Inventors:
Lawrence F. Bacchetti - Belmont MA
David M. Walker - Westford MA
Donald O. Smith - Lexington MA
Assignee:
Control Data Corporation - Minneapolis MN
International Classification:
H05H 100
Abstract:
A method and apparatus for in-situ cleaning of charged particle beam optical systems such as electron microscopes, electron beam lithography systems, ion beam microscopes or lithography systems, through the use of a specially introduced plasma forming gas such as hydrogen that is excited by applying a high voltage, high frequency excitation potential between various optical elements of the electron beam optical column. Alternately, specially constructed separate plasma forming electrodes can be built into the electron beam optical system for this purpose. During the cleaning operation the plasma reacts chemically with the contaminants previously formed on the surface of the electron beam column optical elements to form gaseous reactants which then are pumped out of the electron beam column system.