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Laszlo B Kish

from College Station, TX
Age ~69

Laszlo Kish Phones & Addresses

  • 1606 N Bluebonnet Cir, College Station, TX 77845 (979) 696-4972
  • College Sta, TX
  • Bryan, TX
  • 1606 N Bluebonnet Cir, College Station, TX 77845

Work

Company: Texas a&m university Sep 2001 Position: Professor

Education

Degree: Doctorates School / High School: University of Szeged 2012 Specialities: Natural Science

Skills

Physics • Science • Mathematical Modeling • Research • Simulations • Theory • Statistics • Nanotechnology • Experimentation • Numerical Analysis • University Teaching • Teaching • Scientific Computing • Algorithms • Signal Processing • Lecturing • Higher Education • Materials Science • Nanomaterials • Spectroscopy • Artificial Intelligence • Electrical Engineering • Biomedical Engineering • Pattern Recognition

Languages

English • Hungarian

Industries

Higher Education

Resumes

Resumes

Laszlo Kish Photo 1

Professor

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Location:
College Station, TX
Industry:
Higher Education
Work:
Texas A&M University
Professor

Uppsala University Apr 1997 - Jul 2001
Associate Professor

University of Szeged Dept of Experimental Physics Sep 1982 - Jan 1997
Assistant To Professor and Assistant Professor

Tsukuba-1991 1991 - 1991
Sta Fellow

Not Your Business 1933 - 1935
Not Your Business
Education:
University of Szeged 2012
Doctorates, Natural Science
Uppsala University 2011
Hungarian Academy of Science 2001
Doctorates, Doctor of Science, Physics
Uppsala University 1992 - 1995
Skills:
Physics
Science
Mathematical Modeling
Research
Simulations
Theory
Statistics
Nanotechnology
Experimentation
Numerical Analysis
University Teaching
Teaching
Scientific Computing
Algorithms
Signal Processing
Lecturing
Higher Education
Materials Science
Nanomaterials
Spectroscopy
Artificial Intelligence
Electrical Engineering
Biomedical Engineering
Pattern Recognition
Languages:
English
Hungarian

Publications

Isbn (Books And Publications)

Nanotechnology

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Author

Laszlo B. Kish

ISBN #

0819449784

Noise in Complex Systems And Stochastic Dynamics 3

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Author

Laszlo B. Kish

ISBN #

0819458406

Us Patents

System And Method Of Fluctuation Enhanced Gas-Sensing Using Saw Devices

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US Patent:
7286942, Oct 23, 2007
Filed:
Oct 2, 2003
Appl. No.:
10/677684
Inventors:
Laszlo B. Kish - College Station TX, US
Gabor Schmera - San Diego CA, US
Assignee:
United States of America as Represented By The Secretary of the Navy - Washington DC
International Classification:
G01N 31/00
G01N 19/00
B32B 5/02
B32B 27/04
B32B 27/12
US Classification:
702 22, 422 50, 422 62, 422 67, 422 681, 422 8201, 422 83, 422 98, 73 101, 73 102, 436 43, 436149, 700 1, 700266, 702 1, 702 19, 702 23, 702 30, 702 31, 702 32, 702 57 G
Abstract:
A system and method of fluctuation enhanced gas-sensing using SAW devices includes processes for improved chemical analyte detection, identification, and quantification through the measurement and spectral analysis of frequency fluctuations in the instantaneous frequency of a chemical sensor arranged to produce an oscillatory output signal when exposed to chemical substances. The system and method may use a chemical sensor, such as a surface acoustic wave (SAW) device. The spectral analysis produces the power spectral density of the frequency fluctuations, which are represented as a pattern that includes information about the analyte(s) such as, total adsorbed gas mass and diffusion coefficients. The diffusion coefficients may then be used to determine the number of molecule types and/or the concentration of each.

System And Method Of Molecule Counting Using Fluctuation Enhanced Sensors

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US Patent:
7524460, Apr 28, 2009
Filed:
Feb 27, 2004
Appl. No.:
10/789510
Inventors:
Gabor Schmera - San Diego CA, US
Laszlo B. Kish - College Station TX, US
Assignee:
The United States of America as represented by the Secretary of the Navy - Washington DC
International Classification:
G01N 7/00
G01N 33/00
G01N 29/02
G01N 25/18
US Classification:
422 83, 422 58, 422 681, 73 102, 73 1903, 73 232, 73 2321, 73 2336, 73 2401, 436 43, 436149
Abstract:
A System and Method of Molecule Counting Using Fluctuation Enhanced Sensors includes processes for improved chemical analyte detection and quantification through the measurement and generation of an amplitude density histogram of the measured time series of frequency fluctuations in the instantaneous frequency of a chemical sensor arranged to produce an oscillatory output signal when exposed to chemical substances. The system and method may use a chemical sensor, such as a surface acoustic wave (SAW) device. Statistical analysis produces the amplitude density of the frequency fluctuations, which are represented as a pattern that includes information about the quantity of the analyte on the surface of the sensor. Patterns in the measured amplitude density are then correlated to theoretical amplitude density functions in order to determine the number of analyte molecules on the surface of the sensor.

System And Method For Gas Recognition By Analysis Of Bispectrum Functions

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US Patent:
7680607, Mar 16, 2010
Filed:
May 12, 2005
Appl. No.:
11/134597
Inventors:
Janusz Smulko - Suchy Dwor, PL
Laszlo B. Kish - College Station TX, US
Gabor Schmera - San Diego CA, US
Assignee:
The United States of America as represented by the Secretary of the Navy - Washington DC
International Classification:
G01N 31/00
US Classification:
702 22, 702 23, 702 24, 702 27, 702 30, 702 32, 422 83, 422 98, 436149, 73 232, 73 2321
Abstract:
A System and Method for Gas Recognition by Analysis of Bispectrum Functions is based on the Higher-Order Spectral analysis of time series measurements of resistance fluctuations in Metal Oxide Semiconductor (MOS) gas sensors, such as Taguchi-type sensors. A two-dimensional contour plot module of the bispectrum function is treated as a pattern. These patterns include information about the analyte(s) whereby characteristics of the gas can be identified.

Sensing Phage-Triggered Ion Cascade (Septic)

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US Patent:
20070111220, May 17, 2007
Filed:
Nov 23, 2005
Appl. No.:
11/286621
Inventors:
Laszlo Kish - College Station TX, US
Ryland Young - College Station TX, US
Mosong Cheng - College Station TX, US
James Biard - Richardson TX, US
Sergey Bezrukov - Derwood MD, US
Assignee:
The Texas A&M University System - College Station TX
International Classification:
C12Q 1/68
US Classification:
435006000
Abstract:
The present invention provides a method for detecting bacteria and a nano-well device having one or more input/output connections about a gap and one or more bacteriophages at or about the gap that trigger a detectable electrical field fluctuation when the one or more bacteriophages contact a cognate target within a liquid sample.

Bacteria Identification By Phage Induced Impedance Fluctuation Analysis

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US Patent:
20120252003, Oct 4, 2012
Filed:
Mar 30, 2011
Appl. No.:
13/075250
Inventors:
Gabor Schmera - San Diego CA, US
Laszlo Kish - College Station TX, US
International Classification:
C12Q 1/70
C12M 1/42
US Classification:
435 5, 4352871
Abstract:
Methods for detection and identification of bacteria within a sample include the step of inserting a pair of electrodes into the sample. A first impedance across the electrodes is established with a first AC voltage source having a first frequency. A phage is introduced into the sample, and impedance fluctuations that are caused by ion release by the bacteria due to the phage introduction are measured. The use of impedance fluctuations instead of voltage fluctuations to detect and identify bacteria minimizes 1/f noise effects and increases system sensitivity. To further increase system sensitivity by eliminating thermal noise, a second impedance across the electrodes can be established using a second AC voltage source at a second frequency. Second impedance fluctuations are cross-correlated to the first impedance fluctuations, and the cross-correlation results are analyzed to determine whether or not bacteria are present in the sample based on phage electrical activity.

Bacteria Identification By Phage Induced Impedance Fluctuation Analysis

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US Patent:
20130295556, Nov 7, 2013
Filed:
Jul 8, 2013
Appl. No.:
13/936631
Inventors:
Gabor Schmera - San Diego CA, US
Laszlo Kish - College Station TX, US
Assignee:
United States of America, as Represented by the Secretary of the Navy - Arlington VA
International Classification:
G01N 27/02
US Classification:
435 5, 4352871
Abstract:
Methods for detection and identification of bacteria within a sample include the step of inserting a pair of electrodes into the sample. A first impedance across the electrodes is established with a first AC voltage source having a first frequency. A phage is introduced into the sample, and impedance fluctuations that are caused by ion release by the bacteria due to the phage introduction are measured. The use of impedance fluctuations instead of voltage fluctuations to detect and identify bacteria minimizes 1/f noise effects and increases system sensitivity. To further increase system sensitivity by eliminating thermal noise, a second impedance across the electrodes can be established using a second AC voltage source at a second frequency. Second impedance fluctuations are cross-correlated to the first impedance fluctuations, and the cross-correlation results are analyzed to determine whether or not bacteria are present in the sample based on phage electrical activity.

Encryption Key Distribution System And Method

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US Patent:
20150263853, Sep 17, 2015
Filed:
Sep 17, 2014
Appl. No.:
14/489025
Inventors:
Elias Eliceo GONZALEZ - Houston TX, US
Laszlo B. KISH - College Station TX, US
Robert S. BALOG - College Station TX, US
Assignee:
THE TEXAS A&M UNIVERSITY SYSTEM - College Station TX
International Classification:
H04L 9/08
G05F 1/66
Abstract:
Systems and methods for the secure distribution of encryption keys in a network are provided. A Kirchhoff-Law-Johnson-(like)-Noise (KLJN) secure key exchange protocol can be utilized in a network where keys are exchanged between hosts connected by a wire. Such a KLJN secure key exchange protocol provides information security that is information theoretically secure.

Wikipedia References

Laszlo Kish Photo 2

Laszlo B . Kish

About:
Born:

1955 • Hungary

Work:
Area of science:

Physicist

Company:

Texas A&M University faculty • Uppsala University

Position:

Physicist

Education:
Studied at:

University of Szeged • Uppsala University

Area of science:

Nanotechnology • Internet

Academic degree:

Professor

Professional scientist:

Dancer

Professions and applied sciences:

Electrical engineering

Skills & Activities:
Sport:

Questions

Skill:

Technological • Scientific • Computer hardware

Award:

Prize

Wikipedia

Laszlo B. Kish

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Lszl Bela Kish is a professor of Electrical Engineering at Texas A&M University. His activity includes a wide range of issues about the physics of stochastic fluctuations (noises ...

Laszlo B Kish from College Station, TX, age ~69 Get Report