Inventors:
Kenneth Leon Habegger - Naperville IL
Karen Louise Moeller - Naperville IL
Ronald Keith Poole - Warrenville IL
Jaime E. Salazar - Warrenville IL
Mark Roman Sosinski - Downers Grove IL
Richard Grant Sparber - Wheaton IL
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G01R 3108
H04J 312
Abstract:
Apparatus and a method for testing tiered digital multiplexing apparatus. To test a primary train of tiered demultiplexers, a data path assurance train of demultiplexers and a selector is used to generate a demultiplexed signal for comparison with a primary demultiplexed signal. To test a primary train of tiered multiplexers, the output of the final multiplexing stage is connected to the input of the data path assurance train of demultiplexers to generate a demultiplexed signal for comparison with a primary input signal to the primary multiplexer train. Advantageously, a simpler, more reliable, and less expensive data path assurance circuit using the same types of components as the primary multiplexers and demultiplexers can be used to detect failures in these primary units as well as the data path assurance circuit.