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Yiming J Wang

from Urbana, IL
Age ~62
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Also known as:
Yiming Ming Wang, Yiming M Wang, Yi Ming Wang, Yi M Wang, Yi Ming Wangyi, Yi-Ming Wang, Ming Wang Yi, Ming Hang, Ming Ang, Shawnna Meyer
Related to:
Mingyue Y Zhou, 63
Connected to:
Aaron Wang, 36Aijie Wang, 54Ailin Y Wang, 67Aiying Wang, 63Alex F Wang, 51Alexandra Wang, 50Alfred C Wang, 47Ally H Wang, 50Amerfil M Wang, 80Andreas Wang, 28

Yiming Wang Phones & Addresses

  • Urbana, IL
  • 5 Baron Park Ln, Burlington, MA 01803 (781) 270-5218
  • 5 Baron Park Ln #24, Burlington, MA 01803 (781) 258-1047
  • 2 Hilda Rd, Bedford, MA 01730 (781) 270-5218 (781) 275-6651
  • 376 Broadway #1, Cambridge, MA 02139
  • 590 Commonwealth Ave, Boston, MA 02215 (617) 270-5218
  • 12 Brainerd Rd #3A, Allston, MA 02134 (617) 277-9173
  • Mishawaka, IN

Specialities

Buyer's Agent • Listing Agent

Resumes

Resumes

Yiming Wang Photo 1

Software Engineer

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Location:
Urbana, IL
Industry:
Internet
Work:
Google
Software Engineer
National Center For Supercomputing Applications Jan 2018 - May 2018
Graduate Researcher
Aarp May 2017 - May 2018
Software Engineer Intern
Cisco Jul 2015 - Oct 2015
Development Engineer Intern
Education:
University of Illinois at Urbana - Champaign 2016 - Jun 2018
Masters, Computer Engineering Beijing University of Posts and Telecommunications 2012 - 2016
Bachelors, Telecommunications, Engineering Queen Mary University of London 2012 - 2016
Bachelors, Telecommunications, Engineering
Skills:
Python
Algorithms
Matlab
C
Java
Linux
Teamwork
R
Microsoft Office
Data Mining
Research
Engineering
Machine Learning
C++
Sql
Languages:
Mandarin
English
Certifications:
Neural Networks and Deep Learning
Structuring Machine Learning Projects
Improving Deep Neural Networks: Hyperparameter Tuning, Regularization and Optimization
Yiming Wang Photo 2

Senior Applied Scientist

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Location:
319 Ringold Valley Cir, Cockeysville, MD 21030
Industry:
Computer Software
Work:
Microsoft
Senior Applied Scientist
Amazon May 2018 - Aug 24, 2018
Applied Scientist Intern
Google May 2017 - Aug 2017
Software Engineering Intern
Johns Hopkins University May 2017 - Aug 2017
Ph.d Student at Johns Hopkins University
Nanjing University Sep 1, 2005 - Jun 1, 2012
Student
Education:
The Johns Hopkins University 2012 - 2017
Doctorates, Doctor of Philosophy, Computer Science, Philosophy Nanjing University 2009 - 2012
Master of Science, Masters, Computer Science Nanjing University 2005 - 2009
Bachelors, Computer Science Xiaoshi Middle School 2005
Skills:
Machine Learning
Matlab
Computer Science
Algorithms
Computer Vision
Artificial Intelligence
Programming
Java
Latex
Data Mining
C++
Image Processing
Linux
Visual C++
Python
C
Interests:
Machine Learning
Machine Learning Computer Vision
Machine Learningcomputer Vision
Computer Vision
Certifications:
Probabilistic Graphical Models
Coursera
Yiming Wang Photo 3

Digital Marketing Intern

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Work:
Hooli Homes
Digital Marketing Intern
Yiming Wang Photo 4

Yiming Wang

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Yiming Wang Photo 5

Yiming Wang

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Business Records

Name / Title
Company / Classification
Phones & Addresses
Yiming Wang
NEWO ENTERPRISES, LLC

Publications

Us Patents

Self-Service Circuit Testing Systems And Methods

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US Patent:
8098797, Jan 17, 2012
Filed:
Dec 27, 2006
Appl. No.:
11/616608
Inventors:
Yiming Wang - Bedford MA, US
Lauren B. Adelson - New York NY, US
David J. Buie - Washington DC, US
Colleen Davis - Phoenix AZ, US
Peter C. Serubo - Laurel Springs NJ, US
Roland J. Zito-Wolf - Watertown MA, US
Assignee:
Verizon Patent and Licensing Inc. - Basking Ridge NJ
International Classification:
H04M 1/24
H04M 3/08
H04M 3/22
US Classification:
379 2901, 379 12, 379 1505, 379 2201, 379 2203, 379 2704
Abstract:
In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user portal including a tool enabling the user to select a signal loop for testing at least a section of the circuit, the signal loop being selected from a plurality of signal loop options. The system also includes a network management subsystem communicatively coupled to the test management subsystem, the network management subsystem being configured to receive data representative of the selection from the test management subsystem and instruct, based on the selection, a network device along the circuit to execute a loop-back mode. In certain embodiments, the selected signal loop defines a test pattern signal flow for testing a subsection of the circuit.

Self-Service Circuit Testing Systems And Methods

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US Patent:
20120123727, May 17, 2012
Filed:
Dec 21, 2011
Appl. No.:
13/332913
Inventors:
Yiming Wang - Bedford MA, US
Lauren B. Adelson - New York NY, US
David J. Buie - Washington DC, US
Colleen Davis - Phoenix AZ, US
Peter C. Serubo - Laurel Springs NJ, US
Roland J. Zito-Wolf - Watertown MA, US
Assignee:
Verizon Business Financial Managment Corporation - Ashburn VA
Verizon Data Services Inc. - Temple Terrace FL
Verizon Services Corp. - Arlington VA
International Classification:
G06F 19/00
G01R 31/28
US Classification:
702119, 702120
Abstract:
In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user portal including a tool enabling the user to select a signal loop for testing at least a section of the circuit, the signal loop being selected from a plurality of signal loop options. The system also includes a network management subsystem communicatively coupled to the test management subsystem, the network management subsystem being configured to receive data representative of the selection from the test management subsystem and instruct, based on the selection, a network device along the circuit to execute a loop-back mode. In certain embodiments, the selected signal loop defines a test pattern signal flow for testing a subsection of the circuit.
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Yiming J Wang from Urbana, IL, age ~62 Get Report