US Patent:
20160306021, Oct 20, 2016
Inventors:
- Palo Alto CA, US
Daehyun YOON - Palo Alto CA, US
Valentina TAVIANI - Palo Alto CA, US
Brian A. HARGREAVES - Menlo Park CA, US
International Classification:
G01R 33/565
A61B 5/055
A61N 7/02
A61N 1/40
Abstract:
A method for providing at least one measurement by a magnetic resonance imaging (MRI) system of a tissue property or underlying tissue property in a region sufficiently close to a metal object, so that the metal object induces artifacts is provided. At least one magnetic resonance imaging signal from the region is acquired through the MRI system. The acquired at least one MRI signal is processed to correct for artifacts induced by the metal object. At least one tissue property or underlying tissue property measurement is extracted from the processed at least one MRI signal.