Search

Stephen Miner Phones & Addresses

  • Moore, OK
  • 11 Petrie Ln, Queensbury, NY 12804
  • Provo, UT
  • Morgantown, WV
  • Chesterfield, MO
  • Sierra Vista, AZ
  • Sarasota, FL

Work

Company: Quad/graphics Oct 1996 Position: Area technical leader

Industries

Printing

Resumes

Resumes

Stephen Miner Photo 1

Area Technical Leader At Quad And Graphics

View page
Location:
100 Byp Ky, Versailles, KY
Industry:
Printing
Work:
Quad/Graphics since Oct 1996
Area Technical Leader

Publications

Us Patents

Wafer Carrier Purge Apparatuses, Automated Mechanical Handling Systems Including The Same, And Methods Of Handling A Wafer Carrier During Integrated Circuit Fabrication

View page
US Patent:
20180138064, May 17, 2018
Filed:
Jan 16, 2018
Appl. No.:
15/872335
Inventors:
- Grand Cayman, KY
Stephanie Waite - Saratoga Springs NY, US
Stephen B. Miner - Gansevoort NY, US
John Robinson - Saratoga Springs NY, US
International Classification:
H01L 21/673
H01L 21/677
B08B 9/00
B08B 5/02
B08B 5/00
Abstract:
A wafer carrier purge apparatus, an automated mechanical handling system, and a method of handling a wafer carrier during integrated circuit fabrication are provided. The wafer carrier purge apparatus includes a purge plate adapted for insertion into a carrier storage position. The purge plate includes a gas port and a gas nozzle in fluid communication with the gas port. The gas port receives a gas flow. The gas nozzle is adapted to contact an inlet port of a wafer carrier. The purge plate further includes a vacuum port and a vacuum nozzle in fluid communication with the vacuum port, spaced from the gas nozzle. The vacuum nozzle is adapted to capture gas that escapes from the wafer carrier through an outlet port of the wafer carrier. The purge plate is separate and removable from the carrier storage position.

Wafer Carrier Purge Apparatuses, Automated Mechanical Handling Systems Including The Same, And Methods Of Handling A Wafer Carrier During Integrated Circuit Fabrication

View page
US Patent:
20160155654, Jun 2, 2016
Filed:
Feb 4, 2016
Appl. No.:
15/015578
Inventors:
- Grand Cayman, KY
Stephanie Waite - Saratoga Springs NY, US
Stephen B. Miner - Gansevoort NY, US
John Robinson - Saratoga Springs NY, US
International Classification:
H01L 21/673
B08B 5/02
B08B 9/00
H01L 21/677
Abstract:
A wafer carrier purge apparatus, an automated mechanical handling system, and a method of handling a wafer carrier during integrated circuit fabrication are provided. The wafer carrier purge apparatus includes a purge plate adapted for insertion into a carrier storage position. The purge plate includes a gas port and a gas nozzle in fluid communication with the gas port. The gas port receives a gas flow. The gas nozzle is adapted to contact an inlet port of a wafer carrier. The purge plate further includes a vacuum port and a vacuum nozzle in fluid communication with the vacuum port, spaced from the gas nozzle. The vacuum nozzle is adapted to capture gas that escapes from the wafer carrier through an outlet port of the wafer carrier. The purge plate is separate and removable from the carrier storage position.

Automated Mechanical Handling Systems For Integrated Circuit Fabrication, System Computers Programmed For Use Therein, And Methods Of Handling A Wafer Carrier Having An Inlet Port And An Outlet Port

View page
US Patent:
20150234378, Aug 20, 2015
Filed:
Feb 14, 2014
Appl. No.:
14/180560
Inventors:
- Grand Cayman, KY
Isaac Sarek Banner - Saratoga Springs NY, US
Stephen Bradley Miner - Gansevoort NY, US
Assignee:
GLOBALFOUNDRIES, Inc. - Grand Cayman
International Classification:
G05B 19/418
Abstract:
Automated mechanical handling systems (AMHS) for integrated circuit fabrication, system computers programmed for use in the AMHSs, and methods of handling a wafer carrier having an inlet port and an outlet port are provided. An exemplary method of handling the wafer carrier includes providing a plurality of carrier storage positions that are adapted to receive the wafer carrier. The carrier storage positions include a presence sensor and a gas nozzle. The wafer carrier is loaded into one of the carrier storage positions. The presence of the wafer carrier in the carrier storage position is sensed with the presence sensor. A malfunction in gas flow through the inlet port is identified in the carrier storage position that contains the wafer carrier. The wafer carrier is relocated to another carrier storage position in response to identifying the malfunction.

Wafer Carrier Purge Apparatuses, Automated Mechanical Handling Systems Including The Same, And Methods Of Handling A Wafer Carrier During Integrated Circuit Fabrication

View page
US Patent:
20140360531, Dec 11, 2014
Filed:
Jun 5, 2013
Appl. No.:
13/910683
Inventors:
- Grand Cayman, KY
Stephanie Waite - Saratoga Springs NY, US
Stephen B. Miner - Gansevoort NY, US
John Robinson - Saratoga Springs NY, US
International Classification:
H01L 21/677
B08B 5/02
US Classification:
134 21, 15345
Abstract:
A wafer carrier purge apparatus, an automated mechanical handling system, and a method of handling a wafer carrier during integrated circuit fabrication are provided. The wafer carrier purge apparatus includes a purge plate adapted for insertion into a carrier storage position. The purge plate includes a gas port and a gas nozzle in fluid communication with the gas port. The gas port receives a gas flow. The gas nozzle is adapted to contact an inlet port of a wafer carrier. The purge plate further includes a vacuum port and a vacuum nozzle in fluid communication with the vacuum port, spaced from the gas nozzle. The vacuum nozzle is adapted to capture gas that escapes from the wafer carrier through an outlet port of the wafer carrier. The purge plate is separate and removable from the carrier storage position.

System For Separately Handling Different Size Foups

View page
US Patent:
20140308108, Oct 16, 2014
Filed:
Apr 10, 2013
Appl. No.:
13/859773
Inventors:
- Grand Cayman, KY
Ryan J. GALLAGHER - Saratoga Springs NY, US
Stephen B. MINER - Gansevoort NY, US
Assignee:
GLOBALFOUNDRIES Inc. - Grand Cayman
International Classification:
H01L 21/677
US Classification:
414800, 294213, 294183
Abstract:
A system for separately handling different size FOUPs includes an end effector having a surface thereon for supporting a FOUP. The end effector and surface is configured to support different size FOUPs. A fixture or means for engaging and maintaining a FOUP, of different size FOUPs, included to position and maintain each of a different size FOUP on the end effector during transport thereof. A shelf is configured to receive each of said different size FOUPs. The end effector is thus capable of transporting either a first size FOUP or a second, smaller size FOUP.
Stephen B Miner from Moore, OK, age ~54 Get Report