Timothy A Skunes

6443631, Sep 3, 2002

Feb 20, 2001

09/789185

Steven K. Case - St. Louis Park MN
Gregory S. Mowry - Burnsville MN
Timothy A. Skunes - Mahtomedi MN

Avanti Optics Corporation - Minneapolis MN

G02B 636

385 91, 385137, 385 52

An optical module for use in an optical device is provided which includes an optical component. The optical component is bonded to a relative reference mount which can be attached to couple to a fixed reference mount. The bond is formed by solder.

2012032, Dec 27, 2012

May 24, 2012

13/480079

Steven K. Case - St. Louis Park MN,
Beverly Caruso - St. Louis Park MN,
Todd D. Liberty - Apple Valley MN,
Timothy A. Skunes - Mahtomedi MN,
Carl E. Haugan - St. Paul MN,
Chuanqi Chen - Singapore,
Hiroshi Anzai - Kanagawa,

H04N 7/18
G06F 17/00

348 92, 235375, 348E07085

An optical inspection sensor is provided. The sensor includes an array of cameras configured to acquire image data relative to a workpiece that moves relative to the array of cameras in a non-stop fashion. An illumination system is disposed to provide a pulse of illumination when the array of cameras acquires the image data. At least some image data includes data regarding a skip mark or barcode on the workpiece.

2004021, Oct 28, 2004

Apr 22, 2003

10/420349

Steven Case - St. Louis Park MN,
Timothy Skunes - Mahtomedi MN,
Michael Knipfer - Maple Grove MN,
Gregory Mowry - Burnsville MN,

G01B011/00

356/401000

An optical device is provided which includes a plurality of optical modules and an alignment compensation module. Each optical module includes an optical component fixedly coupled to a relative reference mount. The relative reference mount is configured to attach to a substrate. A plurality of optical modules mount on the substrate to form the optical device. The alignment compensation module removes residual alignment errors of the optical device.

2004026, Dec 30, 2004

Aug 20, 2003

10/644650

Timothy Skunes - Mahtomedi MN,
John Konicek - Minneapolis MN,
Michael Knipfer - Maple Grove MN,

G02B006/26

385/052000

An optical alignment mount for adjusting a height of an optical component includes a component mount adapted to receive an optical component. A height of the optical component in the mount can be adjusted and fixed as desired.

2010029, Nov 25, 2010

Apr 28, 2010

12/769151

Steven K. Case - St. Louis Park MN,
Timothy A. Skunes - Mahtomedi MN,
David W. Duquette - Minneapolis MN,
Sean D. Smith - Woodbury MN,
Beverly Caruso - St. Louis Park MN,

H04N 7/18

348 95, 348E07085

A sensor for sensing component offset and orientation when held on a nozzle of a pick and place machine is provided. The sensor includes a plurality of two-dimensional cameras, a backlight illuminator and a controller. Each camera has a field of view that includes a nozzle of the pick and place machine. The backlight illuminator is configured to direct illumination toward the plurality of two-dimensional cameras. The backlight illuminator is positioned on an opposite side of a nozzle from the plurality of two-dimensional cameras. The controller is coupled to the plurality of two-dimensional cameras and the backlight illuminator. The controller is configured to determine offset and orientation information of the component(s) based upon a plurality of backlit shadow images detected by the plurality of two-dimensional cameras. The controller provides the offset and orientation information to a controller of the pick and place machine.

2011009, Apr 21, 2011

Nov 4, 2010

12/939267

Carl E. Haugan - St. Paul MN,
Steven K. Case - St. Louis Park MN,
Beverly Caruso - St. Louis Park MN,
Timothy A. Skunes - Mahtomedi MN,

H04N 7/18

348136, 348139, 348E07085

An optical inspection system for inspecting a substrate is provided. The system includes an array of cameras configured to acquire a plurality of sets of images as the substrate and the array undergo relative motion with respect to each other. At least one focus actuator is operably coupled to each camera of the array of cameras to cause displacement of at least a portion of each camera that affects focus. A substrate range calculator is configured to receive at least portions of images from the array and to calculate range between the array of cameras and the substrate. A controller is coupled to the array of cameras and to the range calculator. The controller is configured to provide a control signal to each of the at least one focus actuator to adaptively focus each camera of the array during the relative motion.

2011010, May 5, 2011

Nov 5, 2010

12/940214

Steven K. Case - St. Louis Park MN,
Beverly Caruso - St. Louis Park MN,
Todd D. Liberty - Apple Valley MN,
Timothy A. Skunes - Mahtomedi MN,
Carl E. Haugan - St. Paul MN,
Chuanqi Chen - Singapore,

H04N 7/18

348 87, 348E07085

An electronics assembly line includes a first electronics assembly machine and a second electronics assembly machine. The first electronics assembly machine has a first electronics assembly machine outlet. The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine is coupled to the outlet of the first electronics assembly machine by a conveyor. A first optical inspection sensor is disposed over the conveyor before the inlet of the second electronics assembly and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor in a non-stop fashion. A second optical inspection sensor is disposed over the conveyor after the outlet of the second electronics assembly machine and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor in a non-stop fashion. A computer is operably coupled to the first and second optical inspection sensors and is configured to provide an inspection result based upon at least one of the first and second inspection image data.

2012013, May 31, 2012

Dec 1, 2011

13/309211

Timothy A. Skunes - Mahtomedi MN,
Carl E. Haugan - St. Paul MN,
Paul R. Haugan - Bloomington MN,
Eric P. Rudd - Hopkins MN,
Steven K. Case - St. Louis Park MN,
Beverly Caruso - St. Louis Park MN,

G01P 3/40

356 23

An optical inspection system includes a printed circuit board (PCB) transport and an illuminator that provides at least a first strobed illumination field. The illuminator includes a light pipe having a first end proximate the PCB, and a second end opposite the first end and spaced from the first end. An array of cameras is configured to digitally image the PCB and to generate a plurality of images of the PCB with the at least first strobed illumination field type. At least one structured light projector is disposed to project structured illumination on the PCB. The at least one array of cameras is configured to digitally image the PCB while the PCB is illuminated with structured light, to provide a plurality of structured light images. A processing device is configured to generate an inspection result as a function of the plurality of images and the plurality of structured light images.