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Vladimir Dmitriev-Zdorov

from Longmont, CO
Age ~65

Vladimir Dmitriev-Zdorov Phones & Addresses

  • 1620 Naples Ln, Longmont, CO 80503 (303) 684-6814
  • Greenwood Village, CO

Publications

Us Patents

Generating Transmission-Code Compliant Test Sequences

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US Patent:
20080275662, Nov 6, 2008
Filed:
Jul 19, 2007
Appl. No.:
11/880354
Inventors:
Vladimir Dmitriev-Zdorov - Longmont CO, US
International Classification:
G06F 19/00
G01R 31/00
US Classification:
702119
Abstract:
Disclosed herein are exemplary methods, apparatus, and systems for generating test sequences that can be used to evaluate high-speed circuit pathways. The disclosed methods, apparatus, and systems can be used, for example, in a printed circuit board or integrated circuit design flow to analyze signal integrity or other electrical behavior. For example, in one exemplary embodiment, a sequence of code words to be input on a circuit channel is determined in a nonrandom manner. In this embodiment, the sequence of code words complies with a transmission code (for example, the 8b10b transmission code) and is designed to cause the output voltage of the channel to be reduced during a time period in which the channel outputs a logic high value.

Generating Worst Case Test Sequences For Non-Linearly Driven Channels

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US Patent:
20090222234, Sep 3, 2009
Filed:
Jan 30, 2009
Appl. No.:
12/363354
Inventors:
Vladimir B. Dmitriev-Zdorov - Longmont CO, US
International Classification:
G06F 19/00
US Classification:
702119
Abstract:
Various implementations of the invention provide methods and apparatuses for generating a test sequence for a driver and channel combination, wherein the driver is non-linear. In various implementations of the invention, a test sequence is generated that produces the worst or near worst error rate of the channel. With various implementations of the invention, voltage waves at the driver and impulse response waves of the channel are generated. In various implementations of the invention, the driver voltage waves and impulse response waves are simulated responses of the driver and channel to a digital signal input. With further implementations of the invention, receiver voltage waves are generated by combining the impulse response wave and the driver voltage waves. Subsequently, a test sequence is selected based upon the combined receiver voltage wave.

Characteristic Response Extraction For Non-Linear Transmit Channels

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US Patent:
20110188562, Aug 4, 2011
Filed:
Jan 24, 2011
Appl. No.:
13/012698
Inventors:
Vladimir B. Dmitriev-Zdorov - Longmont CO, US
International Classification:
H04B 17/00
US Classification:
375228, 375224
Abstract:
Techniques for extracting the characteristic response of a non-linear channel are presented. In various implementations of the invention, a channel's characteristic response may be determined by identifying a first input sequence, determining the ones compliment of the first input sequence and then determining the response of the channel to these two input sequences. Subsequently, two input matrices and two response matrices may be generated based upon the two input sequences and their corresponding responses. Given these four matrices, a symmetrical response component may be determined by iteratively solving a system of equations formed from the columns of each matrix. Subsequently, given the symmetric component and these four matrices, an asymmetrical response component may be determined by again iteratively solving the system of equations for the columns of each matrix.

Optimization Of Decoupling Device Choice For Electronic Design

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US Patent:
20120136598, May 31, 2012
Filed:
Aug 4, 2011
Appl. No.:
13/198687
Inventors:
Vladimir Dmitriev-Zdorov - Longmont CO, US
International Classification:
G06F 19/00
US Classification:
702 65
Abstract:
Optimization of decoupling design selection for electronic designs is described. Initially an electronic design, such as, a printed circuit board, having a power delivery network with a given impedance value is identified. A target impedance value for the power delivery network is also identified. Subsequently, a decoupling impedance value, that, if added to the impedance of the power delivery network would transform the given impedance value into the target impedance value, is derived. In many implementations, the power delivery network may have a number of ports. Accordingly, a decoupling impedance value may be derived for each port. A selection of decoupling devices, each having a given impedance value, are also identified. Subsequently, a system of equations is formed that relates the decoupling devices and their associated impedance values to the decoupling impedance values. The system of equations is then solved to derive a subset of the decoupling devices that, if added to the power delivery network, would transform the given impedance of the power delivery network into the target impedance.

Generating Test Sequences For Circuit Channels Exhibiting Duty-Cycle Distortion

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US Patent:
20080273584, Nov 6, 2008
Filed:
Apr 29, 2008
Appl. No.:
12/150658
Inventors:
Vladimir Dmitriev-Zdorov - Longmont CO, US
International Classification:
H04B 17/00
H04B 3/46
H04Q 1/20
US Classification:
375224
Abstract:
Disclosed herein are exemplary methods, apparatus, and systems for generating test sequences that can be used to evaluate high-speed circuit pathways that exhibit duty-cycle distortion (e.g., clock-related duty-cycle distortion or data-dependent duty-cycle distortion). In one exemplary embodiment, a period of an input signal is divided into two or more subintervals, each subinterval having a duration that is different from other subintervals. Pulse representations are generated for each of the subintervals, the pulse representations representing pulse durations corresponding to the respective durations of each of the subintervals. Inverted sampled pulse responses are generated to the pulse representations. Samples from two or more of the inverted sampled pulse responses are combined to create one or more combined inverted sampled pulse responses. A test sequence is determined for testing the electrical behavior of a circuit channel using the one or more combined sampled pulse responses and stored on one or more computer-readable media.
Vladimir Dmitriev-Zdorov from Longmont, CO, age ~65 Get Report