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Karen L Lingel

from Union City, CA
Age ~61

Karen Lingel Phones & Addresses

  • 1896 Rumford Ter, Union City, CA 94587 (510) 429-7678
  • 1405 Marshall St, Redwood City, CA 94063 (650) 364-5824
  • Ithaca, NY
  • Fairfield, CA
  • Seeley Lake, MT
  • Alameda, CA
  • Hayward, CA
  • Urbana, IL

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Resumes

Resumes

Karen Lingel Photo 1

Engineering Project Manager At Applied Materials

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Location:
San Francisco Bay Area
Industry:
Semiconductors
Experience:
Applied Materials (Public Company; Semiconductors industry): Engineering Project Manager,  (April 2003-Present) Worked with other business groups to design, develop, implement, and test algorithm improvements for various metrology and process platforms. Designed, developed, imp...
Karen Lingel Photo 2

Karen Lingel

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Publications

Us Patents

Method For Imaging Workpiece Surfaces At High Robot Transfer Speeds With Reduction Or Prevention Of Motion-Induced Distortion

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US Patent:
8620064, Dec 31, 2013
Filed:
Feb 17, 2010
Appl. No.:
12/707548
Inventors:
Abraham Ravid - Cupertino CA, US
Todd Egan - Fremont CA, US
Karen Lingel - Union City CA, US
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
G06K 9/00
US Classification:
382152, 348 44, 348 87, 348145, 382144, 382149, 382154
Abstract:
A method is provided for imaging a workpiece by capturing successive frames of an elongate stationary field of view transverse to a workpiece transit path of a robot, while the workpiece is transported by the robot. The robot transit path is illuminated with an elongate illumination pattern transverse to the transit path to obtain a workpiece image of successive frames. Motion-induced image distortion is prevented or reduced adjusting the camera frame rate in real time in proportion to changes in robot velocity profile of the workpiece along the transit path.

Integrated Thin Film Metrology System Used In A Solar Cell Production Line

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US Patent:
20110033957, Feb 10, 2011
Filed:
Aug 5, 2010
Appl. No.:
12/851063
Inventors:
James Matthew Holden - San Jose CA, US
Edward W. Budiarto - Fremont CA, US
Karen Lingel - Union City CA, US
Assignee:
APPLIED MATERIALS, INC. - Santa Clara CA
International Classification:
H01L 21/66
B05C 11/00
G01B 11/24
US Classification:
438 16, 118712, 356601, 257E21529
Abstract:
Embodiments of the present invention generally relate to systems, apparatuses, and methods used to form solar cell devices using processing modules adapted to perform one or more processes in the formation of the solar cell devices. In one embodiment, the system provides an inline inspection system of solar cell devices within a solar cell production line while collecting and using metrology data to diagnose, tune, or improve production line processes during manufacture of solar cell devices. In one embodiment, the inspection system provides an on-the-fly characterization module positioned downstream from one or more processing tools wherein the characterization module is configured to measure on-the-fly one or more properties of one or more photovoltaic layers formed on a substrate surface and a system controller in communication with the characterization module and the one or more processing tools, where the system controller is configured to analyze information received from the characterization module.

Metrology System For Imaging Workpiece Surfaces At High Robot Transfer Speeds

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US Patent:
20110199476, Aug 18, 2011
Filed:
Feb 17, 2010
Appl. No.:
12/707335
Inventors:
Abraham Ravid - Cupertino CA, US
Todd Egan - Fremont CA, US
Karen Lingel - Union City CA, US
Mitchell DiSanto - Georgetown TX, US
Hari Kishore Ambal - San Jose CA, US
Edward Budiarto - Fremont CA, US
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
H04N 7/18
US Classification:
348 86, 348E07085, 901 47
Abstract:
A metrology system has an elongate stationary camera pixel array facing a workpiece transit path of a robot with an field of view corresponding to a workpiece diameter and extending transverse to the transit path portion, and a stationary elongate light emitting array generally parallel to the pixel array. An image control processor causes the camera to capture successive image frames while the, robot is moving the workpiece through the transit path.

Method For Imaging Workpiece Surfaces At High Robot Transfer Speeds With Correction Of Motion-Induced Distortion

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US Patent:
20110200247, Aug 18, 2011
Filed:
Feb 17, 2010
Appl. No.:
12/707499
Inventors:
Abraham Ravid - Cupertino CA, US
Todd Egan - Fremont CA, US
Karen Lingel - Union City CA, US
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
G06K 9/00
US Classification:
382144
Abstract:
A method is provided for imaging a workpiece by capturing successive frames of an elongate stationary field of view transverse to a workpiece transit path of a robot, while the workpiece is transported by the robot. The robot transit path is illuminated with an elongate illumination pattern transverse to the transit path to obtain a workpiece image of successive frames. Motion-induced image distortion is corrected by computing respective correct locations of respective ones of the frames along the transit path.
Karen L Lingel from Union City, CA, age ~61 Get Report