Theodore Bernard Ladewski

62084127, Mar 27, 2001

Jun 14, 1999

9/332236

Theodore B. Ladewski - Ann Arbor MI

Visteon Global Technologies, Inc. - Dearborn MI

G01N21/88

3562391

A method of determining optical quality of a transparent product includes passing a first gray-scale pattern through the material; obtaining a first image of the first pattern with an image pickup device after the first pattern has passed through the material; and determining optical quality of the material based on data obtained from the first image. An apparatus for determining optical quality of such a material is also disclosed.

54651530, Nov 7, 1995

Oct 13, 1993

8/136230

Theodore B. Ladewski - Ann Arbor MI

KMS Fusion, Inc. - Ann Arbor MI

G01B 1100
G01J 102

356376

A method and system for gauging deviations of a surface of a specular surfaced test object from a preselected nominal surface profile utilizes electromagnetic radiation that is directed towards a direction altering means and through an attenuating medium onto the reflective surface of the test object. An image sensor such as a camera is positioned to receive an image of the radiation reflected by the test object surface back through the attenuating layer, with the Intensity of such radiation varying across the image as a function of the deviation of the test Object surface from the nominal surface profile. The sensor output is digitized to form a set of digital signals indicative of the intensity of radiation associated with each location of the reflected image, and the digitized signals are stored in digital electronic memory and/or displayed on a screen. Methods for correcting optically generated errors in the image are disclosed that, together with the gauging system, provide a quantitative measurement of the deviations in test surface profile from a preselected profile over the entire surface being measured.

55175759, May 14, 1996

Oct 13, 1993

8/136624

Theodore B. Ladewski - Ann Arbor MI

G06K 900

382108

Methods of correcting optically generated errors in images formed of test object surface profiles include the use of a bias image to correct errors resulting from problems associated with components of the gauging system. The bias image is also useful for correcting errors resulting from the nature of the test object surface. Further methods also include the use of a mask to selectively vary the amount of radiation that is used across the test object surface when gauging the surface profile. The mask effectively uniformly irradiates the test object surface to correct errors caused by irregular or extreme surface contours or coloration in the test object surface.

52892670, Feb 22, 1994

Oct 4, 1991

7/770885

Garland E. Busch - Milan MI
James G. Downward - Ann Arbor MI
Paul G. Gottschalk - Ann Arbor MI
Theodore B. Ladewski - Ann Arbor MI
Charles D. Lysogorski - Dexter MI

KMS Fusion, Inc. - Ann Arbor MI

G01B 1100
G01J 102

356394

A method and system for gauging deviations of a surface of a test part from a preselected nominal surface profile is disclosed. The system includes a support having a master surface that is substantially a matched or mating surface of the nominal surface profile of the test part and a thin layer of an attenuating medium such as a dye liquid between the master and test surfaces. Electromagnetic radiation is directed through the support and master surface and through the attenuating layer onto the reflective surface of the test part. An image sensor such as a camera is positioned to receive an image of the radiation reflected by the test part surface back through the attenuating layer and support, with the intensity of such radiation across the image varying as a function of the deviation of the test part surface from the nominal surface profile. The sensor output is digitized to form a series of digital signals indicative of the intensity of radiation associated with each location of the reflected image, and the digitized pixel signals are stored in digital electronic memory and/or displayed on a screen. Computer programming corrects the digitized intensity signals for sensor gain, bias and variations in part reflectivity, and presents a quantitative measurement of the deviations in test surface profile from the master surface profile over the entire surface being measured.

61009903, Aug 8, 2000

Jun 14, 1999

9/332234

Theodore B. Ladewski - Ann Arbor MI

Ford Motor Company - Dearborn MI

G01N 2155

356445

A method of determining reflective optical quality of a reflective product includes reflecting a first gray-scale pattern off the product; obtaining a first image of the first pattern with an image pickup device after the first pattern has reflected off of the product; and determining optical quality of the product based on data obtained from the first image. An apparatus for determining reflective optical quality of such a product is also disclosed.

54634644, Oct 31, 1995

Oct 13, 1993

8/136229

Theodore B. Ladewski - Ann Arbor MI

KMS Fusion, Inc. - Ann Arbor MI

G01B 1100
G01J 102

356376

A system for gauging the surface of a test object includes an image sensor, such as a camera, positioned to receive an image of the radiation naturally emitted from the test object through an attenuating medium. The intensity of such radiation varies across the image as a function of the deviation of the test object surface from a nominal surface profile. The sensor output is digitized to form a set of digital signals indicative of the intensity of radiation across the image, and the digitized signals are stored in digital electronic memory and/or displayed on a screen. Methods for correcting optically generated errors in the image are disclosed that, together with the gauging system, provide a quantitative measurement of the deviations in a test object surface profile from a preselected profile.