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Nicholas A Volkringer

from New Windsor, NY
Deceased
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Also known as:
Nick A Volkringer, Nick R
Phone and address:
10 Weather Oak Hill Rd, Newburgh, NY 12553
(845) 564-6259
Related to:
Roseann M Volkringer, 87
Connected to:
Erich C Volkstorf, 70Ann E Voll, 71Charlotte H Voll, 82Connor E Voll, 33Daniel B Voll, 80Erica D Voll, 48Inge Voll, 89Joseph J Voll, 83Keelah Voll, 41Linda L Voll, 75

Nicholas Volkringer Phones & Addresses

  • 10 Weather Oak Hill Rd, New Windsor, NY 12553 (845) 564-6259
  • Newburgh, NY

Work

Company: Ibm 1998 to 2006 Position: Manager

Education

School / High School: Mount Saint Mary's College Specialities: Accounting, Finance

Skills

Hardware • Computer Hardware • Troubleshooting • Project Management • Storage • Solution Selling • Negotiation • Disaster Recovery

Emails

v***[email protected]

Industries

Computer Hardware

Resumes

Resumes

Nicholas Volkringer Photo 1

Nicholas Volkringer

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Location:
10 Weather Oak Hill Rd, New Windsor, NY 12553
Industry:
Computer Hardware
Work:
Ibm 1998 - 2006
Manager
Daniels & West Jul 1959 - Jul 1994
Director of Parts and Service
Education:
Mount Saint Mary's College
Mount Saint Mary College
Skills:
Hardware
Computer Hardware
Troubleshooting
Project Management
Storage
Solution Selling
Negotiation
Disaster Recovery

Publications

Us Patents

Method Of Improving Production Through Cost Of Yield Measurement

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US Patent:
20020103560, Aug 1, 2002
Filed:
Jan 26, 2001
Appl. No.:
09/770355
Inventors:
Thomas McPhee - Hopewell Junction NY, US
Michael Cropp - LaGrangeville NY, US
Donald Diangelo - Fishkill NY, US
Alberto Gay - Corvallis OR, US
Carmella Pemberton - Wappingers Falls NY, US
Joseph Saltarelli - Pleasant Valley NY, US
Nicholas Volkringer - Southbury CT, US
John DeMarco - Marlboro NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06F019/00
US Classification:
700/110000
Abstract:
The present invention provides a method for controlling production or manufacturing costs by obtaining yield measurements of unit manufacturing for a multiplicity of products or production lines having a plurality of processes which includes determining a started units number for the plurality of processes. The method further includes determining a cost per unit for each the unit of the plurality of processes, and calculating an expected approved units number for the plurality of processes. The expected approved units number is calculated by multiplying the started units number by an expected yield measurement. The method next includes calculating an actual approved units number for each of the plurality of processes by multiplying the started units number by an actual yield measurement, and calculating an unapproved units number for each of the plurality of processes by subtracting the expected approved units number from the actual approved units number. The method then includes calculating cost of yield measurements for the plurality of processes by multiplying the unapproved units number by the cost per unit, and providing a comparison of the cost of yield measurements for the plurality of processes.
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Nicholas A Volkringer from New Windsor, NYDeceased Get Report