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Yan Q Wei

from Closter, NJ
Age ~50

Yan Wei Phones & Addresses

  • Closter, NJ
  • 712 51St St, Brooklyn, NY 11220 (718) 633-2075
  • Philadelphia, PA

Resumes

Resumes

Yan Wei Photo 1

Medical Doctor

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Industry:
Management Consulting
Work:
Spectasia
Medical Doctor
Yan Wei Photo 2

Yan Wei

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Yan Wei Photo 3

Yan Wei

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Yan Wei Photo 4

Yan Wei

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Skills:
Microsoft Word
Microsoft Office
Research
Yan Wei Photo 5

Student At City University Of New York-Baruch College - Zicklin School Of Business

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Position:
MBA Candidate at Baruch College
Location:
Greater New York City Area
Industry:
Human Resources
Work:
Baruch College since 2009
MBA Candidate

AIM Strategies, Applied Innovative Management 2011 - 2011
OD Intern

IBM Global Business Services, China 2004 - 2008
Senior HR Specialist
Education:
City University of New York-Baruch College - Zicklin School of Business 2009 - 2011
Languages:
English
Japanese
Chinese
Yan Wei Photo 6

Associate At Bank Of America Merrill Lynch

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Location:
Greater New York City Area
Industry:
Information Technology and Services
Yan Wei Photo 7

Student At City University Of New York City College

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Location:
Greater New York City Area
Industry:
Consumer Services
Education:
City University of New York City College 2008 - 2010
Yan Wei Photo 8

Yan Wei Ambler, PA

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Work:
AARP ORGANIZATION, Tax-Aide
New York, NY
Jan 2013 to Apr 2013
Tax Advisor

AIM STRATEGIES, Applied Innovative Management
New York, NY
Jan 2012 to Aug 2012
Organizational Development Intern

FOOD BANK, NEW YORK CITY (IRS VITA)
New York, NY
Jan 2012 to Apr 2012
Income Tax Preparer

IBM CHINA

Feb 2007 to Apr 2008
Business Analyst

IBM CHINA

Jun 2004 to Feb 2007
Senior Human Resources Specialist

Education:
BARUCH COLLEGE, ZICKLIN SCHOOL OF BUSINESS
New York, NY
2013 to 2014
Master of Science in Accountancy in Accounting

BARUCH COLLEGE, Zicklin School of Business
New York, NY
2012
Master of Business Administration

Skills:
MS Office (Excel, Word, PowerPoint, Outlook), SAS, SQL, accounting and tax software applications (QuickBooks, Tax-Wise) and Tax research tools (CCH Tax Research, BNA, Check Point)

Publications

Wikipedia References

Yan Wei Photo 9

Yan Wei

About:
Born:

1973

Skills & Activities:
Award:

Asian Games medalist in athletics

Us Patents

Method For High-Density Microarray Mediated Gene Expression Profiling

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US Patent:
20040002094, Jan 1, 2004
Filed:
Mar 20, 2003
Appl. No.:
10/393075
Inventors:
Robert Larossa - West Chester PA, US
Yan Wei - West Caldwell NJ, US
International Classification:
C12Q001/68
US Classification:
435/006000
Abstract:
The global effect on genes under different environmental conditions can be determined by a comprehensive gene expression profile. The present invention provides a method to monitor the changes in comprehensive cellular gene expression levels at single length resolution by using a high-density microarray prepared with a comprehensive collection of ORFs of a genome. Under different environmental conditions, directly and indirectly affected genes can be detected as the gene expression levels are induced or repressed in comparison to the control.

Strategic Loan Default Scoring

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US Patent:
20130218750, Aug 22, 2013
Filed:
Feb 17, 2012
Appl. No.:
13/399823
Inventors:
Ethan Dornhelm - New York NY, US
Lu Gao - American Canyon CA, US
Joanne Gaskin - Canton MI, US
Yan Wei - Alameda CA, US
Tracy Backes - Reno NV, US
Andrew Leverentz - San Francisco CA, US
International Classification:
G06Q 40/02
US Classification:
705 38
Abstract:
A strategic default score is determined for an entity that characterizes a likelihood of the entity voluntarily electing to default on a loan. Data characterizing credit data and valuation data of an asset owned by the entity is received. Using the received data, the strategic default score is generated which characterizes a likelihood of the entity to voluntarily elect to default on the loan when the entity is capable of paying-off the loan. Provision (e.g., display, transmission, storage, etc.) of the strategic default score is then initiated. Related apparatus, systems, techniques and articles are also described.

Method For High-Density Microarray Medicated Gene Expression Profiling

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US Patent:
6607885, Aug 19, 2003
Filed:
Oct 11, 2000
Appl. No.:
09/686383
Inventors:
Robert A. Larossa - West Chester PA
Yan Wei - West Caldwell NJ
Assignee:
E. I. du Pont de Nemours and Company - Wilmington DE
International Classification:
C12Q 168
US Classification:
435 6, 435 5, 435 911, 435 912, 43525231, 43525232, 43525233, 43525234, 4352525, 536 231, 536 243, 536 2432, 536 2433
Abstract:
The global effect on genes under different environmental conditions can be determined by a comprehensive gene expression profile. The present invention provides a method to monitor the changes in comprehensive cellular gene expression levels at single length resolution by using a high-density microarray prepared with a comprehensive collection of ORFs of a genome. Under different environmental conditions, directly and indirectly affected genes can be detected as the gene expression levels are induced or repressed in comparison to the control.
Yan Q Wei from Closter, NJ, age ~50 Get Report