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Owen D Altland

from Rochester, NY
Age ~49
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Also known as:
David Altland Owen, Altland Owen, Owen Altland Dutro, Owen D Atland, Owen Altland-Dutro, Leticia Delos, Leticia Los, Owen O
Phone and address:
179 Merwin Ave, Rochester, NY 14609
Related to:
Warner H Dutro, 23Morgan Altland, 32Joanne Altland, 78Henry Altland, 80Stacey L Houghtaling, 50Eric L Houghtaling, 48
Connected to:
Amber N Altland, 41Brian Altland, 32Candy Altland, 64Charles R Altland, 65Karen L Altland, 65Michele Altland, 52Wayne W Altland, 80Katrina R Altmaier, 65Alexis V Altman, 33Andra C Altman, 81

Owen Altland Phones & Addresses

  • 179 Merwin Ave, Rochester, NY 14609
  • Webster, NY
  • Alamo, TX
  • Painted Post, NY

Work

Company: Johnson & johnson Jul 2012 Position: Sr. supply chain project manager of service parts and supply chain

Education

School / High School: Syracuse University- Whitman School of Management Aug 2013 Specialities: MBA in Supply Chain Management

Skills

Project Managment (PMP certified) • Six Sigma Black Belt (Process Excellence)

Industries

Medical Devices

Resumes

Resumes

Owen Altland Photo 1

System Manager

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Location:
Rochester, NY
Industry:
Medical Devices
Work:
Ortho Clinical Diagnostics Jan 2003 - Dec 2018
Lead Service Application Business Analyst
Ortho Clinical Diagnostics Jan 2003 - Dec 2018
System Manager
Rochester Regional Health Jan 1998 - Jan 2003
Clinical Chemist
Education:
Syracuse University - Martin J. Whitman School of Management 2010 - 2013
Master of Business Administration, Masters University of Rochester School of Medicine and Dentistry 2000 - 2003
Master of Science, Masters Rochester Institute of Technology 1993 - 2000
Master of Science, Masters, Bachelors, Bachelor of Science, Chemistry Syracuse University - Martin J. Whitman School of Management
University of Rochester School of Medicine and Dentistry
Skills:
Medical Devices
Cross Functional Team Leadership
Process Improvement
Fda
Project Management
Supply Chain
Six Sigma
Quality System
Validation
Gmp
Hardware Diagnostics
Root Cause Analysis
Iso 13485
Lean Manufacturing
Dmaic
Continuous Improvement
Manufacturing
Quality Assurance
Troubleshooting
Capital Equipment
Clinical Chemistry
Product Development
Testing
Logistics
Supply Chain Management
Forecasting
Pmp
Owen Altland Photo 2

Owen Altland Rochester, NY

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Work:
Johnson & Johnson

Jul 2012 to 2000
Sr. Supply Chain Project Manager of Service Parts and Supply Chain
Johnson & Johnson

Jan 2011 to Jul 2012
Supervisor
Johnson & Johnson

Mar 2009 to Jan 2011
Sr. Service Engineer/Team Lead
Johnson & Johnson

Jan 2006 to Mar 2009
Service Engineer
Johnson & Johnson

Jan 2003 to Jun 2004
Technical Support Specialist II
Johnson & Johnson

Jan 2003 to Jun 2004
Technical Support Specialist I
Rochester General Hospital

1998 to 2003
Medical Technologist
Education:
Syracuse University- Whitman School of Management
Aug 2013
MBA in Supply Chain Management
University of Rochester- School of Medicine
May 2003
MS in Pathology
Rochester Institute of Technology
May 2000
MS in Clinical Chemistry
Skills:
Project Managment (PMP certified), Six Sigma Black Belt (Process Excellence)

Publications

Us Patents

Method For Detecting The Impending Analytical Failure Of Networked Diagnostic Clinical Analyzers

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US Patent:
20120042214, Feb 16, 2012
Filed:
Feb 24, 2010
Appl. No.:
13/203416
Inventors:
Merrit N. Jacobs - Lake Worth FL, US
Christopher Thomas Doody - Shortsville NY, US
Edwin Craig Bashaw - Webster NY, US
Joseph Michael Indovina - Hilton NY, US
Owen Altland - Webster NY, US
Nicholas John Gould - Cedex, FR
International Classification:
G06F 11/30
US Classification:
714 472, 714E11179
Abstract:
A method of detecting impending analytical failure in a networked diagnostic clinical analyzer is based upon detecting whether the operation of a particular analyzer is statistically distinguishable based on one or more thresholds. A failure occurs when one or more components or modules of the analyzer fails. A method to detect such an impending failure is disclosed. Baseline data on a pre-selected set of analyzer variables for a population of diagnostic clinical analyzers is used to generate an impending failure threshold. Subsequently, operational data comprising the same pre-selected set of analyzer variables allows generation of a time series of operational statistics. If the operational statistic exceeds the impeding failure threshold in a prescribed manner, an impending analytical failure is predicted. Such detection of impending analytical failures facilitates intelligent scheduling of service for the analyzer in question to maintain high assay throughput and accuracy.

Method For Detecting The Impending Analytical Failure Of Networked Diagnostic Clinical Analyzers

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US Patent:
20160132375, May 12, 2016
Filed:
Jan 13, 2016
Appl. No.:
14/994791
Inventors:
- Raritan NJ, US
Christopher Thomas Doody - Shortsville NY, US
Edwin Craig Bashaw - Webster NY, US
Joseph Michael Indovina - Hilton NY, US
Owen Altland - Webster NY, US
Nicholas John Gould - Cedex, FR
International Classification:
G06F 11/07
Abstract:
A method of detecting impending analytical failure in a networked diagnostic clinical analyzer is based upon detecting whether the operation of a particular analyzer is statistically distinguishable based on one or more thresholds. A failure occurs when one or more components or modules of the analyzer fails. A method to detect such an impending failure is disclosed. Baseline data on a pre-selected set of analyzer variables for a population of diagnostic clinical analyzers is used to generate an impending failure threshold. Subsequently, operational data comprising the same pre-selected set of analyzer variables allows generation of a time series of operational statistics. If the operational statistic exceeds the impeding failure threshold in a prescribed manner, an impending analytical failure is predicted. Such detection of impending analytical failures facilitates intelligent scheduling of service for the analyzer in question to maintain high assay throughput and accuracy.
Control profile
Owen D Altland from Rochester, NY, age ~49 Get Report