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Scott T Quarmby

from Round Rock, TX
Age ~54
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Also known as:
Scott Thomas Quarmby
Phone and address:
8405 Laughing Water Ln, Round Rock, TX 78681
(512) 733-7526
Related to:
Thomas L Reed, 75Jean R Reed, 58Barbara J Barnum, 78Charles WislerColton Mogler, 33
Connected to:
John M Quarmley, 63Jennifer J Quarnberg, 52Justin K Quarnberg, 45Matthew M Quarneri, 47Fred C Quarnstrom, 84Joni T Quarnstrom, 66Julian D Quarnstrom, 77Bruno P Quarra, 98Marivic C Quarrato, 66Andre Quarrels, 47

Scott Quarmby Phones & Addresses

  • 8405 Laughing Water Ln, Round Rock, TX 78681 (512) 733-7526
  • Blanket, TX
  • Gainesville, FL
  • 8537 Capital Of Texas Hwy, Austin, TX 78759 (512) 502-0557
  • Whitefield, NH
  • Sarasota, FL
  • Bruni, TX
  • Granger, TX
  • 8405 Laughing Water Ln, Round Rock, TX 78681 (512) 586-1076

Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Resumes

Resumes

Scott Quarmby Photo 1

Director, Research Gc-Ms At Thermo Fisher Scientific

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Position:
Director, Research GC GC-MS at Thermo Fisher Scientific
Location:
Austin, Texas Area
Industry:
Research
Work:
Thermo Fisher Scientific since Jun 2008
Director, Research GC GC-MS
Thermo Fisher Scientific May 1997 - Jun 2008
Senior Scientist GC-MS
University of Florida Aug 1993 - May 1997
Research Assistant
Thermo Fisher Scientific Jun 1995 - Oct 1995
Summer Intern
Thermo Fisher Scientific Jun 1994 - Aug 1994
Summer Intern
Education:
University of Florida 1993 - 1997
Ph.D., Analytical Chemistry University of Florida 1988 - 1993
BSEE, Semiconductor design and fabrication
Skills:
Mass Spectrometry
GC-MS
Interests:
Woodworking
Scott Quarmby Photo 2

Scott Quarmby

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Publications

Us Patents

Detector With Increased Dynamic Range

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US Patent:
7238936, Jul 3, 2007
Filed:
Dec 23, 2004
Appl. No.:
11/020744
Inventors:
Mark M. Okamura - Austin TX, US
Michael W. Senko - Sunnyvale CA, US
Scott T. Quarmby - Round Rock TX, US
Jae C. Schwartz - San Jose CA, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
H01J 49/40
US Classification:
250284, 250288, 250286
Abstract:
A detector assembly has a current measuring device with a saturation threshold level, and a gain variation means. A signal is generated in response to the particles detected, a first data point corresponding to a peak of interest is acquired from the signal. If the first data point is near, at or above the saturation threshold level of the current measuring device, the gain of the gain variation means is adjusted such that the peak of interest in the signal is reduced in intensity.

Pulsed Ion Source For Quadrupole Mass Spectrometer And Method

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US Patent:
7323682, Jan 29, 2008
Filed:
Mar 15, 2005
Appl. No.:
11/081339
Inventors:
Edward B. McCauley - Cedar Park TX, US
Scott T. Quarmby - Round Rock TX, US
George B. Guckenberger - Austin TX, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
H01J 49/00
US Classification:
250287, 250286, 250288, 250292, 250396 R
Abstract:
A variable duty cycle ion source assembly is coupled to a continuous beam mass spectrometer. The duty cycle can be adjusted based on previous scan data or real time sampling of ion intensities during mass analysis. This provides the ability to control the total number of ions formed, mass analyzed and detected for each ion mass of interest. The frequency of the ion source can be sufficiently high (kHz range) so as to maintain accurate peak centroiding. The ion source assembly can be used for both electron ionization (EI) or chemical ionization (CI) modes of operation.

Isolating Ions In Quadrupole Ion Traps For Mass Spectrometry

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US Patent:
7456396, Nov 25, 2008
Filed:
Aug 19, 2004
Appl. No.:
10/922809
Inventors:
Scott T. Quarmby - Round Rock TX, US
Jae C. Schwartz - San Jose CA, US
John E. P. Syka - Charlottesville VA, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
H01J 49/42
US Classification:
250292, 250282, 250288
Abstract:
Ions in a predefined narrow mass to charge ratio range are isolated in an ion trap by adjusting the field and using ejection frequency waveform(s). Thus the mass-to-charge ratio isolation window is controlled and has an improved resolution without increasing the number of frequency components.

Efficient Detection For Ion Traps

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US Patent:
7456398, Nov 25, 2008
Filed:
May 5, 2006
Appl. No.:
11/429184
Inventors:
Michael W. Senko - Sunnyvale CA, US
Scott T. Quarmby - Round Rock TX, US
George B. Guckenberger - Austin TX, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
B01D 59/44
US Classification:
250292, 250281, 250282
Abstract:
An apparatus and method are disclosed for efficient detection of ions ejected from a quadrupolar ion trap, in which the ions are ejected as first and second groups of ions having different directions. The first and second groups of ions are received by a conversion dynode structure, which responsively emits secondary particles that are directed to a shared detector, such as an electron multiplier. The conversion dynode structure may be implemented as a common dynode or as two dynodes (or sets of dynodes), with each dynode positioned to receive one of the groups of ions.

Pulsed Ion Source For Quadrupole Mass Spectrometer Method

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US Patent:
7507954, Mar 24, 2009
Filed:
Nov 13, 2007
Appl. No.:
11/939460
Inventors:
Edward B. McCauley - Cedar Park TX, US
Scott T. Quarmby - Round Rock TX, US
George B. Guckenberger - Austin TX, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
H01J 49/00
US Classification:
250288, 250281, 250282, 250291, 250292
Abstract:
A variable duty cycle ion source assembly is coupled to a continuous beam mass spectrometer. The duty cycle can be adjusted based on previous scan data or real time sampling of ion intensities during mass analysis. This provides the ability to control the total number of ions formed, mass analyzed and detected for each ion mass of interest. The frequency of the ion source can be sufficiently high (kHz range) so as to maintain accurate peak centroiding. The ion source assembly can be used for both electron ionization (EI) or chemical ionization (CI) modes of operation.

Method And Apparatus For Normalizing Performance Of An Electron Source

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US Patent:
7622713, Nov 24, 2009
Filed:
Feb 5, 2008
Appl. No.:
12/026489
Inventors:
Scott T. Quarmby - Round Rock TX, US
George B. Guckenberger - Austin TX, US
Edward B. McCauley - Cedar Park TX, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
H01J 49/10
H01J 49/16
H01J 49/00
US Classification:
250288, 250286, 250281, 250282, 250423 R, 250427, 250396 R, 31511181
Abstract:
A method for operating a mass spectrometer includes determining a first performance characteristic while operating the mass spectrometer with a first electron emitter, storing first information relating to the first performance characteristic, determining a second performance characteristic while operating the mass spectrometer with a second electron emitter, storing second information relating to the second performance characteristic, and thereafter switching from operation using the first electron emitter to operation using the second electron emitter. The switching includes using the first and second information to normalize performance of the second electron emitter after the switching relative to performance of the first electron emitter before the switching.

Method And Apparatus For Scaling Intensity Data In A Mass Spectrometer

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US Patent:
7638763, Dec 29, 2009
Filed:
May 4, 2007
Appl. No.:
11/800150
Inventors:
George B. Guckenberger - Austin TX, US
Scott T. Quarmby - Round Rock TX, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
H01J 49/00
US Classification:
250282, 250281, 250286, 250287, 250288, 436173, 702 22, 702 23, 702 27, 702 28
Abstract:
A method includes: accumulating ions having a plurality of m/z values in an ion trap during a time interval; deriving from the accumulated ions a respective intensity value for each of the m/z values; and adjusting each of the intensity values as a function of the time needed by the ion trap to begin collecting ions with the corresponding m/z value. According to a different aspect, an apparatus includes a first portion with an ion trap, and a second portion. The second portion causes the ion trap to accumulate ions with a plurality of m/z values during a time interval, derives from the accumulated ions in the ion trap a respective intensity value for each of the m/z values, and adjusts each of the intensity values as a function of the time needed by the ion trap to begin collecting ions with the corresponding m/z value.

Differential-Pressure Dual Ion Trap Mass Analyzer And Methods Of Use Thereof

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US Patent:
7692142, Apr 6, 2010
Filed:
Dec 13, 2006
Appl. No.:
11/639273
Inventors:
Jae C. Schwartz - San Jose CA, US
John E. P. Syka - Charlottesville VA, US
Scott T. Quarmby - Round Rock TX, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
B01D 59/44
H01J 49/00
US Classification:
250290, 250281, 250282, 250287, 250288, 250283, 250292, 250294
Abstract:
A dual ion trap mass analyzer includes adjacently positioned first and second two-dimensional ion traps respectively maintained at relatively high and low pressures. Functions favoring high pressure (cooling and fragmentation) may be performed in the first trap, and functions favoring low pressure (isolation and analytical scanning) may be performed in the second trap. Ions may be transferred between the first and second trap through a plate lens having a small aperture that presents a pumping restriction and allows different pressures to be maintained in the two traps. The differential-pressure environment of the dual ion trap mass analyzer facilitates the use of high-resolution analytical scan modes without sacrificing ion capture and fragmentation efficiencies.
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Scott T Quarmby from Round Rock, TX, age ~54 Get Report