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Ronald E Press

from West Linn, OR
Age ~59

Ronald Press Phones & Addresses

  • West Linn, OR
  • Elgin, OR
  • Natick, MA
  • Wilsonville, OR
  • Tualatin, OR
  • Jersey City, NJ
  • Clackamas, OR
  • Los Angeles, CA

Professional Records

Medicine Doctors

Ronald Press Photo 1

Ronald I. Press

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Specialties:
Family Medicine
Work:
Unity Medical Clinic
421 Saint Michaels Dr, Santa Fe, NM 87505
(505) 992-3334 (phone), (505) 992-1998 (fax)
Education:
Medical School
Kasturba Med Coll Manipal, Manipal Acad Higher Ed, Manipal, Karnataka
Graduated: 1980
Procedures:
Arthrocentesis
Circumcision
Destruction of Benign/Premalignant Skin Lesions
Electrocardiogram (EKG or ECG)
Psychological and Neuropsychological Tests
Skin Tags Removal
Vaccine Administration
Conditions:
Acute Bronchitis
Acute Pharyngitis
Acute Sinusitis
Anemia
Constipation
Languages:
English
Spanish
Description:
Dr. Press graduated from the Kasturba Med Coll Manipal, Manipal Acad Higher Ed, Manipal, Karnataka in 1980. He works in Santa Fe, NM and specializes in Family Medicine. Dr. Press is affiliated with Christus St Vincent Regional Medical Center.

Resumes

Resumes

Ronald Press Photo 2

Ronald Press

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Ronald Press Photo 3

Ronald Press

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Location:
Portland, Oregon Area
Industry:
Computer Software

Publications

Us Patents

Reduced-Pin-Count-Testing Architectures For Applying Test Patterns

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US Patent:
7487419, Feb 3, 2009
Filed:
Dec 16, 2005
Appl. No.:
11/305849
Inventors:
Nilanjan Mukherjee - Wilsonville OR, US
Jay Jahangiri - Portland OR, US
Ronald Press - Tualatin OR, US
International Classification:
G01R 31/28
US Classification:
714729, 714726, 714727, 714 25, 714 30, 714718, 714724, 714732, 714738, 714739, 714741
Abstract:
Methods, apparatus, and systems for testing integrated circuits using one or more boundary scan cells are disclosed. The methods, apparatus, and systems can be used, for example, to apply at-speed test patterns through one or more boundary scan cells. For instance, in one exemplary nonlimiting embodiment, a circuit is disclosed comprising one or more boundary scan cells coupled to primary input ports or primary output ports of a circuit-under-test. The circuit further includes a boundary scan cell controller configured to apply test control signals to the one or more boundary scan cells. In this embodiment, the controller is configured to operate in a mode of operation whereby the controller applies test control signals to the one or more boundary scan cells that correspond to test control signals used to control one or more internal scan chains of the circuit-under-test during testing. The control signals of this exemplary embodiment include an at-speed-clock signal generated outside of the boundary scan cell controller.

Circuit For Switching Between Multiple Clocks

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US Patent:
6452426, Sep 17, 2002
Filed:
Apr 16, 2001
Appl. No.:
09/836700
Inventors:
Nagesh Tamarapalli - Wilsonville OR, 97070
Ronald Press - Tualatin OR, 97062
International Classification:
H03K 1700
US Classification:
327 99, 327166, 327176, 327199, 327294, 327298
Abstract:
A circuit to synchronously select one of the multiple clocks is presented. In one embodiment the selection circuit consists of four main blocks. These are the stable selects block, the decoder block, the synchronous selects block, and the output block. The stable selects block takes select signals as inputs and outputs a signal indicating whether the selects are stable or not, in addition to producing select signals that are synchronous to the current selected clock. The decoder block, decodes the select signals if they are stable, otherwise it re-circulates the previous values of the decoded clock select signals. The stable decoded select signals are then passed on to the synchronous selects block. This block outputs select signals in synchrony with their respective clocks. The synchronous select signals along with the stable decoded signals are used in the output block along with the clocks themselves to generate the final output clock.
Ronald E Press from West Linn, OR, age ~59 Get Report