachelor of Science, Engineering

Business Records

Name / Title
Company / Classification
Phones & Addresses
Yitzhak Vanek
Chief Oper, Chief Operating Offi, Director
PERSYS ENGINEERING, INC
Mfg Misc Industry Machinery Repair Services Engineering Services · Engineering Services · Semiconductor Devices (Manufac
815 Swift St, Santa Cruz, CA 95060
5310 Elm St, Houston, TX 77081
408 Woodrow Ave, Santa Cruz, CA 95060
(831) 471-9300, (831) 471-9818, (831) 471-0325

Publications

Us Patents

Process For Forming Porous Metal Coating On Surfaces

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US Patent:
20120321812, Dec 20, 2012
Filed:
Jun 14, 2012
Appl. No.:
13/523866
Inventors:
Yitzhak Vanek - Santa Cruz CA, US
Leonardo Mendelovici - Santa Cruz CA, US
International Classification:
C23C 4/06
B05B 1/00
C23C 4/16
US Classification:
427449, 427452, 118300
Abstract:
Embodiments of the invention provide a thermal spray method of forming a protective and porous coating over desired surfaces. Further, embodiments provide a thermal arc spray method, such as twin wire arc spray, to coat the surfaces. The invention may refer to using Aluminium and Silicon alloy in a twin wire arc spray method, to create sacrificial and protective coatings on the surfaces, such as substrates and machine parts. Machine parts may be, for example, of sputtering system. The method may utilize a predefined range of Silicon to be alloyed with Aluminium to improve the physical properties of the Aluminium, and further avoid damages to the coated surface, such as de-lamination and flaking of the coatings and coated surfaces. Additionally, generation of defects during a sputtering process may be efficiently reduced.

Method And Apparatus For Determining Cleanliness Of A Sample

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US Patent:
20160195467, Jul 7, 2016
Filed:
Jan 10, 2016
Appl. No.:
14/991955
Inventors:
- KIRYAT GAT, IL
Gideon Drimer - Herzeliya, IL
Yitzhak Vanek - Los Gatos CA, US
International Classification:
G01N 15/14
G01N 15/02
G01N 15/06
Abstract:
Determining cleanliness of a sample by providing a continuous flow of clean air into a chamber through a HEPA filter, taking a reference reading of particle counts while the chamber is empty, introducing the sample into the chamber and taking a first reading of a particle count received from all sides of the sample in the chamber to determine loose particles in a particle size range of 0.1 microns up to 5 microns associated with the sample.
Yitzhak Te Vanek from Los Gatos, CA, age ~73 Get Report