US Patent:
20230018388, Jan 19, 2023
Inventors:
- Mountain View CA, US
Pankaj RASTOGI - Fremont CA, US
Sumanth VENKATASUBBAIAH - Mountain View CA, US
Qingbo HU - Burlingame CA, US
Karthik PRAKASH - Milpitas CA, US
Nicholas Jeffrey HOH - Mountain View CA, US
Frank WISNIEWSKI - San Francisco CA, US
Abhishek JAIN - Mountain View CA, US
Caio Vinicius SOARES - Redwood City CA, US
Yuwen WU - Mountain View CA, US
International Classification:
G06F 16/23
G06N 20/00
G06N 5/02
G06F 9/54
Abstract:
Certain aspects of the present disclosure provide techniques for operation of a feature management platform. A feature management platform is an end-to-end platform developed to manage the full lifecycle of data features. For example, to create a stateful feature, the feature management platform can receive a processing artifact from a computing device. The processing artifact defines the stateful feature, including the data source to retrieve event data from, when to retrieve the event data, the type of transform to apply, etc. Based on the processing artifact, the feature management system generates a processing job (e.g., the API defines a pipeline), which when initiated generates a vector that encapsulates the stateful feature. The vector is transmitted to the computing device that locally hosts a model, which generates a prediction that is transmitted to the feature management platform. Subsequently, the predication and stateful feature can be transmitted to other computing devices.