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Michael Andrew Kirk

from South Bend, IN
Age ~40
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Also known as:
Michael A Kirk, Michael K Irk
Phone and address:
5523 Colonial Ln, South Bend, IN 46614
Related to:
Anthony D Kirk, 57Flora J Bernstein, 67John Mohnke, 37Michelle Monk, 54Angela M Earnest, 59Daniel J Menard, 70
Connected to:
Aja N Kirk, 36Alec Kirk, 33Alexa Kirk, 33Alinda M Kirk, 75Allison E Kirk, 45Alyson L Kirk, 55Andrea R Kirk, 44Angie Kirk, 78Ann Kirk, 83Annette C Kirk, 53

Michael Kirk Phones & Addresses

  • 5523 Colonial Ln, South Bend, IN 46614
  • Ventura, CA

Professional Records

License Records

Doctor Of Veterinary Medicine

License #:
2198 - Active
Issued Date:
Jun 26, 1970
Renew Date:
Nov 1, 2016
Expiration Date:
Oct 31, 2018
Type:
Veterinarian

Michael David Kirk

License #:
MT018266T - Expired
Category:
Medicine
Type:
Graduate Medical Trainee

Lawyers & Attorneys

Michael Kirk Photo 1

Michael W. Kirk - Lawyer

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Licenses:
New York - Currently registered 1989
Education:
Northwestern University School of Law
Michael Kirk Photo 2

Michael Kane Kirk - Lawyer

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Licenses:
Virginia - Authorized to practice law 1966
Michael Kirk Photo 3

Michael Kirk - Lawyer

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Office:
Spencer Fane, LLP
Specialties:
Real Estate
Leasing Transactions
Formation and Restructuring of Ownership Entities
Property Acquisition
Financing
Management Agreements
Construction Contracts
Disposition of Property
ISLN:
905859604
Admitted:
1973

Medicine Doctors

Michael Kirk Photo 4

Michael E. Kirk

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Specialties:
Orthopaedic Surgery
Work:
Lexington Orthopedic AssocsLexington Orthopedics Associates
2537 Larkin Rd, Lexington, KY 40503
(859) 277-5703 (phone), (859) 275-1624 (fax)
Education:
Medical School
University of Arkansas College of Medicine at Little Rock
Graduated: 1992
Procedures:
Arthrocentesis
Hip Replacement
Knee Arthroscopy
Knee Replacement
Carpal Tunnel Decompression
Hallux Valgus Repair
Hip/Femur Fractures and Dislocations
Joint Arthroscopy
Lower Arm/Elbow/Wrist Fractures and Dislocations
Lower Leg/Ankle Fractures and Dislocations
Shoulder Arthroscopy
Shoulder Surgery
Wound Care
Conditions:
Lateral Epicondylitis
Osteoarthritis
Plantar Fascitis
Rotator Cuff Syndrome and Allied Disorders
Fractures, Dislocations, Derangement, and Sprains
Languages:
English
Description:
Dr. Kirk graduated from the University of Arkansas College of Medicine at Little Rock in 1992. He works in Lexington, KY and specializes in Orthopaedic Surgery. Dr. Kirk is affiliated with Baptist Health Lexington.
Michael Kirk Photo 5

Michael N. Kirk

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Specialties:
Family Medicine
Work:
Progressive Family Care
509 Hamacher St STE 103, Waterloo, IL 62298
(618) 939-2273 (phone), (618) 939-0245 (fax)

Progressive Family Care
208 N Main St STE H, Columbia, IL 62236
(618) 281-2273 (phone), (618) 281-0245 (fax)
Education:
Medical School
University of Kansas School of Medicine
Graduated: 1987
Procedures:
Allergen Immunotherapy
Arthrocentesis
Destruction of Benign/Premalignant Skin Lesions
Electrocardiogram (EKG or ECG)
Pulmonary Function Tests
Skin Tags Removal
Vaccine Administration
Conditions:
Abdominal Hernia
Abnormal Vaginal Bleeding
Acne
Acute Bronchitis
Acute Pharyngitis
Languages:
English
Description:
Dr. Kirk graduated from the University of Kansas School of Medicine in 1987. He works in Columbia, IL and 1 other location and specializes in Family Medicine. Dr. Kirk is affiliated with Memorial Hospital, Missouri Baptist Sullivan Hospital, Red Bud Regional Hospital and St Elizabeths Hospital.
Michael Kirk Photo 6

Michael B. Kirk

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Specialties:
Emergency Medicine
Work:
Los Robles Emergency Phys GrpLos Robles Emergency Physicians Medical Group
215 W Janss Rd, Thousand Oaks, CA 91360
(805) 370-4435 (phone), (805) 370-4579 (fax)
Education:
Medical School
University of Southern California Keck School of Medicine
Graduated: 1985
Languages:
English
Description:
Dr. Kirk graduated from the University of Southern California Keck School of Medicine in 1985. He works in Thousand Oaks, CA and specializes in Emergency Medicine. Dr. Kirk is affiliated with Los Robles Hospital & Medical Center.
Michael Kirk Photo 7

Michael D. Kirk

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Specialties:
Family Medicine
Work:
Penn Medicine Clinical Care AssociatesUnionville Family Medicine
687 Unionville Rd, Kennett Square, PA 19348
(610) 444-2002 (phone), (610) 444-4469 (fax)
Languages:
English
Spanish
Description:
Dr. Kirk works in Kennett Square, PA and specializes in Family Medicine. Dr. Kirk is affiliated with Penn Medicine Chester County Hospital.
Michael Kirk Photo 8

Michael Kirk

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Specialties:
Family Medicine
Work:
St Josephs Hospital
1 Amalia Dr, Buckhannon, WV 26201
(304) 473-2202 (phone), (304) 473-2211 (fax)
Languages:
English
Description:
Dr. Kirk works in Buckhannon, WV and specializes in Family Medicine. Dr. Kirk is affiliated with St Josephs Hospital Of Buckhannon Inc.
Michael Kirk Photo 9

Michael Barry Kirk M.P.H.

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Specialties:
Emergency Medicine
Education:
University of Southern California(1985)

Business Records

Name / Title
Company / Classification
Phones & Addresses
Michael Kirk
Information Technology Purchasing
Bechtel Corporation
Engineering Services
50 Beale St, San Francisco, CA 94105
Michael Kirk
Information Technology Purchasing
Bechtel Corporation
Engineering Services
50 Beale St, San Francisco, CA 94105
Michael Timothy Kirk
President
Alvista Environmental Consulting, Inc.
Environmental Services · Business Consulting Services
4900 Hopyard Rd SUITE 100, Pleasanton, CA 94588
2033 N Main St, Walnut Creek, CA 94596
Michael Kirk
President
PLEASANTON SOCCER REFEREE ASSOCIATION
Membership Organization · Nonclassifiable Establishments
PO Box 332, Pleasanton, CA 94566
Michael J Kirk
KIRK'S HAULING, LLC
Michael Kirk
YELLOW MONKEY ART GALLERY LLC
Michael J. Kirk
RISK & CONTROL CONSULTING LLC
Michael Kirk
F & I MARKETING, LLC
Michael K. Kirk
KBD REAL ESTATE GROUP, LLC

Publications

Us Patents

Methods And Systems For Detection Of Selected Defects Particularly In Relatively Noisy Inspection Data

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US Patent:
7373277, May 13, 2008
Filed:
Jun 1, 2004
Appl. No.:
10/858420
Inventors:
Sean Wu - Fremont CA, US
Haiguang Chen - Millbrae CA, US
Michael D. Kirk - San Jose CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
G06F 11/30
US Classification:
702185
Abstract:
Various methods and systems for detection of selected defects particularly in relatively noisy inspection data are provided. One method includes applying a spatial filter algorithm to raw inspection data acquired across an area on a substrate to determine a first portion of the raw inspection data that has a higher probability of being a selected type of defect than a second portion of the raw inspection data. The selected type of defect includes a non-point defect. The method also includes generating a raw two-dimensional map illustrating the first portion of the raw inspection data. In addition, the method includes searching the raw two-dimensional map for an event that has spatial characteristics that approximately match spatial characteristics of the selected type of defect. The method further includes determining if the event corresponds to a defect having the selected type.

Methods And Systems For Detection Of Selected Defects Particularly In Relatively Noisy Inspection Data

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US Patent:
7711521, May 4, 2010
Filed:
May 12, 2008
Appl. No.:
12/119179
Inventors:
Sean Wu - Fremont CA, US
Haiguang Chen - Mountain View CA, US
Michael D. Kirk - San Jose CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
G06F 11/30
US Classification:
702185
Abstract:
Various methods and systems for detection of selected defects particularly in relatively noisy inspection data are provided. One method includes applying a spatial filter algorithm to raw inspection data acquired across an area on a substrate to determine a first portion of the raw inspection data that has a higher probability of being a selected type of defect than a second portion of the raw inspection data. The selected type of defect includes a non-point defect. The method also includes generating a raw two-dimensional map illustrating the first portion of the raw inspection data. In addition, the method includes searching the raw two-dimensional map for an event that has spatial characteristics that approximately match spatial characteristics of the selected type of defect. The method further includes determining if the event corresponds to a defect having the selected type.

Defect Detection

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US Patent:
7796805, Sep 14, 2010
Filed:
Sep 26, 2005
Appl. No.:
11/234974
Inventors:
Michael D. Kirk - Los Altos CA, US
Stephen A. Biellak - Sunnyvale CA, US
David W. Shortt - Milpitas CA, US
Assignee:
KLA-Tencor Corporation - Milpitas CA
International Classification:
G06K 9/00
US Classification:
382149, 382100, 382141, 382145, 3562372, 3562373, 3562375
Abstract:
A wafer having improved inspection sensitivity to foreign matter on a top-most surface of the wafer, as detected with a surface scanning optical inspection system that uses an inspection wavelength. The wafer includes a substantially homogenous first layer at the top-most surface of the wafer, the first layer having a first thickness. The first layer is at least partially transparent to the inspection wavelength. A substantially homogenous second layer immediately underlies the first layer, the second layer having a second thickness. The second layer is at least partially transparent to the inspection wavelength. A substrate immediately underlies the second layer. The first thickness and the second thickness are set in a combination that produces a local minimum of an electric field at the top-most surface and a local maximum of an electric field within one hundred nanometers above the top-most surface.

Methods And Systems For Determining A Characteristic Of A Wafer

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US Patent:
8284394, Oct 9, 2012
Filed:
Feb 9, 2007
Appl. No.:
11/673150
Inventors:
Michael D. Kirk - San Jose CA, US
Christopher F. Bevis - Los Gatos CA, US
David Adler - San Jose CA, US
Kris Bhaskar - San Jose CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
G01N 21/00
US Classification:
3562375, 3562371, 3562372
Abstract:
Methods and systems for determining a characteristic of a wafer are provided. One method includes generating output responsive to light from the wafer using an inspection system. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The method also includes determining the characteristic of the wafer using the second output. One system includes an inspection subsystem configured to illuminate the wafer and to generate output responsive to light from the wafer. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The system also includes a processor configured to determine the characteristic of the wafer using the second output.

Methods And Systems For Determining A Characteristic Of A Wafer

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US Patent:
8422010, Apr 16, 2013
Filed:
Sep 12, 2012
Appl. No.:
13/610860
Inventors:
Michael D. Kirk - San Jose CA, US
Christopher F. Bevis - Los Gatos CA, US
David Adler - San Jose CA, US
Kris Bhaskar - San Jose CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
G01N 21/00
US Classification:
3562375, 3562371, 3562372
Abstract:
Methods and systems for determining a characteristic of a wafer are provided. One method includes generating output responsive to light from the wafer using an inspection system. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The method also includes determining the characteristic of the wafer using the second output. One system includes an inspection subsystem configured to illuminate the wafer and to generate output responsive to light from the wafer. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The system also includes a processor configured to determine the characteristic of the wafer using the second output.

Kinematically Mounted Probe Holder For Scanning Probe Microscope

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US Patent:
60575468, May 2, 2000
Filed:
Aug 4, 1998
Appl. No.:
9/129066
Inventors:
David Braunstein - Campbell CA
Michael Kirk - San Jose CA
Ouoc Ly - San Jose CA
Thai Nguyen - Sunnyvale CA
Assignee:
ThermoMicroscopes Corp. - Sunnyvale CA
International Classification:
H01J 3726
US Classification:
250306
Abstract:
Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.

Scanning Probe Microscope Providing Unobstructed Top Down And Bottom Up Views

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US Patent:
58544879, Dec 29, 1998
Filed:
Feb 28, 1997
Appl. No.:
8/808351
Inventors:
David Braunstein - Campbell CA
Michael Kirk - San Jose CA
Quoc Ly - San Jose CA
Thai Nguyen - Sunnyvale CA
Assignee:
Park Scientific Instruments - Sunnyvale CA
International Classification:
H01J 3726
US Classification:
250306
Abstract:
Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.

Piezoresistive Cantilever With Integral Tip For Scanning Probe Microscope

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US Patent:
54442443, Aug 22, 1995
Filed:
Jun 3, 1993
Appl. No.:
8/073201
Inventors:
Michael D. Kirk - San Jose CA
Ian R. Smith - Los Gatos CA
Marco Tortonese - Standford CA
Sean S. Cahill - Cupertino CA
Timothy G. Slater - San Francisco CA
Assignee:
Park Scientific Instruments Corporation - Sunnyvale CA
International Classification:
H01J 3700
US Classification:
250306
Abstract:
A cantilever for a scanning probe microscope is disclosed. The cantilever includes a piezoresistor for detecting the deflection of the cantilever, and a tip which is formed integrally with the cantilever. A process of fabricating such a cantilever is also disclosed, the process yielding a tip which has a high aspect ratio and a small radius of curvature at its apex. A combined atomic force/lateral force microscope including two or more piezoresistors responsive to both the bending and torsion of the cantilever is also disclosed.
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Michael Andrew Kirk from South Bend, IN, age ~40 Get Report