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Patrick J Alladio

from Santa Rosa, CA
Age ~64
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Also known as:
Patrick James Alladio, Pat J Alladio, Patrick J Allandi, Patrick J Aladio, Patrick O, Partick O
Phone and address:
3337 Magowan Dr, Santa Rosa, CA 95405
(707) 526-9221
Related to:
Frank Herring, 90Robert Murphy, 54Jacob Murphy, 28Douglas Murphy, 53
Connected to:
Alfred M Alladin, 49Irfan A Alladin, 53Jerry S Alladin, 69Kem J Alladin, 35Andrew D Allado, 37Jaime K Allado, 55Yawovi K Allado, 39Alieh Allafzadeh, 53Tina U Allagh, 54Almighty R Allah, 47

Patrick Alladio Phones & Addresses

  • 3337 Magowan Dr, Santa Rosa, CA 95405 (707) 526-9221
  • Rohnert Park, CA
  • 3337 Magowan Dr, Santa Rosa, CA 95405 (707) 953-8196

Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Emails

p***[email protected]

Business Records

Name / Title
Company / Classification
Phones & Addresses
Patrick J. Alladio
Tapt Interconnect, LLC
Semiconductor Testing Equipment Design · Business Services at Non-Commercial Site · Nonclassifiable Establishments
3337 Magowan Dr, Santa Rosa, CA 95405

Publications

Us Patents

Electronic Device Test Fixture

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US Patent:
8441275, May 14, 2013
Filed:
Jan 13, 2011
Appl. No.:
13/005707
Inventors:
Patrick J Alladio - Santa Rosa CA, US
Assignee:
Tapt Interconnect, LLC - Santa Rosa CA
International Classification:
G01R 31/00
US Classification:
32475602, 32476202, 32475601, 32476203, 32475704, 439 65, 439 66, 439 67, 439 68, 439 69, 439 70, 439 71, 439 72, 439 73, 439 91, 439525, 439526
Abstract:
An electronic device test fixture deploys a plurality of contact elements in a dielectric housing. The plumb arrangement of contact elements each include an armature or transversal configured to first depress and then slide laterally when urged downward by the external contacts of a device under test. The rotary movement of the transversal is optimized via the configuration of a surrounding forked regulator such that surface oxide deposition on the external device under test terminal is disrupted to reliably minimize contact resistance without damaging or unduly stressing the electrical junction of the device under test.

Electrically Conductive Pins For Microcircuit Tester

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US Patent:
8536889, Sep 17, 2013
Filed:
Mar 10, 2010
Appl. No.:
12/721039
Inventors:
John E. Nelson - Brooklyn Park MN, US
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian Warwick - Ben Lomond CA, US
Gary W. Michalko - Ham Lake MN, US
Assignee:
Johnstech International Corporation - Minneapolis MN
International Classification:
G01R 31/20
G01R 31/00
US Classification:
32475401, 32475501, 32475601
Abstract:
The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.

Contact Insert For A Microcircuit Test Socket

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US Patent:
7994808, Aug 9, 2011
Filed:
Feb 1, 2008
Appl. No.:
12/024622
Inventors:
Patrick J. Alladio - Santa Rosa CA, US
Brian K. Warwick - Ben Lomond CA, US
Assignee:
Johnstech International Corporation - Minneapolis MN
International Classification:
G01R 31/02
US Classification:
32475601, 32475607
Abstract:
A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal to a ground contact on a load board. The insert is held within a housing by compression and frictional interaction between a resilient projection carried by the insert and a slot in a wall of an aperture holding the insert.

Contact Insert For A Microcircuit Test Socket

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US Patent:
20080297142, Dec 4, 2008
Filed:
Jun 26, 2008
Appl. No.:
12/147273
Inventors:
Patrick J. Alladio - Santa Rosa CA, US
Brian K. Warwick - Ben Lomond CA, US
International Classification:
G01R 1/02
US Classification:
3241581
Abstract:
A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal with a ground contact on a load board. The insert is held within a housing having an aperture that includes at least one shelf facing toward the load board. The shelf interacts with a resilient projection on the insert to distort the projection. The projection's resilient distortion generates continual force pressing the insert against the load board. The continual force limits migration of debris created by the testing operations into the interface between the insert and the load board.

Test Contact System For Testing Integrated Circuits With Packages Having An Array Of Signal And Power Contacts

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US Patent:
20090302878, Dec 10, 2009
Filed:
Aug 27, 2008
Appl. No.:
12/199457
Inventors:
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian K. Warwick - Ben Lomond CA, US
International Classification:
G01R 1/073
US Classification:
324762
Abstract:
A test fixture () is disclosed for electrically testing a device under test () by forming a plurality of temporary mechanical and electrical connections between terminals () on the device under test () and contact pads () on the load board (). The test fixture () has a replaceable membrane () that includes vias (), with each via () being associated with a terminal () on the device under test () and a contact pad () on the load board (). In some cases, each via () has an electrically conducting wall for conducting current between the terminal () and the contact pad (). In some cases, each via () includes a spring () that provides a mechanical resisting force to the terminal () when the device under test () is engaged with the test fixture (). In some cases, the spring () is housed within a pair of nested, open-ended tubes () that can slide longitudinally with respect to each other. In some cases, the contact pad () that contacts the terminal () has a textured surface and/or is tilted away from parallel to the load board when the device under test is engaged.

Electrically Conductive Pins For Microcircuit Tester

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US Patent:
20120062261, Mar 15, 2012
Filed:
Sep 7, 2011
Appl. No.:
13/226606
Inventors:
John E. Nelson - Brooklyn Park MN, US
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian Warwick - Ben Lomond CA, US
Gary W. Michalko - Ham Lake MN, US
Assignee:
Johnstech International Corporation - Minneapolis MN
International Classification:
G01R 1/067
G01R 31/00
US Classification:
32475509, 32475601
Abstract:
The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface.

Test Contact System For Testing Integrated Circuits With Packages Having An Array Of Signal And Power Contacts

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US Patent:
20120176151, Jul 12, 2012
Filed:
Jan 23, 2012
Appl. No.:
13/355913
Inventors:
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian K. Warwick - Ben Lomond CA, US
Assignee:
JohnsTech International Corporation - Minneapolis MN
International Classification:
G01R 31/00
US Classification:
32475605
Abstract:
A test fixture () is disclosed for electrically testing a device under test () by forming a plurality of temporary mechanical and electrical connections between terminals () on the device under test () and contact pads () on the load board (). The test fixture () has a replaceable membrane () that includes vias (), with each via () being associated with a terminal () on the device under test () and a contact pad () on the load board (). In some cases, each via () has an electrically conducting wall for conducting current between the terminal () and the contact pad (). In some cases, each via () includes a spring () that provides a mechanical resisting force to the terminal () when the device under test () is engaged with the test fixture ().

Electrically Conductive Pins For Microcircuit Tester

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US Patent:
20130154678, Jun 20, 2013
Filed:
Jun 20, 2012
Appl. No.:
13/527979
Inventors:
John E. Nelson - Brooklyn Park MN, US
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian Warwick - Ben Lomond CA, US
Gary W. Michalko - Ham Lake MN, US
Assignee:
Johnstech International Corporation - Minneapolis MN
International Classification:
G01R 1/04
US Classification:
32475024
Abstract:
The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board including a rocker base protrusion, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
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Patrick J Alladio from Santa Rosa, CA, age ~64 Get Report