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Long V Vu

from San Jose, CA
Age ~80
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Also known as:
Van Long Vu, Van U Vu, Long Heather Vu, Vu Long, Vu Van Long
Phone and address:
1462 Sierraville Ave, San Jose, CA 95132
(408) 258-9878
Related to:
Thanhvan T Mac, 69Kyle Q Vu, 50Heather W Tran, 73Heather T Vu, 73John D Tran, 45Anhthu T Vu, 44Thanhha T MacBich T VuDanny D Tran, 56Kiet T Tran, 61Hao Q Vu, 50Charlie M Vu, 52
Connected to:
Addison D Vu, 33Alyssa Vu, 33An K Vu, 79Anh T Vu, 39Bai K Vu, 74Bao H Vu, 51Baongoc T Vu, 57Baoquy T Vu, 51Bella A Vu, 65Bich N Vu, 44

Long Vu Phones & Addresses

  • 1462 Sierraville Ave, San Jose, CA 95132 (408) 258-9878
  • 1766 Piedmont Rd, San Jose, CA 95132 (408) 258-9878
  • Milpitas, CA
  • Huntington Beach, CA
  • Santa Clara, CA

Professional Records

Medicine Doctors

Long Vu Photo 1

Long T Vu, San Jose CA

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Specialties:
Counseling
Address:
2203 Tully Rd, San Jose, CA 95122
(408) 937-1553 (Phone), (408) 937-1548 (Fax)
Languages:
English

Resumes

Resumes

Long Vu Photo 2

Long Vu Redondo Beach, CA

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Work:
Vons.com
Redondo Beach, CA
Feb 2012 to Jul 2014
Customer Service/Delivery Driver
TenTech Information Technology
Los Angeles, CA
May 2011 to May 2011
IT Technician
UPS
Baldwin Park, CA
2010 to Dec 2010
Seasonal Assistant Driver
AT&T/CHC Consulting, LLC
Alhambra, CA
Feb 2007 to Aug 2008
Project Engineer
W. Tan Engineering
San Bernardino, CA
Jun 2005 to Aug 2006
Office Engineer
Rafi Systems, Inc
Diamond Bar, CA
Apr 2005 to Aug 2006
Inventory Management
Cal Poly Pomona

Sep 2004 to Mar 2005
Senior Project
Education:
California State Polytechnic University
2000 to 2006
Bachelor of Science in Electrical Engineering
Skills:
AutoCAD 2000, Microsoft Office Excel & Word, CATIA V5
Long Vu Photo 3

Long Vu Santa Ana, CA

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Work:
RUSS BASSETT
Whittier, CA
Mar 2009 to Jul 2013
Vault Layout & Design
BASSENIAN LAGONI ARCHITECTS
Newport Beach, CA
Apr 2007 to Sep 2008
Intermediate Designer
EDPA Studio
Tustin, CA
Jan 2004 to Mar 2007
Project Architect
Education:
Portland State University
2003
BA in Architecture
Portland Community College
1996
Associate in Architectural Drafting
Madison High School
1993
Diploma in Math and Science
Long Vu Photo 4

Long Vu Santa Ana, CA

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Work:
University of California, Irvine
Irvine, CA
Sep 2011 to Jan 2012
Center for Opportunity and Diversity in Engineering (CODE) Mentor
Netflix Inc.
Santa Ana, CA
Nov 2008 to Sep 2009
DVD Repackager
Education:
University of California, Irvine
Irvine, CA
2011 to 2013
MS in Electrical Engineering
University of California, Irvine
Irvine, CA
2006 to 2011
BS in Electrical Engineering

Business Records

Name / Title
Company / Classification
Phones & Addresses
Long Vu
President
United Cargo, Inc
9353 Bolsa Ave, Westminster, CA 92683
5811 E Washington Blvd, Los Angeles, CA 90040
Long Vu
Owner
Hung Vietnamese Food
Eating Place
1818 Tully Rd, San Jose, CA 95122
Long Vu
Owner
Pho Ga Hung
Eating Place
1818 Tully Rd, San Jose, CA 95122
Long Vu
President
Natural Cure Collective
4108 N Sierra Way, San Bernardino, CA 92407
13624 Loumont St, Whittier, CA 90601
Long Vu
Principal
Quicknetworksolution.Com
Nonclassifiable Establishments
5880 Macadam Ct, San Jose, CA 95123
Long Vu
Principal
New Eagle Trucking
Local Trucking Operator
9353 Bolsa Ave, Westminster, CA 92683
Long Vu
Information Technology Manager
Gorilla Circuits
Electrical/Electronic Manufacturing · Mfg Printed Circuit Boards
1445 Oakland Rd, San Jose, CA 95112
1445 Old Oakland Rd, San Jose, CA 95112
1447 Oakland Rd, San Jose, CA 95112
(408) 294-9897
Long T. Vu
President
CENTURY HOME FURNISHINGS, INC
Ret Furniture
12410 Amargosa Rd #D, Victorville, CA 92392
14485 Monte Vis Ave, Chino, CA 91710

Publications

Us Patents

Apparatus For Testing Electronic Devices

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US Patent:
7762822, Jul 27, 2010
Filed:
Apr 27, 2006
Appl. No.:
11/413323
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 13/44
US Classification:
439131
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8118618, Feb 21, 2012
Filed:
May 3, 2010
Appl. No.:
12/772932
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 24/00
US Classification:
439676
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8388357, Mar 5, 2013
Filed:
Jan 18, 2012
Appl. No.:
13/353269
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 12/00
US Classification:
439 70
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8506335, Aug 13, 2013
Filed:
Jan 30, 2013
Appl. No.:
13/754765
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
AEHA Test Systems - Fremont CA
International Classification:
H01R 4/50
US Classification:
439770
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8628336, Jan 14, 2014
Filed:
Jul 11, 2013
Appl. No.:
13/939364
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 12/00
US Classification:
439 70
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
20210025935, Jan 28, 2021
Filed:
Sep 29, 2020
Appl. No.:
17/036839
Inventors:
- Fremont CA, US
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
G01R 31/28
G01R 31/26
G01R 31/00
G06F 8/30
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
20180372792, Dec 27, 2018
Filed:
Sep 4, 2018
Appl. No.:
16/121192
Inventors:
- Fremon CA, US
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
G01R 31/28
G06F 8/30
G01R 31/26
G01R 31/00
G01R 31/319
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
20160187416, Jun 30, 2016
Filed:
Mar 3, 2016
Appl. No.:
15/060443
Inventors:
- Fremont CA, US
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
G01R 31/28
G06F 9/44
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.
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Long V Vu from San Jose, CA, age ~80 Get Report