Search

Marc Tricard Phones & Addresses

  • Glastonbury, CT
  • 5 Dickinson Xing, Fairport, NY 14450 (585) 421-9903
  • Wrentham, MA
  • 56 Vassar St, Worcester, MA 01602 (508) 795-7974
  • Rochester, NY
  • Middletown, CT
  • Blacksburg, VA

Work

Company: Zygo corporation Jan 2011 Position: Executive director of business development

Education

Degree: MS School / High School: Virginia Polytechnic Institute and State University 1989 to 1993 Specialities: Materials Science

Skills

Electronics • Materials Science • Optics • R&D • Product Development • Metrology • Engineering • New Business Development • Manufacturing • Materials • Strategy • Engineering Management • Business Development

Languages

French

Awards

3 patents. • 60+ Technical Publications. • Numerous presentations inc. several invi... • Recipient of Norton Company’ Special Ach... • Recipient of Society of Automotive Engin...

Interests

High Tech. Business, New Business Develo...

Industries

Nanotechnology

Resumes

Resumes

Marc Tricard Photo 1

Executive Director Of Business Development At Zygo Corporation

View page
Position:
Executive Director of Business Development at Zygo Corporation
Location:
Hartford, Connecticut Area
Industry:
Nanotechnology
Work:
Zygo Corporation since Jan 2011
Executive Director of Business Development

Cabot Microelectronics Jul 2006 - Dec 2010
Director of Business Development

QED Technologies Oct 2001 - Dec 2010
Director of Business Development

Saint-Gobain Jul 1996 - Aug 2001
Electronics Business Manager, World

Norton Company 1994 - 1996
Product Development Manager
Education:
Virginia Polytechnic Institute and State University 1989 - 1993
MS, Materials Science
Ecole nationale supérieure d'Arts et Métiers 1987 - 1990
Skills:
Electronics
Materials Science
Optics
R&D
Product Development
Metrology
Engineering
New Business Development
Manufacturing
Materials
Strategy
Engineering Management
Business Development
Interests:
High Tech. Business, New Business Development, Intellectual Property, International Business, New Technologies, Optics Industry, Precision Engineering and Metrology, Process Development, R&D, Sales and Marketing, Strategic Planning, M&A.
Honor & Awards:
3 patents. 60+ Technical Publications. Numerous presentations inc. several invited talks worldwide. Recipient of Norton Company’ Special Achievement Award. Recipient of Society of Automotive Engineers (SAE) Award for Excellence in Oral Presentation.
Languages:
French

Business Records

Name / Title
Company / Classification
Phones & Addresses
Marc Tricard
Program Director
QED TECHNOLOGIES INTERNATIONAL, INC
Mfg Computer Peripheral Equipment
1040 University Ave, Rochester, NY 14607
(585) 256-6540

Publications

Us Patents

Cutting Device For Separating Individual Laminated Chip Assemblies From A Strip Thereof, Method Of Separation And A Method Of Making The Cutting Device

View page
US Patent:
20030153247, Aug 14, 2003
Filed:
Feb 12, 2002
Appl. No.:
10/074331
Inventors:
Marc Tricard - Fairport NY, US
Robert Fisher - Maple Shade NJ, US
Robert Corcoran - Oakham MA, US
International Classification:
B24B027/06
B24D005/00
US Classification:
451/028000
Abstract:
An abrasive wheel is used to separate individual laminated chips from a strip by cutting through the copper bridging elements. The abrasive wheel is made up of abrasive particles bonded in a matrix having a high glass transition temperature and a cutting edge having a maximum thickness of the order of 350 micron, whereby the cut is substantially straight and free of smears and burrs.

Uniform Thin Films Produced By Magnetorheological Finishing

View page
US Patent:
20040029493, Feb 12, 2004
Filed:
Aug 6, 2002
Appl. No.:
10/213631
Inventors:
Marc Tricard - Fairport NY, US
William Kordonski - Webster NY, US
International Classification:
B24B001/00
US Classification:
451/036000
Abstract:
An improved method for producing a thin layer having highly uniform thickness, which layer may be pre-coated on an undulating surface of a substrate element. A working layer of the material is formed having a thickness greater than the final thickness desired. An areal (XY) determination of working layer thickness is made by ellipsometry, laser interferometry, or x-ray diffraction, or other known means. A map of thicknesses to be removed from the free surface of the working layer is entered into the control system of a magnetorheological finishing apparatus. The working layer is mounted on a workpiece holder of the apparatus and correctly indexed to the machine. The machine then removes material by magnetorheological finishing as instructed by the control system to leave a residual layer having a very high degree of thickness uniformity at a nominal average thickness and a very high surface integrity.

Photo-Masks For Lithography

View page
US Patent:
20150286129, Oct 8, 2015
Filed:
Apr 1, 2015
Appl. No.:
14/676460
Inventors:
- Middlefield CT, US
Marc Tricard - Glastonbury CT, US
International Classification:
G03F 1/22
H05G 2/00
G03F 1/48
G03F 1/76
G03F 1/46
Abstract:
A photo-mask for use in extreme ultraviolet (EUV) lithography, in which the photo-mask has low coefficient of thermal expansion and high specific stiffness.
Marc J Tricard from Glastonbury, CT, age ~57 Get Report