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John Phillip Brehm

from Cardington, OH
Age ~49
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Also known as:
John P Brehm, John J Brehm, John L Brehm, John P Minor
Phone and address:
1751 County Road 155, Cardington, OH 43315
(614) 325-3123
Related to:
Timothy G Rood, 73Natalie J Brehm, 47Anita J Flinders, 70Phillip D Brehm, 75Mary E BrehmAnne K Brehm, 54Kenneth E Flinders, 74Anne K Brehm, 73Kenneth L Rood, 44Mallory A Phlipot, 39
Connected to:
Brad T Brehm, 50Brian G Brehm, 63Carl R Brehm, 70Charles R Brehm, 42Christopher H Brehm, 61Cory R Brehm, 31Craig J Brehm, 51Cynthia J Brehm, 64Douglas Brehm, 53Dustin M Brehm, 42

John Brehm Phones & Addresses

  • 1751 County Road 155, Cardington, OH 43315 (614) 325-3123
  • Columbus, OH
  • Delaware, OH
  • 402 W Auglaize St, Wapakoneta, OH 45895
  • Cincinnati, OH
  • Ashley, OH

Work

Company: Gary F. Franke Co., LPA Address: 120 E 4Th St Ste 1040, Cincinnati, OH 45202

Education

School / High School: Saint Louis University School of Law

Languages

English

Ranks

Licence: Ohio - Active Date: 1982

Specialities

Athletic Training

Professional Records

License Records

John M Brehm

License #:
34025 - Active
Category:
EMS Licensing
Issued Date:
May 18, 2016
Expiration Date:
Jun 30, 2018
Type:
EMT-Basic

Lawyers & Attorneys

John Brehm Photo 1

John Edmund Brehm Jr., Cincinnati OH - Lawyer

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Address:
Gary F. Franke Co., LPA
120 E 4Th St Ste 1040, Cincinnati, OH 45202
(513) 564-9222 (Office)
Licenses:
Ohio - Active 1982
Education:
Saint Louis University School of Law
John Brehm Photo 2

John Brehm, Cincinnati OH - Lawyer

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Address:
120 E 4Th St, Cincinnati, OH 45202
Phone:
(513) 564-9222 (Phone), (513) 546-9990 (Fax)
Specialties:
Business Law
Gov & Administrative Law
Personal Injury
Products Liability
General Civil
Jurisdiction:
Ohio
Memberships:
Ohio State Bar

Medicine Doctors

John Brehm Photo 3

John M Brehm, West Chester OH - MED

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Specialties:
Athletic Training
Address:
8737 Union Centre Blvd Suite 110, West Chester, OH 45069
(513) 645-2246 (Phone), (513) 645-2233 (Fax)
Languages:
English

Business Records

Name / Title
Company / Classification
Phones & Addresses
John F. Brehm
BREHM FAMILY, LLC
John M. Brehm
SUNRISE PATIO & CASUAL LTD
John F. Brehm
E - SOLUTION SERVICES, LLC
John Brehm
HSRS, LLC
John Brehm
NETWORK COMPLIANCE ASSOCIATES, LLC
John Mathias Brehm
BREHM PERCH FARM, LLC
John F Brehm
S & B CONSULTING GROUP, LLC
John F. Brehm
EXCESS RE RISK CONTROL LLC

Publications

Isbn (Books And Publications)

Sea Of Faith

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Author

John Brehm

ISBN #

0299202003

Sea Of Faith

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Author

John Brehm

ISBN #

0299202046

The Phantom Respondents: Opinion Surveys and Political Representation

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Author

John Brehm

ISBN #

0472095234

Hard Choices, Easy Answers: Values, Information, and American Public Opinion

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Author

John Brehm

ISBN #

0691089183

Us Patents

Multiple Focal Spot X-Ray Inspection System

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US Patent:
6895079, May 17, 2005
Filed:
Aug 20, 2002
Appl. No.:
10/224174
Inventors:
Thomas William Birdwell - Middletown OH, US
John Robert Brehm - Middletown OH, US
Andrew Joseph Galish - West Chester OH, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
H01J035/30
US Classification:
378137, 378147
Abstract:
An X-ray inspection system includes an X-ray source that generates more than one beam defining an inspection plane, the beams being substantially parallel to each other; an X-ray detector having a plurality of detector arrays, each of which is aligned with one of the beams, and structure for supporting an object between the X-ray source and the X-ray detector. The X-ray source includes an electron gun and a device for steering an electron beam generated by the gun to multiple focal spots on a target.

Method And System To Inspect A Component

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US Patent:
7065176, Jun 20, 2006
Filed:
May 28, 2003
Appl. No.:
10/250010
Inventors:
Kevin Moermond - Cincinnati OH, US
Andy Joseph Galish - West Chester OH, US
John Robert Brehm - Middletown OH, US
Francis Howard Little - Cincinnati OH, US
Dean Fredrich Graber - Hamilton OH, US
Michael Timothy La Tulippe - Fairfield OH, US
Ronald Cecil McFarland - Cincinnati OH, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G01B 15/06
US Classification:
378 58
Abstract:
A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.

X-Ray Inspection System

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US Patent:
48036390, Feb 7, 1989
Filed:
Feb 25, 1986
Appl. No.:
6/832511
Inventors:
Douglas S. Steele - West Chester OH
Larry C. Howington - West Chester OH
James W. Schuler - Oxford OH
Joseph J. Sostarich - Fairfield OH
Charles R. Wojciechowski - West Chester OH
Theodore W. Sippel - Cincinnati OH
Joseph M. Portaz - Hamilton OH
Ralph G. Isaacs - Cincinnati OH
Henry J. Scudder - Medford MA
Thomas G. Kincaid - Lexington MA
Kristina H. V. Hedengren - Schenectady NY
Rudolph A. A. Koegl - Niskayuna NY
John P. Keaveney - Schenectady NY
Joseph Czechowski - Clifton Park NY
John R. Brehm - Cincinnati OH
James M. Brown - Albany NY
David W. Oliver - Schenectady NY
George E. Williams - Schenectady NY
Richard D. Miller - Schenectady NY
Assignee:
General Electric Company - Cincinnati OH
International Classification:
G06F 1520
G01N 2302
US Classification:
364507
Abstract:
An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination.
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John Phillip Brehm from Cardington, OH, age ~49 Get Report