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Rajeev Tiwari

from San Jose, CA
Age ~49
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Also known as:
Rajeev Tiwan
Phone and address:
1738 Silverwood Dr, San Jose, CA 95124
Related to:
Sheela Sharma, 80Ashish Tiwari, 47Kamini Tiwari, 47
Connected to:
Abhinav Tiwari, 42Anil Tiwari, 45Ankur Tiwari, 42Anubhuti Tiwari, 45Anuraag Tiwari, 45Ashwini Tiwari, 38Bulbul P Tiwari, 47Deepali Tiwari, 38Dipika Tiwari, 53Easha Tiwari, 35

Rajeev Tiwari Phones & Addresses

  • 1738 Silverwood Dr, San Jose, CA 95124
  • 3507 Palmilla Dr, San Jose, CA 95134 (408) 432-6148
  • Santa Clara, CA
  • 512 Rampart Blvd, Los Angeles, CA 90057 (213) 570-1220
  • San Diego, CA
  • Wheeling, IL
  • Chicago, IL

Publications

Us Patents

Systems And Methods For Testing Electronic Devices Using Master-Slave Test Architectures

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US Patent:
20200358690, Nov 12, 2020
Filed:
Jul 17, 2020
Appl. No.:
16/932396
Inventors:
- Schenectady NY, US
Rajeev Tiwari - San Jose CA, US
Jin Ryu - San Jose CA, US
International Classification:
H04L 12/26
H04L 12/28
H04L 12/403
Abstract:
A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).

Systems And Methods For Testing Electronic Devics Using Master-Slave Test Architectures

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US Patent:
20190230022, Jul 25, 2019
Filed:
Mar 29, 2019
Appl. No.:
16/369607
Inventors:
- Schenectady NY, US
Rajeev Tiwari - San Jose CA, US
Jin Ryu - San Jose CA, US
International Classification:
H04L 12/26
H04L 12/403
H04L 12/28
Abstract:
A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).

Method Of Power Signal Detection For Set Top Box Devices

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US Patent:
20180152661, May 31, 2018
Filed:
Jan 26, 2018
Appl. No.:
15/881333
Inventors:
- Schenectady NY, US
Rajeev Tiwari - Sunnyvale CA, US
International Classification:
H04N 5/63
H04N 17/00
H04N 21/443
Abstract:
A method of power signal detection of set top boxes under test is disclosed. According to certain embodiments, detection of a failure mode of a set top box (STB) under test is based on video signal detection where the video signal is associated with multiple video output types and AC power outlet signal detection.

Systems And Methods For Testing Electronic Devices Using Master-Slave Test Architectures

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US Patent:
20180131594, May 10, 2018
Filed:
Nov 10, 2016
Appl. No.:
15/348950
Inventors:
- Schenectady NY, US
Rajeev Tiwari - San Jose CA, US
Jin Ryu - San Jose CA, US
Assignee:
Contec, LLC - Schenectady NY
International Classification:
H04L 12/26
H04L 12/28
Abstract:
A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).

Systems And Methods For Testing Electronic Devices Using Master-Slave Test Architectures

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US Patent:
20180131596, May 10, 2018
Filed:
Jun 16, 2017
Appl. No.:
15/624971
Inventors:
- Schenectady NY, US
Rajeev Tiwari - San Jose CA, US
Jin Ryu - San Jose CA, US
International Classification:
H04L 12/26
H04L 12/28
Abstract:
A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).

Method Of Power Signal Detection For Set Top Box Devices

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US Patent:
20170353690, Dec 7, 2017
Filed:
Jun 1, 2016
Appl. No.:
15/170775
Inventors:
- Schnectady NY, US
Rajeev Tiwari - Sunnyvale CA, US
International Classification:
H04N 5/63
H04N 17/00
Abstract:
A method of power signal detection of set top boxes under test is disclosed. According to certain embodiments, detection of a failure mode of a set top box (STB) under test is based on video signal detection where the video signal is associated with multiple video output types and AC power outlet signal detection.

Test Sequences Using Universal Testing System

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US Patent:
20170288791, Oct 5, 2017
Filed:
Jun 16, 2017
Appl. No.:
15/624961
Inventors:
- Schenectady NY, US
Dinesh Kumar - Kankarbagh, IN
Ina Huh - Morgan Hill CA, US
Jin Ryu - San Jose CA, US
Rajeev Tiwari - San Jose CA, US
International Classification:
H04B 17/30
Abstract:
A testing system that provides a separate set of virtualization container probes for each of at least a subset of devices that is under testing can perform Wifi Layer 2 and Wifi Layer 3 tests in a manner that minimizes or avoids wireless interference is disclosed.
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Rajeev Tiwari from San Jose, CA, age ~49 Get Report