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John H Seldin

from Ann Arbor, MI
Age ~60
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Also known as:
John Howard Seldin
Phone and address:
814 Hewett Dr, Ann Arbor, MI 48103
(734) 996-9298
Related to:
Eldon H Smith, 79Jessyn R Christensen, 32Frank D SeversonDonald I Severson, 96Judith H Seldin, 60Gordon W Severson, 97Helen Severson, 93Richard J Severson, 88
Connected to:
Antoinette T Seldin, 76Roberto Seldner, 78Allison M Seldomridge, 41Corey L Seldomridge, 41Kim L Seldomridge, 68Robertg Seldomridge, 70Annie Seldon, 86Arthur R Seldon, 105Keith Seldon, 48Mckenzie M Seldon, 38

John Seldin Phones & Addresses

  • 814 Hewett Dr, Ann Arbor, MI 48103 (734) 996-9298
  • Hillman, MI

Work

Company: Essen bioscience (formerly essen instruments) Aug 2000 Position: Manager of software engineering

Education

Degree: MSEE School / High School: University of Michigan 1982 to 1987 Specialities: Electrical Engineering

Skills

Image Processing • Signal Processing • Sensors • Microcontrollers • Algorithms • R&D • Systems Engineering • Software Design • Matlab • Embedded Systems • Life Sciences • Programming • C • Engineering Management • Software Project Management • Object Oriented Software • Adaptive Optics • Image Reconstruction • Phase Diversity • Ground Based Astronomy • Testing • Simulations • Medical Devices • Digital Imaging • Embedded Software • System Design • Pattern Recognition • Software Engineering • C++ • Optics • Software Development • Drug Discovery • Automation • Fluorescence Microscopy • Lifesciences • Perl • Research and Development

Interests

Environment • Science and Technology • Music • Percussion/Drumming • Fishing

Industries

Biotechnology

Resumes

Resumes

John Seldin Photo 1

Manager, Embedded Software Development

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Location:
300 west Morgan Rd, Ann Arbor, MI 48108
Industry:
Biotechnology
Work:
Essen BioScience (formerly Essen Instruments) since Aug 2000
Manager of Software Engineering
Veridian Systems (formerly ERIM International) Jan 1999 - Aug 2000
Research Engineer
ERIM International (formerly ERIM) Jan 1997 - Jan 1999
Research Engineer
ERIM Jan 1988 - Jan 1997
Research Engineer
Education:
University of Michigan 1982 - 1987
MSEE, Electrical Engineering
Skills:
Image Processing
Signal Processing
Sensors
Microcontrollers
Algorithms
R&D
Systems Engineering
Software Design
Matlab
Embedded Systems
Life Sciences
Programming
C
Engineering Management
Software Project Management
Object Oriented Software
Adaptive Optics
Image Reconstruction
Phase Diversity
Ground Based Astronomy
Testing
Simulations
Medical Devices
Digital Imaging
Embedded Software
System Design
Pattern Recognition
Software Engineering
C++
Optics
Software Development
Drug Discovery
Automation
Fluorescence Microscopy
Lifesciences
Perl
Research and Development
Interests:
Environment
Science and Technology
Music
Percussion/Drumming
Fishing

Publications

Us Patents

Examination Systems For Biological Samples

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US Patent:
20050051723, Mar 10, 2005
Filed:
Jul 23, 2004
Appl. No.:
10/898012
Inventors:
Bradley Neagle - Ann Arbor MI, US
Kirk Schroeder - Ann Arbor MI, US
John Seldin - Ann Arbor MI, US
Thomas Griffin - Farmington Hills MI, US
Alan Riggs - Ann Arbor MI, US
International Classification:
G01N023/00
US Classification:
250306000
Abstract:
Examination systems, including methods and apparatus, for automated assay of biological samples, such as live cells.

Measurement-Diverse Imaging And Wavefront Sensing With Amplitude And Phase Estimation

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US Patent:
20070278386, Dec 6, 2007
Filed:
Jun 5, 2006
Appl. No.:
11/446109
Inventors:
Richard G. Paxman - Saline MI, US
John H. Seldin - Ann Arbor MI, US
Assignee:
General Dynamics Advanced Information Systems, Inc. - Arlington VA
International Classification:
H01L 27/00
US Classification:
2502081
Abstract:
A system and method for imaging one or more objects in the presence of unknown phase and amplitude aberrations is described. Multiple images are collected so as to have measurement diversity and processed using a model-based approach to estimate the aberrations. An incoherent imaging model may be constructed to estimate the dependence of the imagery upon the object and the optical system, including the aberrations. A probability density function may then be calculated using the estimated model. Next, a maximum-likelihood estimate may be calculated and optimized, thus yielding a close approximation of the phase and amplitude aberrations. The estimates may then be used to estimate an image of the object or correct the system for future imaging.
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John H Seldin from Ann Arbor, MI, age ~60 Get Report