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Quoc Ly Phones & Addresses

  • Milpitas, CA
  • San Jose, CA
  • Tucson, AZ
  • Union City, CA

Resumes

Resumes

Quoc Ly Photo 1

Embedded Systems Software Engineer

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Location:
2469 Klein Rd, San Jose, CA 95148
Industry:
Wireless
Work:
Knowles Intelligent Audio
Embedded Systems Software Engineer

Sensor Platforms Jun 2014 - Aug 2014
Principal Software Engineer

Assia, Inc. Jun 2011 - May 2014
Staff Engineer

Arraycomm 2000 - 2011
Software Engineer

Park Scientific Instruments 1989 - 1990
Engineer
Education:
University of Technology Sydney 1983 - 1987
Bachelor of Applied Science, Bachelors, Applied Physics
Skills:
Digital Signal Processors
Wimax
Wireless
Matlab
Systems Engineering
Embedded Systems
Rf
Signal Processing
Gsm
System Architecture
Ofdm
Mimo
Languages:
English
Quoc Ly Photo 2

Assembly Technician

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Location:
San Jose, CA
Work:
Ssl
Assembly Technician
Quoc Ly Photo 3

Quoc Ly

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Quoc Ly Photo 4

Quoc Ly

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Quoc Ly Photo 5

Quoc Ly

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Publications

Us Patents

Scanning Probe Microscope Providing Unobstructed Top Down And Bottom Up Views

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US Patent:
58544879, Dec 29, 1998
Filed:
Feb 28, 1997
Appl. No.:
8/808351
Inventors:
David Braunstein - Campbell CA
Michael Kirk - San Jose CA
Quoc Ly - San Jose CA
Thai Nguyen - Sunnyvale CA
Assignee:
Park Scientific Instruments - Sunnyvale CA
International Classification:
H01J 3726
US Classification:
250306
Abstract:
Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.

Optical Microscope Stage For Scanning Probe Microscope

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US Patent:
63103427, Oct 30, 2001
Filed:
Aug 4, 1998
Appl. No.:
9/128885
Inventors:
David Braunstein - Campbell CA
Michael Kirk - San Jose CA
Quoc Ly - San Jose CA
Thai Nguyen - Sunnyvale CA
Assignee:
ThermoMicroscopes Corporation - Sunnyvale CA
International Classification:
H01J 3720
G02B 2118
G01N 2101
US Classification:
250306
Abstract:
Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.
Quoc N Ly from Milpitas, CA, age ~58 Get Report