US Patent:
20080320130, Dec 25, 2008
Inventors:
Kiran NAGARAJA - MONMOUTH JUNCTION NJ, US
Vijay RAGHUNATHAN - WEST LAFAYETTE IN, US
Florin SULTAN - PRINCETON NJ, US
Srimat CHAKRADHAR - MANALAPAN NJ, US
Nupur KOTHARI - LOS ANGELES CA, US
Assignee:
NEC LABORATORIES AMERICA - Princeton NJ
International Classification:
G06F 15/173
Abstract:
A computer implemented technique framework, prototype tool and associated methods that provide a high degree of visibility and control over the in-field execution of software in a minimally intrusive manner wherein developer-defined correctness tests and validation logic are embedded into the sensor node itself, making in-field software testing autonomous without necessitating continuous developer participation.