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Terry Doyle Phones & Addresses

  • 508 Main St APT 2G, Evansville, IN 47708 (812) 550-1679
  • Cupertino, CA
  • Greenville, SC
  • Griffin, GA
  • Mansfield, TX
  • Lawrenceville, GA
  • San Jose, CA

Work

Company: Stanford hospitals and clinics Apr 2014 Position: Manager, revenue - cancer center

Education

School / High School: Stanford 2014 Specialities: Leadership Lean Workshop

Specialities

General Practice

Professional Records

Lawyers & Attorneys

Terry Doyle Photo 1

Terry Doyle - Lawyer

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Specialties:
General Practice
ISLN:
907762902
Admitted:
1963
University:
Lamar University, B.S., 1960
Law School:
University of Texas, LL.B., 1963

Resumes

Resumes

Terry Doyle Photo 2

Terry Doyle Cupertino, CA

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Work:
Stanford Hospitals and Clinics

Apr 2014 to 2000
Manager, Revenue - Cancer Center

Cancer Care Program
Stanford, CA
Mar 2010 to Apr 2014
Clinical Operations Manager

North American Imaging, LLC
Buford, GA
Oct 2009 to Mar 2010
CHIEF OPERATING OPERATOR

Terry Doyle Consulting

Jun 2009 to Oct 2009
CONSULTANT

Stanford Hospital & Clinics
Stanford, CA
Oct 2008 to Jun 2009
OUTPATIENT CLINICAL DIRECTOR RADIOLOGY

Spalding Regional Medical Center
Griffin, GA
May 2006 to Mar 2008
DIRECTOR RADIOLOGY

St. Francis Hospital
Greenville, SC
Jul 2004 to Apr 2006
DIRECTOR RADIOLOGY

Medical Center of Arlington
Arlington, TX
Nov 1999 to Jul 2004
DIRECTOR CLINICAL SUPPORT SERVICES

Physicians Immediate Medical

1986 to 1999
DIRECTOR ALLIED SERVICES

Professional Diagnostics
Lawrenceville, GA
1986 to 1999
Outpatient Clinical Director

Education:
Stanford
2014
Leadership Lean Workshop

Stanford Leadership Academy
2011 to 2012

Kennedy Western University
Cheyenne, WY
2004 to 2005
Health Care Administration

School of Health Care Science
Wichita Falls, TX
1983 to 1984
Certificate in Technology

Evansville University
Evansville, IN
1981 to 1982
Computer Science

Vincennes University
Vincennes, IN
1976 to 1977
Business Administration

Business Records

Name / Title
Company / Classification
Phones & Addresses
Terry Doyle
Principal
Art Works
Business Services at Non-Commercial Site
6001 Revere Pl, Dallas, TX 75206
(214) 797-2692, (214) 821-1354
Terry Doyle
President, Principal
Sib Computing
Custom Computer Programing · Computer Repair
2053 E Bayshore Rd, Redwood City, CA 94063
(650) 367-6164

Publications

Wikipedia References

Terry Doyle Photo 3

Terry Doyle

Us Patents

Wafer Fabrication Data Acquisition And Management Systems

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US Patent:
6952656, Oct 4, 2005
Filed:
Apr 28, 2000
Appl. No.:
09/561440
Inventors:
Sherry Cordova - Sunnyvale CA, US
Terry L. Doyle - Portola Valley CA, US
Natalia Kroupnova - Sunnyvale CA, US
Evgueni Lobovski - San Jose CA, US
Inna Louneva - Palo Alto CA, US
Richard C. Lyon - Boulder Creek CA, US
Yukari Nishimura - Sunnyvale CA, US
Clari Nolet - Los Altos CA, US
Terry Reiss - San Jose CA, US
Woon Young Toh - San Jose CA, US
Michael E. Wilmer - Portola Valley CA, US
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
G06F019/00
US Classification:
702117, 700121
Abstract:
The present invention provides a semiconductor processing device () including a tool () having one or more sensors, a primary data communication port () and a secondary data communication port (). A sensor data acquisition subsystem () acquires sensor data from the tool via the secondary port (). The data acquisition subsystem () acquires MES operation messages via the primary port (). Sensor data are communicated to a sensor processing unit () of a sensor data processing subsystem (). The sensor processing unit () processes and analyzes the sensor data. Additionally, the processing unit () can be adapted for making product or processing related decisions, for example activating an alarm if the process is not operating within control limits. In another embodiment, the present invention provides a method and apparatus for processing data from a wafer fab facility () including a plurality of tools () each having a primary data communication port () and a secondary data communication port ().

Platen Assembly Utilizing Magnetic Slip Ring

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US Patent:
20060154569, Jul 13, 2006
Filed:
Jan 11, 2005
Appl. No.:
11/034350
Inventors:
Terry Doyle - Redwood City CA, US
Lakshmanan Karuppiah - San Jose CA, US
International Classification:
B24B 49/00
US Classification:
451008000
Abstract:
Embodiments of the present invention generally relate to an apparatus for processing a substrate and more specifically to a device that will transfer electrical power and/or control signals between a stationary base and a rotating platen without involving mechanical contact. The device does not suffer the drawbacks of conventional slip rings burdened with moving surfaces. In one embodiment, an apparatus for processing a substrate is provided. The apparatus includes a platen assembly having a surface for supporting a planarizing material and disposed on a stationary base so that the platen assembly may rotate relative to the base. The apparatus further includes a coupling assembly for transferring electrical energy from a primary coil to a secondary coil. The coupling assembly includes the primary coil of wire wrapped around a first core; the first core coupled to the base; the secondary coil of wire wrapped around a second core; and the second core coupled to the platen assembly.

Apparatus And Method For Endpoint Control And Plasma Monitoring

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US Patent:
6535779, Mar 18, 2003
Filed:
Mar 6, 1998
Appl. No.:
09/036217
Inventors:
Manush Birang - Los Gatos CA
Gregory L. Kolte - San Jose CA
Terry Lee Doyle - Portola Vally CA
Nils Johansson - Los Gatos CA
Paul E. Luscher - Sunnyvale CA
Leonid Poslavsky - Sunnyvale CA
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
G06F 766
US Classification:
700121, 700112, 700114, 700258, 713500
Abstract:
A substrate processing system having a bi-directional interface and concomitant communication protocol to allow a controller to communicate with an external endpoint system is disclosed. More specifically, the substrate processing system comprises a controller and an endpoint detection system that are coupled together via a RS-232 interface. A SECS compliant communication protocol is employed to effect communication between the controller and endpoint detection system to increase wafer processing information exchange and data exchange.
Terry L Doyle from Evansville, IN, age ~68 Get Report