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Neil A Sticha

from Minneapolis, MN
Age ~67
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Also known as:
Neil K Sticha, Nell A Sticha, Teicha S Neil, Ticla S Neil
Phone and address:
8708 Wood Cliff Rd, Minneapolis, MN 55438
(952) 831-0298
Related to:
Amy E Ketner, 60
Connected to:
Julie Sticha, 61Scott R Sticha, 67Steven R Sticha, 57John D Stichak, 73Carolyn S Stichal, 86Jeffry W Stichler, 55Michael L Stichling, 73Adam J Stichman, 56Amy J Stichman, 54Robert W Stichman, 77

Neil Sticha Phones & Addresses

  • 8708 Wood Cliff Rd, Minneapolis, MN 55438 (952) 831-0298
  • Bloomington, MN
  • Edina, MN
  • Newport, MN
  • 3322 Shepherd Hills Dr, Bloomington, MN 55431 (952) 831-0298

Work

Position: Professional Specialty Occupations

Education

Degree: Bachelor's degree or higher

Resumes

Resumes

Neil Sticha Photo 1

President

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Location:
Minneapolis, MN
Industry:
Plastics
Work:
Oakland Instrument Corp. since Sep 1995
President
Education:
University of Minnesota
Neil Sticha Photo 2

Neil Sticha

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Work:
Oakland Instrument Corp
Owner

Business Records

Name / Title
Company / Classification
Phones & Addresses
Neil A. Sticha
Owner
Acero Sensor Corporation
Business Services at Non-Commercial Site · Nonclassifiable Establishments
8708 Wood Clf Rd, Minneapolis, MN
Neil Sticha
President
Oakland Instrument Corp
Accounting · Nonclassifiable Establishments · Repair Services · Business Services
7417 Bush Lk Rd, Minneapolis, MN 55439
7405 Bush Lk Rd, Minneapolis, MN 55439
7417 Bush Lk Rd, Edina, MN 55439
(952) 835-4935

Publications

Us Patents

Automatic Calibration System For Apparatus For Measuring Variations In Thickness Of Elongated Samples Of Thin Plastic Film

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US Patent:
6538459, Mar 25, 2003
Filed:
Mar 12, 2001
Appl. No.:
09/804416
Inventors:
Neil A. Sticha - Newport MN, 55055
International Classification:
G01R 2726
US Classification:
324663, 324671
Abstract:
A capacitance gauge for measuring changes in the thickness of dielectric film, such as plastic film, is automatically calibrated by utilizing a direct-measurement sensor method or a contact-type sensor method alongside the capacitance sensor assembly. The direct-measurement sensor and the capacitance sensor measure the same point on the film sample, and the capacitive calibration reading is correlated to the direct-measurement sensor reading to automatically calibrate the capacitive sensor. An improved film transport assembly for serially examining plastic film material which eliminates errors in thickness measurement location and eliminates variation in distance between individual sensor readings, while at the same time allowing accurate positioning of the film in the sensors. Also, electronics which provide four modes of operation which include operating both the direct-measurement sensor and the capacitance sensor independently, or integrated for automatic calibration of the capacitance sensor, or simultaneously as a dual-sensor thickness measurement system.

Automatic Calibration System For Apparatus For Measuring Variations In Thickness Of Eleongated Samples Of Thin Plastic Film

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US Patent:
62013998, Mar 13, 2001
Filed:
Dec 1, 1998
Appl. No.:
9/203238
Inventors:
Neil A. Sticha - Newport MN
Kevin D. Edmunds - Newport MN
International Classification:
G01N 2722
US Classification:
324663
Abstract:
A capacitance gauge for measuring changes in the thickness of dielectric film, such as plastic film, is automatically calibrated by utilizing a direct-measurement sensor method or a contact-type sensor method alongside the capacitance sensor assembly. The direct-measurement sensor and the capacitance sensor measure the same point on the film sample, and the capacitive calibration reading is correlated to the direct-measurement sensor reading to automatically calibrate the capacitive sensor. An improved film transport assembly for serially examining plastic film material which eliminates errors in thickness measurement location and eliminates variation in distance between individual sensor readings, while at the same time allowing accurate positioning of the film in the sensors. Also, electronics which provide four modes of operation which include operating both the direct-measurement sensor and the capacitance sensor independently, or integrated for automatic calibration of the capacitance sensor, or simultaneously as a dual-sensor thickness measurement system.

Apparatus For Measuring Variations In Thickness Of Elongated Samples Of Thin Plastic Film

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US Patent:
59660180, Oct 12, 1999
Filed:
Feb 11, 1998
Appl. No.:
9/024955
Inventors:
Kevin D. Edmunds - Newport MN
Neil A. Sticha - Newport MN
International Classification:
G01N 2722
G01R 2726
US Classification:
324663
Abstract:
A capacitance gauge for measuring changes in the thickness of dielectric film, such as plastic film, is automatically temperature and humidity compensated by utilizing a primary measurement sensor and a reference sensor which monitors changes in perceived capacitance caused by ambient temperature and humidity changes or other environmentally induced interferences. The reference sensor counterbalances in an equal an opposite fashion, and thereby automatically cancels, any imbalance in the primary sensor caused by temperature, humidity, or other, fluctuations. An improved film transport assembly for serially examining plastic film material which eliminates errors in thickness measurement location and eliminates variation in distance between individual sensor readings, while at the same time allowing the user of the invention to select from a full variable range of distances between individual sensor readings and also allows accurate positioning of the film in the sensor.
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Neil A Sticha from Minneapolis, MN, age ~67 Get Report