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Sameer K Talsania

from Chicago, IL
Age ~51
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Also known as:
Sameer Kirti Talsania, Sameer J Talsania, Sammeer K Talsania, Alsaina T Sameer
Phone and address:
834 W Buckingham Pl APT 1W, Chicago, IL 60657
Related to:
Nimisha Patel, 63Mrudulaben Patel, 71Roopal Amin, 53
Connected to:
Hasmukh R Talsania, 77Pooja J Talsania, 37Siddharth J Talsania, 43Joyce B Talsky, 95Mary A Talsky, 65Brian W Talsma, 67Glen A Talsma, 74James A Talsma, 64John R Talsma, 82Karen E Talsma, 63

Sameer Talsania Phones & Addresses

  • 834 W Buckingham Pl APT 1W, Chicago, IL 60657
  • 1351 N Leavitt St #2, Chicago, IL 60622
  • 202 1St St, Evansville, IN 47713
  • 1373 Crescent Ct, Evansville, IN 47720 (812) 423-5475
  • 1201 Savannah Ave, Pittsburgh, PA 15218 (412) 247-4980
  • 5435 Claybourne St, Pittsburgh, PA 15232 (412) 802-6906
  • Houston, TX
  • 1201 Savannah Ave, Pittsburgh, PA 15218 (412) 523-2387

Work

Position: Executive, Administrative, and Managerial Occupations

Resumes

Resumes

Sameer Talsania Photo 1

Senior Manager, External Innovation - Alliance Management

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Location:
Chicago, IL
Industry:
Food Production
Work:
PepsiCo - Chicago, IL since 2012
R&D Principal Engineer
PepsiCo - Barrington, IL 2010 - 2012
Principal Packaging Engineer
Wm. WRIGLEY Jr. Company - Chicago, IL 2007 - 2010
Sr. Materials Scientist
GE - Plastics - Mt. Vernon, IN 2005 - 2007
Lead Process Development Engineer
PPG Industries - Pittsburgh, PA 1999 - 2004
Research Project Manager
Education:
University of Houston 1993 - 1997
PhD, Chemical Engineering University of Illinois at Urbana-Champaign 1990 - 1993
BS, Chemical Engineering Downers Grove South HS 1986 - 1990
Skills:
R&D
Polymers
Product Development
Six Sigma
Manufacturing
Plastics
Design of Experiments
Process Simulation
Strategy
Commercialization
Chemical Engineering
Materials Science
Lean Manufacturing
Project Management
Continuous Improvement
Materials
Research and Development
Coatings
Process Engineering
Packaging
Extrusion
Food Packaging
Consumer Products
Packaging Engineering
Consumer Package Goods
Technology Scouting
Rheology
Injection Molding
Leadership
Packaging Design
Research Project Management
Lean Six Sigma
Triz
Program Management
Open Innovation
Fast Moving Consumer Goods
Sustainability
Strategic Partnerships
Interests:
Children
Education
Environment
Films
Poverty Alleviation
Music
Sports
Disaster and Humanitarian Relief
Nature
Travel
Animal Welfare
Health
Languages:
Spanish
Gujarati
Certifications:
Lean Six Sigma - Green Belt
Triz - Level 2
Dale Carnegie Course
Sameer Talsania Photo 2

Sameer Talsania

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Publications

Us Patents

Integrated Inspection System And Defect Correction Method

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US Patent:
7371590, May 13, 2008
Filed:
Nov 21, 2005
Appl. No.:
11/285331
Inventors:
Kevin Patrick Capaldo - Mount Vernon IN, US
Mark Allen Cheverton - Mechanicville NY, US
Dennis Joseph Coyle - Clifton Park NY, US
Michael John Davis - Mount Vernon IN, US
Sameer Kirti Talsania - Evansville IN, US
Masako Yamada - Niskayuna NY, US
Chung-hei Yeung - Evansville IN, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
H01L 21/66
US Classification:
438 14
Abstract:
A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.

Methods For Improving Mold Quality For Use In The Manufacture Of Liquid Crystal Display Components

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US Patent:
20070114693, May 24, 2007
Filed:
Nov 21, 2005
Appl. No.:
11/285137
Inventors:
Paul Buckley - Scotia NY, US
Kevin Capaldo - Mount Vernon IN, US
Jamuna Chakravarti - Evansville IN, US
Mark Cheverton - Mechanicville NY, US
David Clinnin - Newburgh IN, US
Michael Davis - Mount Vernon IN, US
Robert Little - Mount Vernon IN, US
Vijay Paruchuru - Latham NY, US
Micah Sze - Albany NY, US
Sameer Talsania - Evansville IN, US
Vicki Watkins - Alplaus NY, US
Masako Yamada - Niskayuna NY, US
Jana York - Mount Vernon IN, US
Kenneth Zarnoch - Scotia NY, US
International Classification:
B29C 73/00
B29C 45/76
US Classification:
264040100, 425173000, 264036100
Abstract:
Disclosed herein is a method comprising inspecting a mold for a defect; determining a type of defect present on the mold; sorting the mold by type of defect present; treating the mold with a cleaning process that is suitable to remove the defect; and pressing the mold against a polymeric film to produce a series of defect free light management films; wherein the yield of light management films manufactured from the mold is higher than the yield of light management films that are produced from a comparative mold that has not been treated with the cleaning process.

Container And Preform With Neck Finish

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US Patent:
20170121047, May 4, 2017
Filed:
Oct 27, 2016
Appl. No.:
15/336401
Inventors:
- Purchase NY, US
Sameer Kirti TALSANIA - Chicago IL, US
Jean-Claude BAUMGARTNER - Cheyres, CH
Eric Jay BRUNELLA - Sylvania OH, US
Thierry Jean Robert FABOZZI - Geneva, CH
Tucker H. FORT - New York NY, US
Dana Marie LASHAWAY - Les Evouettes, CH
Wayne Allen POSEY - Toledo OH, US
International Classification:
B65D 1/02
B29C 49/00
B29C 49/42
B65D 85/72
Abstract:
A container is provided with a cylindrical sidewall. A top flange projects from the cylindrical sidewall in a first direction by a first distance. A bottom flange projects from the sidewall in the first direction by a second distance that is less than the first distance. The top flange and the bottom flange extend circumferentially around the sidewall. A gap is formed between the top flange and the bottom flange.
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Sameer K Talsania from Chicago, IL, age ~51 Get Report