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Jonathan Robert Avrach

from Menlo Park, CA
Age ~51

Jonathan Avrach Phones & Addresses

  • 820 Laurel Ave, Menlo Park, CA 94025 (650) 324-4317
  • Carmel, CA
  • San Mateo, CA
  • Cheltenham, PA
  • Palo Alto, CA
  • Atlantic City, NJ
  • Los Altos, CA
  • Bethesda, MD

Resumes

Resumes

Jonathan Avrach Photo 1

Senior Director, Solution Architect And Evangelist

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Location:
Menlo Park, CA
Industry:
Computer Software
Work:
Aster Data since Apr 2011
Senior Sales Engineer

Aster Data Systems Aug 2009 - Apr 2011
Sales Engineer

BDNA Corporation Jan 2002 - Mar 2009
Engineering Product Manager

Zigwit Systems Dec 2000 - Jul 2001
Senior Software Engineer

Responsys Sep 1999 - Dec 2000
Principal Technologist
Education:
Carnegie Mellon University 1991 - 1995
Skills:
Enterprise Software
Databases
Product Management
Analytics
Sql
Big Data
Start Ups
Pre Sales
Cloud Computing
Saas
Distributed Systems
Mapreduce
Product Development
Architecture
Architectures
Strategy
Data Visualization
Jonathan Avrach Photo 2

Jonathan Avrach

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Jonathan Avrach Photo 3

Senior Sales Engineer At Aster Data Center Of Innovation (A Division Of Teradata)

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Position:
Senior Sales Engineer at Aster Data
Location:
San Francisco Bay Area
Industry:
Computer Software
Work:
Aster Data since Apr 2011
Senior Sales Engineer

Aster Data Systems Aug 2009 - Apr 2011
Sales Engineer

BDNA Corporation Jan 2002 - Mar 2009
Engineering Product Manager

Zigwit Systems Dec 2000 - Jul 2001
Senior Software Engineer

Responsys Sep 1999 - Dec 2000
Principal Technologist
Education:
Carnegie Mellon University 1991 - 1995

Publications

Us Patents

Method For Taking Automated Inventory Of Assets And Recognition Of The Same Asset On Multiple Scans

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US Patent:
20100030777, Feb 4, 2010
Filed:
Oct 2, 2009
Appl. No.:
12/587184
Inventors:
Rajendra Bhagwatisingh Panwar - Mountain View CA, US
Jonathan Robert Avrach - Menlo Park CA, US
International Classification:
G06F 7/10
G06F 17/30
US Classification:
707 5, 707100, 707E17014, 707 6
Abstract:
A computer system comprising a matching platform that has the capability to examine attributes from multiple scans on multiple attributes and determine which attributes from each scan pertain to the same attribute so the attribute is not counted twice. Extensible modules of weighted attribute matching rules can be plugged into the system which define the rules for matching based upon attributes. These modules define which attributes will be examined and the weighting of each in the matching process. The modules can contain different attributes and different weighting rules for different types of machines. With regard to weighting, when a match between attributes that are returned from two different scans occurs, the amount that match contributes toward the decision that the assets the attributes were collected from are the same asset depends upon the weighting of the particular attribute. Fuzzy snapshots and time-based reporting are possible. Matching is done on devices first, then elements installed on those devices such as software. Confidence metrics can be developed based upon the weights of matches. All matching is done against a set of attributes in the persistent data warehouse which comprise the complete set of attributes collected about a device or element from all previous scans.

Method For Taking Automated Inventory Of Assets And Recognition Of The Same Asset On Multiple Scans

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US Patent:
20100030776, Feb 4, 2010
Filed:
Oct 2, 2009
Appl. No.:
12/587162
Inventors:
Rajendra Bhagwatisingh Panwar - Mountain View CA, US
Jonathan Robert Avrach - Menlo Park CA, US
International Classification:
G06F 17/30
US Classification:
707 5, 707E17071
Abstract:
A computer system comprising a matching platform that has the capability to examine attributes from multiple scans on multiple attributes and determine which attributes from each scan pertain to the same attribute so the attribute is not counted twice. Extensible modules of weighted attribute matching rules can be plugged into the system which define the rules for matching based upon attributes. These modules define which attributes will be examined and the weighting of each in the matching process. The modules can contain different attributes and different weighting rules for different types of machines. With regard to weighting, when a match between attributes that are returned from two different scans occurs, the amount that match contributes toward the decision that the assets the attributes were collected from are the same asset depends upon the weighting of the particular attribute. Fuzzy snapshots and time-based reporting are possible. Matching is done on devices first, then elements installed on those devices such as software. Confidence metrics can be developed based upon the weights of matches. All matching is done against a set of attributes in the persistent data warehouse which comprise the complete set of attributes collected about a device or element from all previous scans.
Jonathan Robert Avrach from Menlo Park, CA, age ~51 Get Report