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Martin Lee Spartz

from Ellington, CT
Age ~60
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Also known as:
Martin L Spartz, Martin Barbara Spartz, Lee Spartz Martin, Martin Z
Phone and address:
8 Gasek Farms Rd, Ellington, CT 06029
(860) 872-6248
Related to:
Anna F Spartz, 28
Connected to:
Mary J Spartz, 60Nancy J Spartz, 66Ryan Spartz, 34Ronnie D Sparvell, 70Daniel J Sparvero, 61Stephanie A Sparvero, 50Brian M Sparvieri, 54Ronald J Sparwell, 38Mary L Spas, 36Mark C Spaseff, 67

Martin Spartz Phones & Addresses

  • 8 Gasek Farms Rd, Ellington, CT 06029 (860) 872-6248
  • 29 April Dr, East Windsor, CT 06088
  • Mount Pleasant, MI
  • Camden, DE
  • 8 Gasek Farms Rd, Ellington, CT 06029

Interests

consulting offers, new ventures, job inq...

Industries

Environmental Services

Resumes

Resumes

Martin Spartz Photo 1

Vp Of Sales And Marketing At Prism Analytical Technologies, Inc

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Location:
Hartford, Connecticut Area
Industry:
Environmental Services
Experience:
Prism Analytical Technologies, Inc (Environmental Services industry): VP of Sales and Marketing,  (-) MKS Instruments (Public Company; MKSI; Semiconductors industry): Product Manager - On-Line Products,  (June 1997-May 2009) Developed industry leading Mu...

Business Records

Name / Title
Company / Classification
Phones & Addresses
2625 Denison Dr STE D, Mount Pleasant, MI 48858
Martin Spartz
President, Chairman/Chief Marketing Officer
PRISM ANALYTICAL TECHNOLOGIES, INC
Analytical Laboratory & Mfg Monitoring & Testing Instruments · Business Consulting Services Mfg Analytical Instruments · Asbestos Removal · Diagnostic Labs
1200 N Fancher St, Mount Pleasant, MI 48858
Michigan
2625 Denison Dr, Mount Pleasant, MI 48858
2625 Denison Dr Ste D, Mount Pleasant, MI 48858
(989) 772-5088, (877) 243-5247

Publications

Us Patents

Multigas Monitoring And Detection System

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US Patent:
7372573, May 13, 2008
Filed:
Sep 30, 2005
Appl. No.:
11/240799
Inventors:
Martin L. Spartz - Ellington CT, US
Vidi Saptari - Cambridge MA, US
Assignee:
MKS Instruments, Inc. - Andover MA
International Classification:
G01B 9/02
G01J 3/45
US Classification:
356451
Abstract:
A spectroscopic detection system is described for monitoring ambient air for toxic chemical substances. The system can be a compact, portable multiple gas analyzer capable of detecting and discriminating a broad range of chemical constituents including various nerve and blister agents as well as toxic industrial chemicals at low or sub part per billion (ppb) levels. The system minimizes false alarms (e. g. , false positives or negatives), features high specificity, and can operate with response times on the order of a few seconds to a few minutes, depending on the application. The system can be an entirely self-contained analyzer, with a Fourier Transform Infrared (FTIR) spectrometer, a gas sample cell, a detector, an embedded processor, a display, power supplies, an air pump, heating elements, and other components onboard the unit with an air intake to collect a sample and an electronic communications port to interface with external devices.

Multigas Monitoring And Detection System

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US Patent:
7595887, Sep 29, 2009
Filed:
May 12, 2008
Appl. No.:
12/119244
Inventors:
Martin L. Spartz - Ellington CT, US
Vidi Saptari - Cambridge MA, US
Assignee:
MKS Instruments, Inc. - Andover MA
International Classification:
G01B 9/02
G01J 3/45
US Classification:
356451
Abstract:
A spectroscopic detection system is described for monitoring ambient air for toxic chemical substances. The system can be a compact, portable multiple gas analyzer capable of detecting and discriminating a broad range of chemical constituents including various nerve and blister agents as well as toxic industrial chemicals at low or sub part per billion (ppb) levels. The system minimizes false alarms (e. g. , false positives or negatives), features high specificity, and can operate with response times on the order of a few seconds to a few minutes, depending on the application. The system can be an entirely self-contained analyzer, with a Fourier Transform Infrared (FTIR) spectrometer, a gas sample cell, a detector, an embedded processor, a display, power supplies, an air pump, heating elements, and other components onboard the unit with an air intake to collect a sample and an electronic communications port to interface with external devices.

Sensor For Pulsed Deposition Monitoring And Control

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US Patent:
7735452, Jun 15, 2010
Filed:
Jul 8, 2005
Appl. No.:
11/177835
Inventors:
Martin Spartz - Ellington CT, US
Assignee:
MKS Instruments, Inc. - Wilmington MA
International Classification:
B05C 11/00
US Classification:
118688
Abstract:
Delivery of gas by a pulsed gas delivery device is monitored using a sensor. The sensor may include a source that generates radiation at a spectral range that includes an absorption frequency of the gas being delivered. The radiation is transmitted through a receptacle into which the delivered gas has been received. A detector detects the intensity of the radiation that reaches the detector from the source after transmission through the gas in the receptacle. A controller measures a precise quantity of the gas that was delivered by the gas delivery device, by determining from the detected intensity the amount of the radiation that was absorbed by the gas in the receptacle. The controller monitors in real time the delivery of the gas, by adaptively adjusting the quantity of gas being delivered to a desired quantity. The sensor and controller can also monitor for failures or for out-of-specification behavior of the gas delivery device.

Method And Apparatus For Siloxane Measurements In A Biogas

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US Patent:
8462347, Jun 11, 2013
Filed:
Mar 9, 2010
Appl. No.:
12/720542
Inventors:
Charles Mark Phillips - Sicklerville NJ, US
Barbara Marshik-Geurts - Methuen MA, US
Leonard I. Kamlet - Andover MA, US
Martin L. Spartz - Ellington CT, US
Vidi Saptari - Cambridge MA, US
Assignee:
MKS Instruments, Inc. - Andover MA
International Classification:
G01B 9/02
G01J 3/45
G01N 21/00
US Classification:
356451, 356437
Abstract:
A method for monitoring of siloxane compounds in a biogas includes the step of generating a first absorption spectrum based on a ratio of a first spectral measurement and a second spectral measurement. The first spectral measurement is from a non-absorptive gas having substantially no infrared absorptions in a specified wavelength range of interest and the second spectral measurement is from a sample gas comprising the biogas. The method also includes the step of calculating a concentration of at least one siloxane compound in the biogas using a second absorption spectrum based on, at least, a first individual absorption spectrum for a known concentration of the at least one siloxane compound.

Linked Extendable Gas Observation System For Infrared Absorption Spectroscopy

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US Patent:
20070182965, Aug 9, 2007
Filed:
Sep 28, 2006
Appl. No.:
11/529694
Inventors:
Leonard Kamlet - Andover MA, US
Martin Spartz - Ellington CT, US
Peter Rosenthal - W. Simsbury CT, US
Assignee:
MKS Instruments, Inc. - Wilmington MA
International Classification:
G01N 21/61
G01N 21/00
US Classification:
356437000
Abstract:
A modular system for gas analysis has a first gas cell that receives and passes at least a portion of an infrared light beam through at least a portion of the first gas cell. A second gas cell disposed proximal to the first gas cell receives and passes at least a portion of the infrared light beam from the first gas cell through at least a portion of the second gas cell. At least a portion of the first gas cell and at least a portion of the second gas cell define a light path having an effective length. The system includes a means for adjusting the effective length of the light path to vary a property of the infrared light beam. Methods of making a variable effective length light path and methods of making a gas detector are also disclosed.

Multigas Monitoring And Detection System

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US Patent:
20100079764, Apr 1, 2010
Filed:
Sep 28, 2009
Appl. No.:
12/567981
Inventors:
Martin L. Spartz - Ellington CT, US
Vidi Saptari - Cambridge MA, US
Assignee:
MKS Instruments, Inc. - Andover MA
International Classification:
G01J 3/45
G01N 21/84
US Classification:
356451
Abstract:
A spectroscopic detection system is described for monitoring ambient air for toxic chemical substances. The system can be a compact, portable multiple gas analyzer capable of detecting and discriminating a broad range of chemical constituents including various nerve and blister agents as well as toxic industrial chemicals at low or sub part per billion (ppb) levels. The system minimizes false alarms (e.g., false positives or negatives), features high specificity, and can operate with response times on the order of a few seconds to a few minutes, depending on the application. The system can be an entirely self-contained analyzer, with a Fourier Transform Infrared (FTIR) spectrometer, a gas sample cell, a detector, an embedded processor, a display, power supplies, an air pump, heating elements, and other components onboard the unit with an air intake to collect a sample and an electronic communications port to interface with external devices.

Method And Apparatus For Siloxane Measurements In A Biogas

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US Patent:
20130193325, Aug 1, 2013
Filed:
Jan 17, 2013
Appl. No.:
13/743671
Inventors:
MKS INSTRUMENTS, INC. - Andover MA, US
Barbara Marshik-Geurts - Methuen MA, US
Leonard I. Kamlet - Andover MA, US
Martin L. Spartz - Ellington CT, US
Vidi Saptari - Cambridge MA, US
Assignee:
MKS INSTRUMENTS, INC. - Andover MA
International Classification:
G01N 21/35
US Classification:
25033907, 250340
Abstract:
A method is provided for monitoring one or more silicon-containing compounds present in a biogas. The method includes generating a first absorption spectrum based on a ratio of a first spectral measurement and a second spectral measurement. The first spectral measurement is from a non-absorptive gas having substantially no infrared absorptions in a specified wavelength range of interest and the second spectral measurement is from a sample gas comprising the biogas. The method includes generating at least one surrogate absorption spectrum based on, at least, individual absorption spectrum for each of a subset of one or more silicon-containing compounds selected from a larger set of known silicon-containing compounds with known concentrations. A total concentration of the one or more silicon-containing compounds in the biogas can be calculated based on the first absorption spectrum and the at least one surrogate absorption spectrum.

Method And Apparatus For Fault Detection And Control

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US Patent:
61922870, Feb 20, 2001
Filed:
Sep 22, 1998
Appl. No.:
9/158380
Inventors:
Peter R. Solomon - West Hartford CT
Peter A. Rosenthal - West Simsbury CT
Martin L. Spartz - East Windsor CT
Chad M. Nelson - Coventry CT
Assignee:
On-Line Technologies, Inc. - East Hartford CT
International Classification:
G06F 1900
US Classification:
700110
Abstract:
A fault detection and classification system for wafer etching, tool cleaning, and other fabrication processes employs exhaust gas composition data from a Fourier transform infrared spectrometer in addition to machine-state and other process-state data. Process control may be initiated based upon the classification of a fault.
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Martin Lee Spartz from Ellington, CT, age ~60 Get Report