US Patent:
20090132455, May 21, 2009
Inventors:
Eric Kuo - Foster City CA, US
Michael Zakharevich - Belmont CA, US
Olena Tsvirkunova - San Carlos CA, US
Assignee:
Align Technology, Inc. - Santa Clara CA
International Classification:
A61C 7/00
G06N 5/02
G06F 7/06
G06F 17/30
US Classification:
706 46, 433 24, 707 2, 707E17017
Abstract:
Methods and systems for characterizing a dentition of a patient including receiving an initial dentition of a patient, generating an initial profile representing the initial dentition of the patient, identifying an initial malocclusion from the initial profile, comparing at least a portion of the initial profile with one or more reference profiles of reference dentitions, wherein said one or more reference profiles includes a reference malocclusion substantially similar to the initial malocclusion, and calculating a value for the closeness of the initial profile and the reference profile are provided.