US Patent:
20040036876, Feb 26, 2004
Inventors:
Scott Davis - Denver CO, US
Radoslaw Uberna - Boulder CO, US
Richard Herke - Antioch CA, US
International Classification:
G01J004/00
Abstract:
In a polarimeter for analyzing a state of polarization of a light beam incident thereon, the polarimeter including first and second variable retarders configured to exhibit first and second retardance values, respectively, variable over an overall retardance range, and a detector arrangement, a method includes the steps of directing the light beam through the first and second variable retarders and sweeping a selected one of the first and second retardance values progressively and unidirectionally through at least a part of the overall retardance range to produce a plurality of retardance values. The method further includes the steps of, for the plurality of retardance values, detecting at the detector arrangement at least a spatial portion of the light beam and extracting the state of polarization based on the spatial portion of the light beam detected at the detector arrangement corresponding to the plurality of retardance values.