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Ranko K Galeb

from Burlington, MA
Age ~70
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Also known as:
Galeb Ranko
Phone and address:
260 Winn St APT C, Burlington, MA 01803
Related to:
Christopher David Floyd, 41Nancy L Crawford, 68
Connected to:
Saleh M Galeb, 73Casey R Galebach, 46Stephen H Galebach, 72Vivian J Galebach, 65Patrycja GaleckaLuanne Galecke, 61Gregg A Galecki, 64Jan Galecki, 96Larry P Galecki, 60Alfred N Galedrige, 69

Ranko Galeb Phones & Addresses

  • 260 Winn St APT C, Burlington, MA 01803
  • South Boston, MA
  • Billerica, MA
  • 1052 Hagen Dr, Trinity, FL 34655 (727) 372-3213
  • 50 Ridgecrest Dr, Batesville, AR 72501 (870) 793-4124
  • 260 Winn St APT C, Burlington, MA 01803 (727) 372-3213

Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Public records

Vehicle Records

Ranko Galeb

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Address:
260 Winn St APT C, Burlington, MA 01803
Phone:
(727) 372-3213
VIN:
3N1AB6AP8AL661439
Make:
NISSAN
Model:
SENTRA
Year:
2010

Resumes

Resumes

Ranko Galeb Photo 1

Owner

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Location:
260 Winn St, Burlington, MA 01803
Industry:
Computer Software
Work:
VLOC
Coating Engineer
Education:
Dyson School of Design Engineering 1985 - 1986
Masters Imperial College
Masters
Skills:
R&D
Manufacturing
Lean Manufacturing
Product Development
Optics
Engineering
Process Engineering
Engineering Management
Design of Experiments
Thin Films
Semiconductors
Electronics
Metrology
Continuous Improvement
Sensors
Interests:
Photograph
Cooking
Exercise
Investing
Electronics
Home Improvement
Reading
Music
Sports
Automobiles
Travel
Movies
Collecting
Home Decoration
Ranko Galeb Photo 2

Principal Optical Engineer

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Location:
Boston, MA
Work:

Principal Optical Engineer

Publications

Isbn (Books And Publications)

Optical System Design

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Author

Ranko Galeb

ISBN #

0071472487

Us Patents

Dielectric-Enhanced Metal Coatings For Mems Tunable Filters

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US Patent:
20150043002, Feb 12, 2015
Filed:
Aug 12, 2013
Appl. No.:
13/964169
Inventors:
- Billerica MA, US
Ranko Galeb - Burlington MA, US
International Classification:
G02B 5/28
H01S 5/06
G01J 3/28
G01B 9/02
US Classification:
356479, 359578, 372 99, 372 20, 356402, 228176
Abstract:
The present invention concerns the use of hybrid metal-dielectric optical coatings as the end reflectors of laser cavities and/or in the mirror structures used in other optical resonators, such as Fabry-Perot tunable filters, along with the use of such Fabry-Perot tunable filters in wavelength swept sources such as lasers. Hybrid metal-dielectric optical coatings have reflectivity spectra that can be broader than pure dielectric coatings, offer optical reflectivities higher than metal, as high as pure dielectric coatings, eliminate mirror transmission that can cause parasitic light reflections, and use fewer layers and thus have lower mass and higher mechanical resonant frequency for movable mirror applications An important characteristic of these coatings concerns the non-reflected light. Pure dielectric coatings offer high reflectivity, while the non-reflected portion of the light is transmitted by the coating to the substrate, for example. When metal is added to the optical coating, the non-reflected portion of the light is absorbed by the metal and is not transmitted to the substrate or outside the cavity. Hybrid metal-dielectric coatings have broader and more uniform spectral reflection. Tunable lasers with performance enhanced by the hybrid metal-dielectric coatings can be used in optical coherence tomography and spectroscopic analysis applications.

Control Module For Deposition Of Optical Thin Films

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US Patent:
20140135972, May 15, 2014
Filed:
Jul 30, 2013
Appl. No.:
13/954859
Inventors:
Ranko Galeb - Burlington MA, US
International Classification:
B05C 11/10
G05B 19/418
US Classification:
700157
Abstract:
The deposition controller controls a coating machine used in the deposition of the thin film coatings. The deposition controller is particularly useful for the deposition of multiple layers or co-deposition of multiple materials. The integrated system is a single hardware unit controlled by the software residing on the local computer. The single unit combines the functionality of a deposition controller, mass flow controller, quartz crystal controller, optical monitor chip change controller, and an optical monitor signal analyzer. The integrated system utilizes a Programmable Logic Controller (PLC) for the purpose of controlling the deposition process. A run sheet file is used by the system to create a set of process parameters. The system also examines a run sheet file at the time of its opening for its integrity with respect to the minimum layer optical thickness requirement expressed in terms of QWOT (quarter wave optical thickness). The controller utilizes an optimized polynomial regression function technique for the accurate layer termination while monitoring the reflection or transmission function and calculating its first and second derivatives to eliminate false termination points.
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Ranko K Galeb from Burlington, MA, age ~70 Get Report