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Shibu P Pillai

from Shaker Heights, OH
Age ~56
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Also known as:
Shibu Pillai Simi
Related to:
Babu K ChandrasekharBabu Pillai, 55Simi R Pillai, 50
Connected to:
Ajay Pillai, 34Ajikumar N Pillai, 52Aleta A Pillai, 55Aravind Pillai, 71Archana Pillai, 45Ashok P Pillai, 63Athira PillaiDamodaran G Pillai, 61Deepti K Pillai, 44Devika Pillai, 72

Shibu Pillai Phones & Addresses

  • Shaker Heights, OH
  • Franklin, WI
  • 2823 University Ct, Waukesha, WI 53188 (262) 544-5059
  • 12113 Metric Blvd, Austin, TX 78758
  • 12501 Tech Ridge Blvd, Austin, TX 78753
  • Shaker Hts, OH

Work

Company: Philips Jul 2016 Position: Ct senior systems engineer

Education

Degree: Master of Business Administration, Masters School / High School: Icfai University 2006 to 2008 Specialities: International Business

Skills

Software Engineering • Software Development • Integration • Medical Devices • C++ • Testing • Linux • Medical Imaging • Software Design • Dicom • Java • R&D • Engineering • Software Project Management • Product Development • Xml • Embedded Systems • C • Agile Methodologies • Ooad • Requirements Analysis • Pacs • Architecture • Core Java • Unix • Image Processing • System Architecture • Embedded Software • Programming • Distributed Systems • Systems Engineering • Design Control • Hl7 • Javascript • Oop • Scrum • Biomedical Engineering • Object Oriented Design • Iso 13485 • Design Patterns • Operating Systems • Vxworks • Jsp • C# • Uml • Clearcase • Perl • Digital Imaging • Html • Algorithms

Languages

Mandarin • English • Tamil • Kannada • Malayalam • Hindi

Ranks

Certificate: Sun Certified Java Programmer

Interests

Children • Economic Empowerment • Civil Rights and Social Action • Environment • Education • Poverty Alleviation • Science and Technology • Human Rights • Health

Industries

Medical Devices

Resumes

Resumes

Shibu Pillai Photo 1

Ct Senior Systems Engineer

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Location:
Cleveland, OH
Industry:
Medical Devices
Work:
Philips
Ct Senior Systems Engineer
Philips Aug 2010 - Jun 2016
Principal System Engineer
Philips Oct 2008 - Jul 2010
Systems Architect
Ge Healthcare Oct 2004 - Jul 2008
Software Architect and Lead System Designer
Ge Healthcare Jun 2002 - Oct 2004
Project Lead
Education:
Icfai University 2006 - 2008
Master of Business Administration, Masters, International Business Bhabha Atomic Research Center 1991 - 1992
Masters, Engineering University College of Teacher Education, Vocational Higher Secondary School Campus, Elanthoor, Pathanamthitta 1986 - 1991
Bachelors, Bachelor of Technology, Communication, Electronics
Skills:
Software Engineering
Software Development
Integration
Medical Devices
C++
Testing
Linux
Medical Imaging
Software Design
Dicom
Java
R&D
Engineering
Software Project Management
Product Development
Xml
Embedded Systems
C
Agile Methodologies
Ooad
Requirements Analysis
Pacs
Architecture
Core Java
Unix
Image Processing
System Architecture
Embedded Software
Programming
Distributed Systems
Systems Engineering
Design Control
Hl7
Javascript
Oop
Scrum
Biomedical Engineering
Object Oriented Design
Iso 13485
Design Patterns
Operating Systems
Vxworks
Jsp
C#
Uml
Clearcase
Perl
Digital Imaging
Html
Algorithms
Interests:
Children
Economic Empowerment
Civil Rights and Social Action
Environment
Education
Poverty Alleviation
Science and Technology
Human Rights
Health
Languages:
Mandarin
English
Tamil
Kannada
Malayalam
Hindi
Certifications:
Sun Certified Java Programmer
Sun Microsystems

Publications

Us Patents

Methods And Apparatus For Imaging System Quality Readiness Check

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US Patent:
6075835, Jun 13, 2000
Filed:
Aug 25, 1998
Appl. No.:
9/140301
Inventors:
Kishore Acharya - Brookfield WI
Diane M. Miesbauer - Brookfield WI
Shibu P. Pillai - Waukesha WI
Charles Shaughnessy - Whitefish Bay WI
Assignee:
General Electric Company - Milwaukee WI
International Classification:
A61B 603
US Classification:
378 4
Abstract:
The present invention, in one form, is an imaging system which, in one embodiment, utilizes scan data and DAS input signals to determine image quality. More specifically, and in one embodiment, by generating a ratio of data from two scans, a group of non-conforming detector cells may be identified. In addition, by comparing scans performed at different time frames, a trend of image quality is also determined. In addition, a group of non-conforming DAS channels may be identified by applying a range of known input signals. By comparing the an absolute gain ratio, the DAS performance is determined.
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Shibu P Pillai from Shaker Heights, OH, age ~56 Get Report