Search

Rudolf J Schick

from Forest Park, IL
Age ~61
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Also known as:
Rudolf S Schick, Rj Schick, Rudolph J Schick, Rudi Schick, Rudolf Chick
Phone and address:
7239 Franklin St, Forest Park, IL 60130
(708) 488-0017
Related to:
Gladys SchickMonika R Schick, 58
Connected to:
Alice F Schick, 82Alissa A Schick, 44Ann F Schick, 74Anthony Schick, 57April A Schick, 58Betty C Schick, 79Bob D Schick, 55Bonnie C Schick, 67Christopher Schick, 56Coleen M Schick, 67

Rudolf Schick Phones & Addresses

  • 7239 Franklin St, Forest Park, IL 60130 (708) 488-0017 (708) 488-0018 (708) 848-7123
  • Westmont, IL
  • River Forest, IL
  • Oak Park, IL
  • Lemon Grove, CA
  • Lombard, IL
  • Elmhurst, IL
  • Bloomingdale, IL
  • Clarendon Hills, IL
  • 7239 Franklin St, Forest Park, IL 60130 (708) 214-3567

Work

Company: Xerox Position: Im manager central region

Education

Degree: Bachelor's degree or higher

Industries

Information Technology and Services

Resumes

Resumes

Rudolf Schick Photo 1

Im Manager Central Region Bei Xerox

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Position:
IM Manager Central Region at Xerox
Location:
Huntington und Umgebung, West Virginia
Industry:
Information Technology and Services
Work:
Xerox Derzeit in dieser Position
IM Manager Central Region

Publications

Us Patents

Spray Nozzle Configuration And Modeling System

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US Patent:
8170849, May 1, 2012
Filed:
Nov 12, 2008
Appl. No.:
12/269820
Inventors:
Rudolf J. Schick - Forest Park IL, US
Keith L. Cronce - Lockport IL, US
Wojciech Kalata - Wood Dale IL, US
Assignee:
Spraying Systems Co. - Wheaton IL
International Classification:
G06F 9/455
US Classification:
703 6, 239726
Abstract:
A spray injection analysis and nozzle configuration system is described having a user input unit that collects spray system input parameters and relays the collected parameters to a fluid performance matching unit and/or problem geometry unit for subsequent processing. The user inputs basic system parameters, including the desired spray fluid characteristics, to obtain suggested system configuration, including spray nozzle types and quantities. Accuracy of suggested spray nozzle type and configuration is increased via approximating the viscosity and/or surface tension parameters of the desired spray fluid with that of collected performance data. When a user already knows the desired spray nozzle type and associated system parameters, the user input unit routes this information to the problem geometry unit for creation of a problem geometry file, including calculation of the drop size distribution and spray velocity, and performance modeling via the fluid modeling unit.

Spray Nozzle Configuration And Modeling System

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US Patent:
20100121620, May 13, 2010
Filed:
Oct 2, 2009
Appl. No.:
12/572967
Inventors:
Rudolf J. Schick - Forest Park IL, US
Keith L. Cronce - Lockport IL, US
Wojciech Kalata - Wood Dale IL, US
Assignee:
Spraying Systems Co. - Wheaton IL
International Classification:
G06F 17/10
G06G 7/50
US Classification:
703 2, 703 9
Abstract:
A spray injection analysis and nozzle configuration system is described having a user input unit that collects spray system input parameters and relays the collected parameters to a fluid performance matching unit and/or problem geometry unit for subsequent processing. The user inputs basic system parameters, including the desired spray fluid characteristics, to obtain suggested system configuration, including spray nozzle types and quantities. Accuracy of suggested spray nozzle type and configuration is increased via approximating the viscosity and/or surface tension parameters of the desired spray fluid with that of collected performance data. When a user already knows the desired spray nozzle type and associated system parameters, the user input unit routes this information to the problem geometry unit for creation of a problem geometry file, including calculation of the drop size distribution and spray velocity, and performance modeling via the fluid modeling unit.

Tank Wash System

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US Patent:
20110246162, Oct 6, 2011
Filed:
Mar 30, 2011
Appl. No.:
13/075743
Inventors:
Kathleen Brown - Wheaton IL, US
Rudolf J. Schick - Forest Park IL, US
Wojciech Kalata - Wood Dale IL, US
Assignee:
SPRAYING SYSTEMS CO. - Wheaton IL
International Classification:
G06G 7/48
US Classification:
703 9
Abstract:
A tank wash visualization method for planning a tank wash cycle with respect to a tank includes creating a CFD model of the tank system, applying a plurality of parameters to the model, validating the CFD model, including alternate geometries in the model, and based on the model, determining the minimum time needed to successfully clean all parts of the tank.

Network-Based Spray Application Monitoring And Management

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US Patent:
20220326687, Oct 13, 2022
Filed:
Apr 1, 2022
Appl. No.:
17/711360
Inventors:
- Wheaton IL, US
Rudolf J. Schick - Forest Park IL, US
International Classification:
G05B 19/4155
H04N 7/18
H04N 5/225
G06T 5/00
G06T 3/40
Abstract:
A networked spray application management arrangement is described herein. The spray application management arrangement includes a spray scan data server and a spray application. The spray scan application, in turn, includes: a spray nozzle monitoring apparatus that renders a process variable data indicative of a current status of a spray nozzle system; and a first network interface that sends a message comprising a data payload comprising information corresponding to the process variable data to the spray scan data server. The spray scan data server includes: a second network interface for receiving the message; a spray scan database for storing the information corresponding to the process variable data; and a spray scan data analysis engine.

Optical Spray Pattern Imaging Apparatus Including Permanently Integrated Light Plane And Image Capture Components

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US Patent:
20230051971, Feb 16, 2023
Filed:
Oct 26, 2022
Appl. No.:
17/974139
Inventors:
- Wheaton IL, US
Rudolf J. Schick - Forest Park IL, US
Philip A. MCDONOUGH - Chicago IL, US
International Classification:
H05K 13/08
G03B 17/56
H04N 5/225
G02B 27/64
Abstract:
A pre-calibrated spray plane image acquisition device is described that includes, in a single fixed-form structure, both an image capture component configured to acquire an optical image of a field of view and a light plane generator configured to generate a planar light plane emitted from the pre-calibrated spray plane image acquisition device. A carrier frame structure includes rigid components for permanently maintaining the image capture component and the light plane generator in respective positions defining a permanent spatial relationship between the field of view of the image capture component and the light plane generated by the light plane generator.

Machine Learning-Based Particle-Laden Flow Field Characterization

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US Patent:
20210148802, May 20, 2021
Filed:
Nov 17, 2020
Appl. No.:
16/950011
Inventors:
- Wheaton IL, US
Rudolf J. Schick - Forest Park IL, US
International Classification:
G01N 15/02
G06N 3/04
G06N 3/08
Abstract:
A particle measurement system and method of operation thereof are described. The system and method render a characteristic for a set of particles measured while passing through a measurement volume. The system includes a source that generates a particle-laden field containing the set of particles. The system further includes a sensor that generates a raw particle data corresponding to the set particles passing through the measurement volume of the particle measurement system, where the raw particle data comprises a set of raw particle records and each of one of the raw particle records includes a particle data content. A preconditioning stage carries out a preconditioning operation on the particle data content of the set of raw particle records to render a conditioned input data. A machine learning stage processes the conditioned input data to render an output characteristic parameter value for the set of particles.

Optical Spray Pattern Imaging Apparatus For Generating Images Including Density Image Features

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US Patent:
20200349383, Nov 5, 2020
Filed:
May 1, 2020
Appl. No.:
16/864969
Inventors:
- Wheaton IL, US
Rudolf J. Schick - Forest Park IL, US
International Classification:
G06K 9/46
G03B 15/02
G03B 17/56
G06K 9/20
G06T 5/00
G06T 3/40
H04N 5/225
G06T 7/80
B05B 12/00
Abstract:
A spray pattern imaging apparatus, and method of operation, is described herein. The method is carried out by the spray pattern imaging apparatus that includes a frame having a set of known aspects corresponding to a first dimension and a second dimension within a first plane. The spray pattern imaging apparatus also includes a light source generating a planar light pattern within a substantially same plane as the first plane of the frame. The set of known aspects facilitate both correcting an image distortion and a scaling of a spray pattern image generated by an image acquisition device during a spray application by a nozzle positioned in a physical relationship with the planar light pattern such that spray particles emitted from the spray nozzle pass through the planar light pattern while an initial image is acquired by the image acquisition device.

System For Determining An Ensemble Characteristic Of A Particle-Laden Flow

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US Patent:
20190383716, Dec 19, 2019
Filed:
Jun 14, 2019
Appl. No.:
16/442067
Inventors:
- Wheaton IL, US
Rudolf J. Schick - Forest Park IL, US
Kyle M. Bade - Rockford MI, US
International Classification:
G01N 15/02
Abstract:
A system and method are described for rendering a characteristic for a set of particles passing through a measurement volume of a particle optical measurement system. The method includes acquiring raw particle data for the particles passing through the measurement volume. The raw particle data comprises a set of raw particle records. Each particle record comprises at least: a trajectory of at least one particle, and a second primary mark of the at least one particle whose value influences an effective sampling area corresponding to the measurement volume. The method includes generating and storing an effective sampling area based upon: the trajectory of the at least one particle, and the second primary mark. Thereafter, an ensemble characteristic is rendered for the set of particles by performing an operation on the sampling area-corrected set of particle records.
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Rudolf J Schick from Forest Park, IL, age ~61 Get Report