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Long T Vu

from Santa Clara, CA
Age ~62
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Also known as:
Long Thanh Vu, Dong Kimthoa Long, Vu Long, Long Tvu, Long T Ng
Phone and address:
1966 Monterey Ct, Santa Clara, CA 95051
(408) 983-1366
Related to:
Don V Tran, 57Thu Quang, 91Phuoc Hong Tran, 56Khanh T Tran, 68Thu Trang Tran, 63Alex VuNhan H Tran, 53Paul T Vu, 56Robert H Vu, 64Duc Hong Tran, 58
Connected to:
Addison D Vu, 33Alyssa Vu, 33An K Vu, 79Anh T Vu, 39Bai K Vu, 74Bao H Vu, 51Baongoc T Vu, 57Baoquy T Vu, 51Bella A Vu, 65Bich N Vu, 44

Long Vu Phones & Addresses

  • 1966 Monterey Ct, Santa Clara, CA 95051 (408) 983-1366
  • Sacramento, CA
  • Hayward, CA
  • Concord, CA
  • Sunnyvale, CA
  • Fort Worth, TX
  • San Jose, CA

Professional Records

Medicine Doctors

Long Vu Photo 1

Long T Vu, San Jose CA

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Specialties:
Counseling
Address:
2203 Tully Rd, San Jose, CA 95122
(408) 937-1553 (Phone), (408) 937-1548 (Fax)
Languages:
English

Resumes

Resumes

Long Vu Photo 2

Center For Diversity In Engineering Electrical Engineer Mentor

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Location:
Sacramento, CA
Industry:
Electrical/Electronic Manufacturing
Work:
Uc Irvine 2012 - 2013
Center For Diversity In Engineering Electrical Engineer Mentor
Education:
Uc Irvine 2006 - 2013
Masters, Electronics Engineering
Long Vu Photo 3

Long Vu

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Long Vu

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Long Vu

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Long Vu

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Long Vu Photo 7

Constructor

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Industry:
Building Materials
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Long Vu

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Location:
United States
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Long Vu

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Location:
United States

Business Records

Name / Title
Company / Classification
Phones & Addresses
Long Vu
Owner
Carmichael Optical
Repair Shops and Related Services
6410 Fair Oaks Blvd, Carmichael, CA 95608
Website: carmichaeloptical.com
Long Vu
Owner
Hung Vietnamese Food
Eating Place
1818 Tully Rd, San Jose, CA 95122
Long Vu
Owner
Pho Ga Hung
Eating Place
1818 Tully Rd, San Jose, CA 95122
Long Vu
Owner
Vu, Long
Ret Optical Goods · Eyeglass Repair · Optometrist · Other Household Goods Repair & Maintenance
6410 Fair Oaks Blvd, Carmichael, CA 95608
6410-1 Fair Oaks Blvd, Carmichael, CA 95608
(916) 484-1080
Long Vu
Principal
Quicknetworksolution.Com
Nonclassifiable Establishments
5880 Macadam Ct, San Jose, CA 95123
Long Vu
Managing
Vitello Bello LLC
Specialty Foods Retail
10 Jade Pl, San Francisco, CA 94131
Long Vu
Managing
Mucca Bella LLC
Food Service · Nonclassifiable Establishments
1130 Eddy St, San Francisco, CA 94109
Long Vu
Information Technology Manager
Gorilla Circuits
Electrical/Electronic Manufacturing · Mfg Printed Circuit Boards
1445 Oakland Rd, San Jose, CA 95112
1445 Old Oakland Rd, San Jose, CA 95112
1447 Oakland Rd, San Jose, CA 95112
(408) 294-9897
Long Vu
Owner
Carmichael Optical
Repair Shops and Related Services
6410 Fair Oaks Blvd, Carmichael, CA 95608
Website: carmichaeloptical.com

Publications

Us Patents

Apparatus For Testing Electronic Devices

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US Patent:
7762822, Jul 27, 2010
Filed:
Apr 27, 2006
Appl. No.:
11/413323
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 13/44
US Classification:
439131
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8118618, Feb 21, 2012
Filed:
May 3, 2010
Appl. No.:
12/772932
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 24/00
US Classification:
439676
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8388357, Mar 5, 2013
Filed:
Jan 18, 2012
Appl. No.:
13/353269
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 12/00
US Classification:
439 70
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8506335, Aug 13, 2013
Filed:
Jan 30, 2013
Appl. No.:
13/754765
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
AEHA Test Systems - Fremont CA
International Classification:
H01R 4/50
US Classification:
439770
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8628336, Jan 14, 2014
Filed:
Jul 11, 2013
Appl. No.:
13/939364
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 12/00
US Classification:
439 70
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
20210025935, Jan 28, 2021
Filed:
Sep 29, 2020
Appl. No.:
17/036839
Inventors:
- Fremont CA, US
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
G01R 31/28
G01R 31/26
G01R 31/00
G06F 8/30
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
20180372792, Dec 27, 2018
Filed:
Sep 4, 2018
Appl. No.:
16/121192
Inventors:
- Fremon CA, US
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
G01R 31/28
G06F 8/30
G01R 31/26
G01R 31/00
G01R 31/319
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Dynamic Thermochemical Process And System

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US Patent:
20170312731, Nov 2, 2017
Filed:
Apr 28, 2016
Appl. No.:
15/140469
Inventors:
Long D. Vu - Tiburon CA, US
International Classification:
B01J 19/24
C10J 3/82
C10G 3/00
C01B 3/16
B01J 19/00
Abstract:
A dynamic thermochemical module is disclosed which includes an array of reactors, a network of interconnecting pipes and valves connected to each reactor in the array so that every reactor within the array can communicate to one another and other reactors in a different module having the same structure, a plurality of storage tanks connected to each reactor and interconnecting tubes and valves so that an output from each reactor is stored therein and distributed to each reactor in the array, a plurality of sub-functional modules connected to the array of reactors via the network of interconnecting tubes and valves, a plurality of condensers connected to the array of reactors, and a plurality of gas conditioning and storage and distribution sub-modules connected to the outputs of the condensers.
Control profile
Long T Vu from Santa Clara, CA, age ~62 Get Report