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Matt Condron Phones & Addresses

  • 2370 Laylani Ct, Santa Rosa, CA 95403 (707) 525-8302
  • 3925 Elkstone Pl, Santa Rosa, CA 95404 (707) 321-3566
  • 2705 Range Ave, Santa Rosa, CA 95403 (707) 525-8302
  • San Luis Obispo, CA

Resumes

Resumes

Matt Condron Photo 1

Director Of Supply Chain

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Location:
2370 Laylani Ct, Santa Rosa, CA 95403
Industry:
Medical Devices
Work:
TriVascular Inc. since Jun 2008
Senior Manager of Supply Chain

Cuvaison Winery since Jun 2003
Sales Associate

TriVascular Inc. Jun 2008 - Jun 2010
Manager, Supplier Controls and Product Services

Boston Scientific: Natick, MA Jun 2007 - Jun 2008
Project Manager

Boston Scientific: Mountain View, CA Aug 2006 - Jun 2007
Senior Supplier Quality Engineer
Education:
California Polytechnic State University-San Luis Obispo 1995 - 2000
mechanical
Skills:
Medical Devices
Manufacturing
Iso 13485
Supply Chain
Fda
Product Launch
Design Control
Quality System
Minitab
Capa
R&D
Purchasing
Validation
Design For Manufacturing
Supply Chain Management
Cross Functional Team Leadership
Start Ups
Engineering Management
Interests:
Kids
Cooking
Medicine
Exercise
Electronics
Home Improvement
Diet
Reading
Crafts
Fitness
Gourmet Cooking
Music
Sports
Food
Movies
Home Decoration
Health
Languages:
English
Matt Condron Photo 2

Matt Condron

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Location:
Santa Rosa, CA
Industry:
Telecommunications

Publications

Us Patents

Double-Sided Wafer Probe

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US Patent:
20070296423, Dec 27, 2007
Filed:
May 25, 2006
Appl. No.:
11/442070
Inventors:
Michael Whitener - Santa Rosa CA, US
Allen Anderson - Santa Rosa CA, US
John Larson - Palo Alto CA, US
Matt Condron - Santa Rosa CA, US
Stephen Gilbert - San Francisco CA, US
Jose Marroquin - Sebastopol CA, US
Matthew Richter - Santa Rosa CA, US
Ron Strehlow - Santa Rosa CA, US
Hassan Tanbakuchi - Santa Rosa CA, US
David Taylor - San Mateo CA, US
International Classification:
G01R 31/02
US Classification:
324754000
Abstract:
A wafer support assembly has a first wafer support plate having a first grid pattern allowing first probe access through the first grid pattern to a first side of a wafer in the wafer support assembly and a second wafer support plate having a second grid pattern allowing second probe access through the second grid pattern to a second side of the wafer in the wafer support assembly.
Matt G Condron from Santa Rosa, CA, age ~48 Get Report