Wei Yan Chen

7096155, Aug 22, 2006

Mar 3, 2003

10/377836

Wei Chen - Round Rock TX, US
Bharath Vasudevan - Austin TX, US

Dell Products L.P. - Round Rock TX

G06F 19/00

702182, 702 57, 702108, 702117, 324133, 324556, 712227, 719311, 719318, 700 83, 700 90, 361 932

Embedded controller(s) in an information handling system have real-time status and activities represented by indicators, such as light emitting diodes (LEDs), associated with the embedded controller(s). These indicators may be monitored for example by operating (management software, e. g. , Embedded Server Management (ESM) software. In addition, edge triggered latches and a timer detect and store flash patterns of these LED indicators so that the flash pattern information may be read by the operating management software as static signals.

7180208, Feb 20, 2007

Dec 15, 2003

10/735943

Wei Chen - Plano TX, US
Hugh Mair - Dallas TX, US
Uming Ko - Dallas TX, US
David Scott - Dallas TX, US

Texas Instruments Incorporated - Dallas TX

H01H 35/00
H02B 1/24

307116

System and method for reducing voltage fluctuations in an integrated circuit with multiple power domains and sub-domains. A preferred embodiment comprises a plurality of voltage sources and a switching network (such as switching network ) wherein outputs from the plurality of voltage sources are inputs. The switching network can couple the outputs of voltage sources (based on a mapping) with the same output voltage levels to reduce voltage fluctuation amongst power domains coupled to the coupled outputs. The coupling may be performed by a switching structure (such as the switching structure ) that can controllably electrically couple two outputs.

7282905, Oct 16, 2007

Dec 10, 2004

11/010135

Wei Chen - Plano TX, US
Hugh T. Mair - Fairview TX, US
Uming Ko - Plano TX, US
David B. Scott - Plano TX, US

Texas Instruments Incorporated - Dallas TX

G01R 31/26

3241581, 324765, 324769

System and method for detecting transistor failure in large-scale integrated circuits by measuring IDDQ. A preferred embodiment comprises a switch structure for an integrated circuit made up of a plurality of main switches (such as main switch ) selectively coupling a power sub-domain to a power source pin, a plurality of pi-switches (such as pi-switch ) selectively coupling pairs of power sub-domains, and a plurality of IDDQ switches (such as IDDQ switch ) selectively coupling the power sub-domains to a VIDDQ pin. The pi-switches can decouple the power sub-domains while the IDDQ switches can enable the measurement of the quiescent current in the power sub-domains. The use of pi-switches and IDDQ switches can permit the measurement of the quiescent current in the power sub-domains without requiring the use of isolation buffers and needed to powering on and off the integrated circuit between current measurements in the different power sub-domains.

7427940, Sep 23, 2008

Mar 23, 2007

11/690506

Robert Bogdan Staszewski - Garland TX, US
Dirk Leipold - Plano TX, US
Wei Chen - San Diego CA, US

Texas Instruments Incorporated - Dallas TX

H03M 1/12
H03L 7/06

341155, 327269, 327272, 341157

A time-to-digital converter (TDC), a system-on-chip including a TDC, a method of phase detection for use in synthesizing a clock signal and a non-linearity corrector for a TDC. In one embodiment, the TDC includes a chain of delay elements configured to receive a clock signal and generate delayed clock signals. Each one of the delay elements includes: (1) a non-inverting buffer configured to delay the clock signal by about twice a delay of an inverter to provide a buffer-delayed clock signal and (2) a first transmission gate coupled to the non-inverting buffer and configured to delay the clock signal by about the delay of an inverter to provide a first gate-delayed clock signal.

7760656, Jul 20, 2010

Jun 6, 2008

12/134669

Tianson Yuan - Plano TX, US
Brent A. Scott - Leeton MO, US
Ezzat S. Atieh - Olathe KS, US
Wei Chen - Overland Park KS, US

Sprint Communications Company L.P. - Overland Park KS

G01R 31/08

370242, 370248, 370249, 370401, 726 11, 726 23, 702122, 714 32

A network testing system for a device under test (DUT) uses a test tool to generate test packets provided to the DUT as source traffic and to receive the test packets back from the DUT as destination traffic. Before the test packets are returned from the DUT to the test tool, an external router receives the test packets from the DUT and forwards them back to the DUT. The DUT has a first pair of DUT interfaces coupled to the test tool and a second pair of DUT interfaces coupled to the external router. The DUT has a first virtual router with a first routing table configured to direct test packets received on one of the interfaces in the first pair of DUT interfaces to the external router. The DUT has a second virtual router with a second routing table configured to direct test packets received on one of the interfaces in the second pair of DUT interfaces to the test tool. Thus, test packets output by the test tool traverse the DUT more than once before returning to the test tool.

20050047645, Mar 3, 2005

Sep 28, 2004

10/951161

Merritt Funk - Austin TX, US
Wei Chen - San Antonio TX, US

Tokyo Electron Limited - Tokyo

G06K009/00

382145000, 382144000, 382147000

A GUI is presented for managing a semiconductor processing system that is comprehensible and standardized in format. The graphical display is organized so that all significant parameters are clearly and logically displayed so that the user is able to perform the desired data collection, monitoring, modeling, and troubleshooting tasks with as little input as possible. The GUI is web-based and is viewable by a user using a web browser. The GUI allows a user to display real-time tool and process module statuses based upon process module events and alarm messages, historical data numerically and/or graphically, SPC charts, APC system logs, and Alarm logs. In addition, the GUI allows a user to print graphs and reports, to save data to files, to export data, to import data, and set up or modify the system.

20050065630, Mar 24, 2005

Oct 18, 2004

10/966112

Merritt Funk - Austin TX, US
Wei Chen - San Antonio TX, US

Tokyo Electron Limited - Tokyo

G06F019/00

700121000, 700108000, 700103000

A GUI is presented for configuring and initializing a semiconductor processing system, which includes a number of processing tools, a number of processing modules, a number of sensors, a number of processing models, and an alarm management system. The graphical display is organized so that all significant parameters are clearly and logically displayed so that the user is able to perform the desired configuration, initialization, and troubleshooting tasks with as little input as possible. The GUI is web-based and is viewable by a user using a web browser.

20100176343, Jul 15, 2010

May 5, 2009

12/435957

Wei Chen - Arlington TX, US
Shaopeng Wang - Tempe AZ, US
Sarah L. Westcott - Stillwater OK, US
Jun Zhang - Hohhol, MN

C09K 11/02
C09K 11/54
C09K 11/78
C09K 11/59

25230136, 2523016 S, 2523016 R, 2523014 R, 2523014 F

The presently claimed and disclosed inventions relate, in general, to methods of radiation dosimetry and imaging using scintillation luminescence. More particularly, materials having a scintillation luminescence response to radiation that varies with total radiation dose received can be used for dosimetry monitoring, including, but not limited to nanoparticles for in vivo, real-time dosimetry. Energy-transfer nanocomposite materials as well as methods of making and using such materials in various applications including, but not limited to, in vivo radiation dosimetry and imaging, are disclosed. More particularly, the presently claimed and disclosed inventions relate to nanoparticle scintillation luminescence particles encapsulated in hosts of the general formula BaFX and BaFX:Eu where X═Cl, Br and I.