Inventors:
Philip B. Pinches - New York NY
Sidney Lieber - Kings Point NY
Assignee:
UPA Technology, Inc. - Syosset NY
International Classification:
G01N 2300
Abstract:
A beta backscatter type of measuring instrument including a workpiece positioning system to permit precise prepositioning of the workpiece surface to be subjected to radiation preparatory to moving the radiation source into operative proximity therewith.