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Ofer E Kadar

from Sunnyvale, CA
Age ~51
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Also known as:
Oser Kadar, Kadar Oser
Phone and address:
1037 Payette Ave, Sunnyvale, CA 94087
Related to:
David Kadar, 53Daniel S Kadar, 41Ygal KadarKadar Maia Elder, 51Beverly E Elder
Connected to:
Chris Kadar, 42Denise C Kadar, 72Dwight S Kadar, 77Ilona J Kadar, 48Linda J Kadar, 68Michael J Kadar, 45Steve Kadar, 124Meena S Kadaramandalige, 53Kavitha Kadari, 50Nutan Kadariya, 56

Ofer Kadar Phones & Addresses

  • 1037 Payette Ave, Sunnyvale, CA 94087
  • 1197 Cranberry Ave, Sunnyvale, CA 94087
  • Cupertino, CA

Work

Company: Orbotech Apr 2012 Address: Israel Position: Product manager

Education

School / High School: The Hebrew University 1998 to 2000

Skills

Semiconductors • R&D • Physics • Engineering Management • Thin Films • Electro Optics • Optics • Solar Energy • Engineering • Product Management • Simulations • Design For Manufacturing • Laser • Sensors • Cross Functional Team Leadership • Electronics • Semiconductor Industry • Product Development • Design of Experiments • Characterization • Management • Product Marketing • System Design • Photonics • Project Management • Systems Engineering • Renewable Energy • Solar • Program Management

Languages

English

Industries

Consumer Electronics

Resumes

Resumes

Ofer Kadar Photo 1

Hw Engineering Manager

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Location:
1037 Payette Ave, Sunnyvale, CA 94087
Industry:
Consumer Electronics
Work:
Orbotech - Israel since Apr 2012
Product Manager
Photon Dynamics - san jose, ca Jul 2011 - Apr 2012
Project Lead
Photon Dynamics Inc, an Orbotech Company Nov 2010 - Jul 2011
R&D Member of Technical Staff
Smart Grid Innovations May 2010 - Nov 2010
Founder & CEO
Applied Materials Jan 2010 - Oct 2010
Project Manager and Principal Engineer
Education:
The Hebrew University 1998 - 2000
The Hebrew University 1995 - 1998
Skills:
Semiconductors
R&D
Physics
Engineering Management
Thin Films
Electro Optics
Optics
Solar Energy
Engineering
Product Management
Simulations
Design For Manufacturing
Laser
Sensors
Cross Functional Team Leadership
Electronics
Semiconductor Industry
Product Development
Design of Experiments
Characterization
Management
Product Marketing
System Design
Photonics
Project Management
Systems Engineering
Renewable Energy
Solar
Program Management
Languages:
English

Publications

Us Patents

Modules And Processes For Metal Particles Removal

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US Patent:
20120031425, Feb 9, 2012
Filed:
Aug 9, 2011
Appl. No.:
13/206368
Inventors:
Ofer Kadar - Sunnyvale CA, US
Ofer Amir - Half Moon Bay CA, US
Babu Chinnasamy - Bangalore, IN
Assignee:
APPLIED MATERIALS, INC. - Santa Clara CA
International Classification:
B08B 1/04
B08B 7/00
B08B 1/02
US Classification:
134 1, 15 77, 15 883
Abstract:
Embodiments of the present invention provide an apparatus and methods for processing solar cell devices. In one embodiment, a method removing particles from edge regions of the solar cell device by a cleaning module with a constant loading applied onto a back surface of the solar cell device, wherein the cleaning modules has two or more roller-type brushes disposed at opposed sides of a rotation table located before and/or after a quality assurance stage configured to measure and correct defects in the solar cell device, and transferring the solar cell device into an edge deletion station in which an electromagnetic radiation energy is used to remove materials from a top surface of the solar cell device. The roller-type brushes include non-abrasive bristles configured to remove unwanted material from the periphery region of the solar cell device prior to transferring into the edge delete station.

Electrical Inspection Of Electronic Devices Using Electron-Beam Induced Plasma Probes

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US Patent:
20140132299, May 15, 2014
Filed:
Jan 15, 2014
Appl. No.:
14/155808
Inventors:
- San Jose CA, US
Ofer Kadar - Sunnyvale CA, US
Arie Glazer - Mevaseret, IL
Ronen Loewinger - San Francisco CA, US
Abraham Gross - Tel Aviv, IL
Daniel Toet - Santa Clara CA, US
Assignee:
Photon Dynamics, Inc. - San Jose CA
International Classification:
G01R 1/07
US Classification:
32475424, 324537, 32476209
Abstract:
A non-mechanical contact signal measurement apparatus includes a first conductor on a structure under test and a gas in contact with the first conductor. At least one electron beam is directed into the gas so as to induce a plasma in the gas where the electron beam passes through the gas. A second conductor is in electrical contact with the plasma. A signal source is coupled to an electrical measurement device through the first conductor, the plasma, and the second conductor when the plasma is directed on the first conductor. The electrical measurement device is responsive to the signal source.
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Ofer E Kadar from Sunnyvale, CA, age ~51 Get Report