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Peter Scranton Phones & Addresses

  • Lakeport, CA
  • Sinclairville, NY
  • Gerry, NY
  • Saint Helena, CA
  • Los Altos, CA
  • Palo Alto, CA
  • Turlock, CA
  • Jamestown, NY
  • Napa, CA
  • Santa Clara, CA
  • 4460 Lakeshore Blvd, Lakeport, CA 95453 (707) 263-9228

Business Records

Name / Title
Company / Classification
Phones & Addresses
Peter J. Scranton
SCRANTON LAW FIRM, LLC

Publications

Us Patents

Bicycle Drive System

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US Patent:
7434489, Oct 14, 2008
Filed:
Dec 3, 2004
Appl. No.:
11/003890
Inventors:
Peter Scranton - Hayward CA, US
International Classification:
F16H 3/22
US Classification:
74347, 74351, 74352, 74416, 280236, 280238, 280260
Abstract:
A bicycle drive system includes a front gear face, a rear gear face, a front guide assembly, a rear guide assembly, and a drive shaft coupled to a rear-suspension frame via a rear hub and a crank spindle. The bicycle drive system operates independently of the frame. Shifting from one gear to another is controlled by a shift controller. Each shift of the shift controller shifts both the front and rear guide assemblies at the same time. The shift controller is preferably coupled to the front and rear guide assemblies via a cable system.

Devices, Systems And Methods For Testing Optoelectronic Modules

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US Patent:
20060245712, Nov 2, 2006
Filed:
Apr 29, 2005
Appl. No.:
11/117784
Inventors:
Alexander Fishman - Sunnyvale CA, US
Peter Scranton - Hayward CA, US
John Dirkson - Santa Clara CA, US
International Classification:
G02B 6/00
US Classification:
385134000
Abstract:
Embodiments of the present invention provide devices, systems and methods to test optoelectronic modules. In one embodiment, the testing device can include a printed circuit board (PCB) and a first portion attached to the PCB. A second portion can be attached to the first portion. The second portion can include at least one testing device that can be used to test an optoelectronic module disposed between the first portion and the second portion. The optoelectronic module can be electrically and mechanically connected to at least one of the PCB and the first portion. Additionally, in some embodiments, the at least one testing device can be electrically connected to an electrical circuit or host device that is external to the apparatus
Peter Douglas Scranton from Lakeport, CA, age ~89 Get Report