A multichannel frequency phase variable signal source is described having particular application in the simulation of an emitter environment for testing interferometer receivers. An improved direct digital frequency synthesizer produces phase information for initiating the operation of a related frequency synthesizer at a different phase point from those of the remainder of the synthesizers forming the multi channel source. An improved direct digital frequency synthesizer is described for varying this phase information.
Test Probe And Circuit Board Arrangement For The Circuit Under Test For Microstrip Circuitry
Stanley J. Gourse - Highland MD Eugene Fischer - Upper Marlboro MD George A. Harrison - Pasadena MD
Assignee:
Litton Systems, Inc. - Woodland Hills CA
International Classification:
G01R 106
US Classification:
324754
Abstract:
A wide band radio frequency measurement probe assembly is described for use in connection with circuits constructed of microstrip circuitry. The probe includes a resistive voltage divider connected to a microstrip transmission line enclosed in a hand held housing. Ground points for engagement with ground contacts on the probe are provided on the circuit board substrate and are plated through to a ground plane on the other side of the substrate.
Stanley Gourse - Highland MD Jacob Rozmaryn - Silver Spring MD Dennis L. Kershner - Elkridge MD
Assignee:
Litton Systems, Inc. - Beverly Hills CA
International Classification:
G01R 2316
US Classification:
324 77R
Abstract:
A process and means for identifying erroneous frequency measurements made by an IFM receiver using a multi-channel delay line discriminator. Expected phase codes are compared with measured phase codes. An error signal is generated when the magnitude of deviation exceeds a predetermined amount. Preferred formulas are used to compute the expected phase codes and the deviation magnitude.