Resumes
Resumes
Murray Weiser Phones & Addresses
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7 Saturn Ct, Syosset, NY 11791 (516) 931-5237 (516) 938-6457
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Great Neck, NY
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7 Saturn Ct, Syosset, NY 11791 (516) 606-9136
Work
Position:
Sales Occupations
Education
Degree:
Associate degree or higher
Emails
Business Records
Name / Title
Company / Classification
Phones & Addresses
SATURN SOFTWARE, LTD
7 Saturn Ct, Syosset, NY 11791
Publications
Us Patents
X-Ray Fluorescence Thickness Measuring Device
View pageUS Patent:
48603295, Aug 22, 1989
Filed:
Feb 24, 1986
Appl. No.:
6/832479
Inventors:
Murray Weiser - Syosset NY
William Silverman - Melville NY
Zvi Landau - New-Gardens NY
Paul Finer - Roslyn Heights NY
Cary I. Pincus - Wantagh NY
William Silverman - Melville NY
Zvi Landau - New-Gardens NY
Paul Finer - Roslyn Heights NY
Cary I. Pincus - Wantagh NY
Assignee:
UPA Technology, Inc. - Syosset NY
International Classification:
G01B 1502
US Classification:
378 50
Abstract:
An X-ray fluorescence thickness measuring devise includes a primary X-ray beam collimation and workpiece positioning system that markedly increases the detectable fluorescent X-radiation from diverse specimen calibration standards and workpieces subjected to measurement. The positioning system includes an optical viewing system that provides a video signal image of the specimen surface prior to and during specimen radiation without hazard to the unit operator and independent of the collimator bore selected. A further feature of the measuring device is that it includes a system which assures repetitive and accurate positioning of a selected collimator relative to the axis of the X-ray beam to obtain maximum beam transmission therethrough.